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Class Information
Number: 356/366
Name: Optics: measuring and testing > By polarized light examination > With polariscopes
Description: Subject matter providing structure for examining articles or material and including a polarizer, a polarized light analyzer, a support usually for the article or material for examination between the polarizer and analyzer, and a visual viewer or photoelectric detector and indicator, the polarized light from the polarizer being transmitted through the article or material to the visual viewer or the photoelectric detector and indicator.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7495765 |
Fiber polarimeter, the use thereof, as well as polarimetric method |
Feb. 24, 2009 |
| 7477386 |
Polariscope toy and ornament with accompanying photoelastic and/or photoplastic devices |
Jan. 13, 2009 |
| 7369234 |
Method of performing optical measurement on a sample |
May. 6, 2008 |
| 7283234 |
Use of ellipsometry and surface plasmon resonance in monitoring thin film deposition or removal from a substrate surface |
Oct. 16, 2007 |
| 7262848 |
Fiber polarimeter, the use thereof, as well as polarimetric method |
Aug. 28, 2007 |
| 7239392 |
Polarization modulation photoreflectance characterization of semiconductor electronic interfaces |
Jul. 3, 2007 |
| 7227638 |
Calibration system and method for calibration of various types of polarimeters |
Jun. 5, 2007 |
| 7221454 |
Photopolarimeters and spectrophotopolarimaters with multiple diffraction gratings |
May. 22, 2007 |
| 7215469 |
Confocal microscope |
May. 8, 2007 |
| 7092092 |
Hand-carried LED polariscope |
Aug. 15, 2006 |
| 7038848 |
Confocal microscope |
May. 2, 2006 |
| 7034939 |
Calibration system and method for calibration of various types of polarimeters |
Apr. 25, 2006 |
| 6917427 |
Highly accurate calibration of polarimeters |
Jul. 12, 2005 |
| 6906800 |
Polarimeter using quantum well stacks separated by gratings |
Jun. 14, 2005 |
| 6856391 |
Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope |
Feb. 15, 2005 |
| 6847448 |
Polarization analyzing apparatus and method for polarization analysis |
Jan. 25, 2005 |
| 6816260 |
Fiber polarimeter, the use thereof, as well as polarimetric method |
Nov. 9, 2004 |
| 6747739 |
Observing techniques and its evaluation equipments of filler packing-structure for resin polymer composite filled with ceramic filler-powder |
Jun. 8, 2004 |
| 6621067 |
Polarization independent photodetector device and method of making same |
Sep. 16, 2003 |
| 6538754 |
Method of measuring thickness of cell gap of reflective type liquid crystal display |
Mar. 25, 2003 |
| 6501548 |
Retardance measurement method |
Dec. 31, 2002 |
| 6480277 |
Dual circular polarization modulation spectrometer |
Nov. 12, 2002 |
| 6323947 |
Angle of incidence accuracy in ultrathin dielectric layer ellipsometry measurement |
Nov. 27, 2001 |
| 6219139 |
Full field photoelastic stress analysis |
Apr. 17, 2001 |
| 6211957 |
In-line all-fiber polarimeter |
Apr. 3, 2001 |
| 6181421 |
Ellipsometer and polarimeter with zero-order plate compensator |
Jan. 30, 2001 |
| 6177995 |
Polarimeter and corresponding measuring method |
Jan. 23, 2001 |
| 6157448 |
Birefringence measurement optical system and high spatial resolution polarimetric apparatus |
Dec. 5, 2000 |
| 6084674 |
Parallelogram shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems |
Jul. 4, 2000 |
| 6055053 |
Full field photoelastic stress analysis |
Apr. 25, 2000 |
| 6046811 |
Method and apparatus for determining electrical conductivity of a surface of an object |
Apr. 4, 2000 |
| 5929993 |
Total film retardance monitoring system, and method of use |
Jul. 27, 1999 |
| 5847831 |
Apparatus for monitoring the state of a liquid-crystal polarization |
Dec. 8, 1998 |
| 5841574 |
Multi-special decentered catadioptric optical system |
Nov. 24, 1998 |
| 5757671 |
Multi-detector ellipsometer and process of multi-detector ellipsometric measurement |
May. 26, 1998 |
| 5726755 |
Method and apparatus for viewing |
Mar. 10, 1998 |
| 5661560 |
Elliptical light measuring method |
Aug. 26, 1997 |
| 5621528 |
Method and dichrograph for measurement of circular dichroism, optical rotation and absorption spectra |
Apr. 15, 1997 |
| 5615038 |
Scanning optical device with aberration compensation feature |
Mar. 25, 1997 |
| 5517309 |
Tool for analyzing a polarization state of a light beam |
May. 14, 1996 |
| 5457536 |
Polarization modulation laser scanning microscopy |
Oct. 10, 1995 |
| 5440390 |
Optical fiber polarimeter |
Aug. 8, 1995 |
| 5424834 |
Optical displacement sensor for measurement of shape and coarseness of a target workpiece surface |
Jun. 13, 1995 |
| 5408321 |
Apparatus for measurement of specific dichroism of sheet materials |
Apr. 18, 1995 |
| 5311284 |
Method of measuring optical characteristics of thin film and apparatus therefor |
May. 10, 1994 |
| 5305090 |
Birefringent inspection polarscope |
Apr. 19, 1994 |
| 5298973 |
Phase difference controller and method for controlling phase difference |
Mar. 29, 1994 |
| 5269937 |
HPLC light scattering detector for biopolymers |
Dec. 14, 1993 |
| 5250186 |
HPLC light scattering detector for biopolymers |
Oct. 5, 1993 |
| 5038030 |
Surface identification for back-coated magnetic recording medium |
Aug. 6, 1991 |
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