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Class Information
Number: 356/32
Name: Optics: measuring and testing > Material strain analysis
Description: Subject matter for examining an article or material by noting the effect of the strain in the stressed article on light associated with the article or material.


Sub-classes under this class:

Class Number Class Name Patents
356/35.5 By light interference detector (e.g., interferometer) 217
356/33 With polarized light 69


Patents under this class:
1 2 3 4 5

Patent Number Title Of Patent Date Issued
7623223 Stress measurement method Nov. 24, 2009
7612873 Surface form measuring apparatus and stress measuring apparatus and surface form measuring method and stress measuring method Nov. 3, 2009
7599047 Method and system for simultaneous measurement of strain and temperature Oct. 6, 2009
7583367 Catheter surgery simulation Sep. 1, 2009
7551268 System for monitoring sealing wear Jun. 23, 2009
7543982 Sensor and disturbance measurement method using the same Jun. 9, 2009
7534031 Temperature measuring device and temperature measurement method May. 19, 2009
7522269 Bonded part peeling shape identification device Apr. 21, 2009
7505122 Evaluation method and manufacturing method of light-emitting element material, manufacturing method of light-emitting element, light-emitting element, and light-emitting device and electric ap Mar. 17, 2009
7504618 Distributed sensing in an optical fiber using brillouin scattering Mar. 17, 2009
7501596 Dimension sensor and method for stopping expansion of a tube Mar. 10, 2009
7495749 Rapid method for sub-critical fatigue crack growth evaluation Feb. 24, 2009
7495750 Monitoring device for rotating body Feb. 24, 2009
7477995 Optical linear strain gage Jan. 13, 2009
7460216 Surface strain measuring device Dec. 2, 2008
7444882 Material failure prediction/stress/strain detection method and system using deformation luminescence Nov. 4, 2008
7430038 Apparatus for enhancing visualization of mechanical stress Sep. 30, 2008
7403323 Process control monitors for interferometric modulators Jul. 22, 2008
7391507 Method of photo-reflectance characterization of strain and active dopant in semiconductor structures Jun. 24, 2008
7327444 Substrate inspection apparatus and method Feb. 5, 2008
7317514 System and method for optimizing heat management Jan. 8, 2008
7307702 Color switchable stress-fracture sensor for damage control Dec. 11, 2007
7295307 Method of and apparatus for measuring stress of semiconductor material Nov. 13, 2007
7289231 Apparatus and method for determining physical properties of a mask blank Oct. 30, 2007
7286210 Passive optical sensor using carbon nanotubes Oct. 23, 2007
7277162 Dynamic performance monitoring of long slender structures using optical fiber strain sensors Oct. 2, 2007
7190440 Controlling compressive force using pressure sensitive film Mar. 13, 2007
7170590 Distributed optical fiber sensor system Jan. 30, 2007
7030366 Micro piezo-optic composite transducers and fabrication methods Apr. 18, 2006
7024343 Method for calibrating a mathematical model Apr. 4, 2006
7005630 Energy-modulating fiber grating sensor Feb. 28, 2006
6999641 Measurement of large strains in ropes using plastic optical fibers Feb. 14, 2006
6985213 Method and apparatus for measuring material property Jan. 10, 2006
6956981 Long base, stretched fiber-optic Bragg network extensometer and production method for same Oct. 18, 2005
6934013 Compressed symbology strain gage Aug. 23, 2005
6912912 Pressure sensor having an optical waveguide and method for pressure detection Jul. 5, 2005
6876786 Fiber-optic sensing system for distributed detection and localization of alarm conditions Apr. 5, 2005
6847438 Apparatus for inspecting surface strain of magnetic tape Jan. 25, 2005
6826491 Method and apparatus for providing film stress measurements based on substrate displacement Nov. 30, 2004
6822217 Optical spectrum analyzer Nov. 23, 2004
6822218 Method of and apparatus for wavelength detection Nov. 23, 2004
6813403 Monitoring of large structures using brillouin spectrum analysis Nov. 2, 2004
6810748 Method for evaluating creep lifetime Nov. 2, 2004
6809803 Surface topology inspection Oct. 26, 2004
6785051 Intrinsic birefringence compensation for below 200 nanometer wavelength optical lithography components with cubic crystalline structures Aug. 31, 2004
6781113 Fiber bragg grating strain sensor with arc configuration Aug. 24, 2004
6771356 Scatterometry of grating structures to monitor wafer stress Aug. 3, 2004
6710861 Method and apparatus for measuring web strain in a confined area Mar. 23, 2004
6710328 Fiber optic composite damage sensor Mar. 23, 2004
6698919 Method of utilizing a fiber for simultaneously measuring distributed strain and temperature Mar. 2, 2004

1 2 3 4 5


 
 
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