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Class Information
Number: 356/32
Name: Optics: measuring and testing > Material strain analysis
Description: Subject matter for examining an article or material by noting the effect of the strain in the stressed article on light associated with the article or material.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7623223 |
Stress measurement method |
Nov. 24, 2009 |
| 7612873 |
Surface form measuring apparatus and stress measuring apparatus and surface form measuring method and stress measuring method |
Nov. 3, 2009 |
| 7599047 |
Method and system for simultaneous measurement of strain and temperature |
Oct. 6, 2009 |
| 7583367 |
Catheter surgery simulation |
Sep. 1, 2009 |
| 7551268 |
System for monitoring sealing wear |
Jun. 23, 2009 |
| 7543982 |
Sensor and disturbance measurement method using the same |
Jun. 9, 2009 |
| 7534031 |
Temperature measuring device and temperature measurement method |
May. 19, 2009 |
| 7522269 |
Bonded part peeling shape identification device |
Apr. 21, 2009 |
| 7505122 |
Evaluation method and manufacturing method of light-emitting element material, manufacturing method of light-emitting element, light-emitting element, and light-emitting device and electric ap |
Mar. 17, 2009 |
| 7504618 |
Distributed sensing in an optical fiber using brillouin scattering |
Mar. 17, 2009 |
| 7501596 |
Dimension sensor and method for stopping expansion of a tube |
Mar. 10, 2009 |
| 7495749 |
Rapid method for sub-critical fatigue crack growth evaluation |
Feb. 24, 2009 |
| 7495750 |
Monitoring device for rotating body |
Feb. 24, 2009 |
| 7477995 |
Optical linear strain gage |
Jan. 13, 2009 |
| 7460216 |
Surface strain measuring device |
Dec. 2, 2008 |
| 7444882 |
Material failure prediction/stress/strain detection method and system using deformation luminescence |
Nov. 4, 2008 |
| 7430038 |
Apparatus for enhancing visualization of mechanical stress |
Sep. 30, 2008 |
| 7403323 |
Process control monitors for interferometric modulators |
Jul. 22, 2008 |
| 7391507 |
Method of photo-reflectance characterization of strain and active dopant in semiconductor structures |
Jun. 24, 2008 |
| 7327444 |
Substrate inspection apparatus and method |
Feb. 5, 2008 |
| 7317514 |
System and method for optimizing heat management |
Jan. 8, 2008 |
| 7307702 |
Color switchable stress-fracture sensor for damage control |
Dec. 11, 2007 |
| 7295307 |
Method of and apparatus for measuring stress of semiconductor material |
Nov. 13, 2007 |
| 7289231 |
Apparatus and method for determining physical properties of a mask blank |
Oct. 30, 2007 |
| 7286210 |
Passive optical sensor using carbon nanotubes |
Oct. 23, 2007 |
| 7277162 |
Dynamic performance monitoring of long slender structures using optical fiber strain sensors |
Oct. 2, 2007 |
| 7190440 |
Controlling compressive force using pressure sensitive film |
Mar. 13, 2007 |
| 7170590 |
Distributed optical fiber sensor system |
Jan. 30, 2007 |
| 7030366 |
Micro piezo-optic composite transducers and fabrication methods |
Apr. 18, 2006 |
| 7024343 |
Method for calibrating a mathematical model |
Apr. 4, 2006 |
| 7005630 |
Energy-modulating fiber grating sensor |
Feb. 28, 2006 |
| 6999641 |
Measurement of large strains in ropes using plastic optical fibers |
Feb. 14, 2006 |
| 6985213 |
Method and apparatus for measuring material property |
Jan. 10, 2006 |
| 6956981 |
Long base, stretched fiber-optic Bragg network extensometer and production method for same |
Oct. 18, 2005 |
| 6934013 |
Compressed symbology strain gage |
Aug. 23, 2005 |
| 6912912 |
Pressure sensor having an optical waveguide and method for pressure detection |
Jul. 5, 2005 |
| 6876786 |
Fiber-optic sensing system for distributed detection and localization of alarm conditions |
Apr. 5, 2005 |
| 6847438 |
Apparatus for inspecting surface strain of magnetic tape |
Jan. 25, 2005 |
| 6826491 |
Method and apparatus for providing film stress measurements based on substrate displacement |
Nov. 30, 2004 |
| 6822217 |
Optical spectrum analyzer |
Nov. 23, 2004 |
| 6822218 |
Method of and apparatus for wavelength detection |
Nov. 23, 2004 |
| 6813403 |
Monitoring of large structures using brillouin spectrum analysis |
Nov. 2, 2004 |
| 6810748 |
Method for evaluating creep lifetime |
Nov. 2, 2004 |
| 6809803 |
Surface topology inspection |
Oct. 26, 2004 |
| 6785051 |
Intrinsic birefringence compensation for below 200 nanometer wavelength optical lithography components with cubic crystalline structures |
Aug. 31, 2004 |
| 6781113 |
Fiber bragg grating strain sensor with arc configuration |
Aug. 24, 2004 |
| 6771356 |
Scatterometry of grating structures to monitor wafer stress |
Aug. 3, 2004 |
| 6710861 |
Method and apparatus for measuring web strain in a confined area |
Mar. 23, 2004 |
| 6710328 |
Fiber optic composite damage sensor |
Mar. 23, 2004 |
| 6698919 |
Method of utilizing a fiber for simultaneously measuring distributed strain and temperature |
Mar. 2, 2004 |
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