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Class Information
Number: 356/239.7
Name: Optics: measuring and testing > Inspection of flaws or impurities > Transparent or translucent material > Surface condition
Description: Inspection of transparent or translucent material wherein the specimen being detected is an exterior or an interior veneer of the container.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7427767 |
Apparatus for identifying the condition of a conveyor belt |
Sep. 23, 2008 |
| 7417725 |
Illumination method and device for detecting surface defects and/or material shortage on the neck ring of a container |
Aug. 26, 2008 |
| 7408633 |
Apparatus and method for inspecting film defect |
Aug. 5, 2008 |
| 7408646 |
Method and apparatus for determining local variation of the reflection or transmission behavior over a mask surface |
Aug. 5, 2008 |
| 7289655 |
Device for inspecting illumination optical device and method for inspecting illumination optical device |
Oct. 30, 2007 |
| 7245378 |
Measuring laser light transmissivity in a to-be-welded region of a work piece |
Jul. 17, 2007 |
| 7184138 |
Spatial filter for sample inspection system |
Feb. 27, 2007 |
| 7177025 |
Measuring specular reflectance of a sample |
Feb. 13, 2007 |
| 7078721 |
Object detection apparatus for a vehicle |
Jul. 18, 2006 |
| 7010462 |
System and method for evaluating efficiency losses for turbine components |
Mar. 7, 2006 |
| 7006233 |
Method of detecting a distortion on a surface |
Feb. 28, 2006 |
| 6980296 |
Measuring laser light transmissivity in a to-be-welded region of a work piece |
Dec. 27, 2005 |
| 6961127 |
Device and method for optical inspection |
Nov. 1, 2005 |
| 6927378 |
Apparatus and method for monitoring of cathode ray tube panel manufacturing to reduce CRT cost and improve performance and yield |
Aug. 9, 2005 |
| 6882414 |
Broadband infrared spectral surface spectroscopy |
Apr. 19, 2005 |
| 6833554 |
Laser-induced defect detection system and method |
Dec. 21, 2004 |
| 6781684 |
Workpiece levitation using alternating positive and negative pressure flows |
Aug. 24, 2004 |
| 6727995 |
Gate oxide thickness measurement and control using scatterometry |
Apr. 27, 2004 |
| 6721046 |
Monitoring of concentration of nitrogen in nitrided gate oxides, and gate oxide interfaces |
Apr. 13, 2004 |
| 6686602 |
Patterned wafer inspection using spatial filtering |
Feb. 3, 2004 |
| 6618136 |
Method and apparatus for visually inspecting transparent body and translucent body |
Sep. 9, 2003 |
| 6563126 |
Ultraviolet light permeable filter for flaw detection light and method for detection of flaws |
May. 13, 2003 |
| 6508990 |
Substrate treating method and apparatus |
Jan. 21, 2003 |
| 6509967 |
Method for detecting optical errors in large surface panels |
Jan. 21, 2003 |
| 6501546 |
Inspection system for edges of glass |
Dec. 31, 2002 |
| 6498867 |
Method and apparatus for differential illumination image-capturing and defect handling |
Dec. 24, 2002 |
| 6493078 |
Method and apparatus to improve coating quality |
Dec. 10, 2002 |
| 6458213 |
Method and device for automatic cleaning of opto-electronic sensor systems for substance analysis |
Oct. 1, 2002 |
| 6433353 |
Method and apparatus for inspecting surface irregularities of transparent plate |
Aug. 13, 2002 |
| 6396579 |
Method, apparatus, and system for inspecting transparent objects |
May. 28, 2002 |
| 6391158 |
Method for loose draw detection in a paper machine wet press |
May. 21, 2002 |
| 6388745 |
Detecting inclusions in transparent sheets |
May. 14, 2002 |
| 6376829 |
Method of and apparatus for inspecting surface irregularities of transparent plate |
Apr. 23, 2002 |
| 6275286 |
Method and device for detecting faults in flat glass |
Aug. 14, 2001 |
| 6184976 |
Apparatus and method for measuring an aerial image using transmitted light and reflected light |
Feb. 6, 2001 |
| 6115118 |
Vehicle windshield scanning system |
Sep. 5, 2000 |
| 6104482 |
Container finish check detection |
Aug. 15, 2000 |
| 6088092 |
Glass substrate inspection apparatus |
Jul. 11, 2000 |
| 6014208 |
Examining a diamond |
Jan. 11, 2000 |
| 5995218 |
Method for inspecting defects of wafer and inspection equipment thereof |
Nov. 30, 1999 |
| 5907396 |
Optical detection system for detecting defects and/or particles on a substrate |
May. 25, 1999 |
| 5767962 |
Inspection system and device manufacturing method using the same |
Jun. 16, 1998 |
| 5760413 |
Method and apparatus for inspecting pipe thickness |
Jun. 2, 1998 |
| 5615777 |
Egg candling system |
Apr. 1, 1997 |
| 5602648 |
Process and device for measuring optical quality of the surface of a transparent object by contact with a wetted flexible surface |
Feb. 11, 1997 |
| 5557403 |
System and method for measuring crazing in a transparency |
Sep. 17, 1996 |
| 5444535 |
High signal-to-noise optical apparatus and method for glass bottle thread damage detection |
Aug. 22, 1995 |
| 5438405 |
Device and method for testing optical elements |
Aug. 1, 1995 |
| 5355213 |
Inspection system for detecting surface flaws |
Oct. 11, 1994 |
| 5305080 |
Apparatus for inspecting surface of a face plate for a cathode ray tube |
Apr. 19, 1994 |
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