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Class Information
Number: 356/237.1
Name: Optics: measuring and testing > Inspection of flaws or impurities
Description: Subject matter wherein the presence of an imperfection, or foreign substance is determined using light reflected from or passing through a viewed specimen.










Sub-classes under this class:

Class Number Class Name Patents
356/241.1 Bore inspection (e.g., borescopes, intrascope, etc.) 225
356/240.1 Containers or enclosures (e.g., packages, cans, etc.) 130
356/237.6 Having predetermined light transmission regions (e.g., holes, aperture, multiple material articles) 168
356/237.2 Surface condition 1,385
356/238.1 Textile inspection 87
356/239.1 Transparent or translucent material 333


Patents under this class:

Patent Number Title Of Patent Date Issued
8710997 Method and device for the detection of defects or correction of defects in machines Apr. 29, 2014
8705050 Providing thermal compensation for topographic measurement at an elevated temperature using a non-contact vibration transducer Apr. 22, 2014
8687181 Method and apparatus for testing light-emitting device Apr. 1, 2014
8670116 Method and device for inspecting for defects Mar. 11, 2014
8670115 Inspection method and inspection apparatus Mar. 11, 2014
8660336 Defect inspection system Feb. 25, 2014
8654325 Substrate processing apparatus, substrate processing method, and computer-readable storage medium having program for executing the substrate processing method stored therein Feb. 18, 2014
8644587 Method for detecting optical defects in transparencies Feb. 4, 2014
8643843 Method of estimating a degree of contamination of a front screen of an optical detection apparatus and optical detection apparatus Feb. 4, 2014
8643837 Methods and materials for calibration of a reader Feb. 4, 2014
8643835 Active planar autofocus Feb. 4, 2014
8643834 Apparatus of inspecting defect in semiconductor and method of the same Feb. 4, 2014
8643833 System for inspecting surface defects of a specimen and a method thereof Feb. 4, 2014
8638430 Method for defect determination in fine concave-convex pattern and method for defect determination on patterned medium Jan. 28, 2014
8634070 Method and apparatus for optically inspecting a magnetic disk Jan. 21, 2014
8634069 Defect inspection device and defect inspection method Jan. 21, 2014
8629407 Contamination inspection Jan. 14, 2014
8610891 Gantry apparatus Dec. 17, 2013
8610890 Arrangement and method for measuring the deformation of a shaft Dec. 17, 2013
8610889 Automated optical inspection device and calibration method thereof Dec. 17, 2013
8605277 Method of inspecting semiconductor device Dec. 10, 2013
8605146 Apparatus for optically inspecting an at least partially reflecting surface of an object Dec. 10, 2013
8599379 Method for inspecting defects and defect inspecting apparatus Dec. 3, 2013
8593625 Examining apparatus and examining method Nov. 26, 2013
8587777 Examination method and examination device Nov. 19, 2013
8582864 Fault inspection method Nov. 12, 2013
8582102 TFT-LCD array substrate, method and apparatus for detecting size or alignment deviation of multilayer patterns Nov. 12, 2013
8582094 Systems and methods for inspecting specimens including specimens that have a substantially rough uppermost layer Nov. 12, 2013
8581977 Apparatus and method for inspecting labeled containers Nov. 12, 2013
8577123 Method and system for evaluating contact elements Nov. 5, 2013
8576393 Method and apparatus for optical inspection, detection and analysis of double sided wafer macro defects Nov. 5, 2013
8576392 Multiplexed optical fiber crack sensor Nov. 5, 2013
8570614 Determining maintenance conditions in a document scanner Oct. 29, 2013
8570505 One-dimensional coherent fiber array for inspecting components in a gas turbine engine Oct. 29, 2013
8570504 Method and system for optically inspecting parts Oct. 29, 2013
8564767 Defect inspecting apparatus and defect inspecting method Oct. 22, 2013
8559018 Detection method of crack occurrence position Oct. 15, 2013
8559001 Inspection guided overlay metrology Oct. 15, 2013
8553228 Web inspection calibration system and related methods Oct. 8, 2013
8553214 Method and equipment for detecting pattern defect Oct. 8, 2013
8549735 Component-mounting device, component-mounting system, and component-mounting method Oct. 8, 2013
8547548 Final defect inspection system Oct. 1, 2013
8547545 Method and apparatus for inspecting a surface of a substrate Oct. 1, 2013
8537215 Multi-camera skin inspection system for extruded ceramic honeycomb structures Sep. 17, 2013
8526705 Driven scanning alignment for complex shapes Sep. 3, 2013
8524021 In-process vision detection of flaw and FOD characteristics Sep. 3, 2013
8520201 Optical signal inspection device Aug. 27, 2013
8514390 Optical equipment and registration method Aug. 20, 2013
8514388 Flaw inspecting method and device therefor Aug. 20, 2013
8514387 Arrangement for measuring sections of track for the purpose of maintaining railroad tracks Aug. 20, 2013











 
 
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