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Class Information
Number: 356/237.1
Name: Optics: measuring and testing > Inspection of flaws or impurities
Description: Subject matter wherein the presence of an imperfection, or foreign substance is determined using light reflected from or passing through a viewed specimen.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7623226 |
Optical method and device for detecting surface and structural defects of a travelling hot product |
Nov. 24, 2009 |
| 7623698 |
Method of learning a knowledge-based database used in automatic defect classification |
Nov. 24, 2009 |
| 7619728 |
Methods and systems for in-situ machinery inspection |
Nov. 17, 2009 |
| 7619729 |
Method for detecting particles and defects and inspection equipment thereof |
Nov. 17, 2009 |
| 7614144 |
Component mounting apparatus |
Nov. 10, 2009 |
| 7616298 |
Disk transfer mechanism, and disk inspection apparatus and disk inspection method using the same |
Nov. 10, 2009 |
| 7616299 |
Surface inspection method and surface inspection apparatus |
Nov. 10, 2009 |
| 7616300 |
Edge flaw detection device |
Nov. 10, 2009 |
| 7605921 |
Synchronous optical measurement and inspection method and means |
Oct. 20, 2009 |
| 7602487 |
Surface inspection apparatus and surface inspection head apparatus |
Oct. 13, 2009 |
| 7599054 |
Pattern inspection apparatus |
Oct. 6, 2009 |
| 7595868 |
Method for determining hair conditions |
Sep. 29, 2009 |
| 7593099 |
Method and device for configuration examination |
Sep. 22, 2009 |
| 7586596 |
Field folding optical method for imaging system |
Sep. 8, 2009 |
| 7586594 |
Method for inspecting defect and apparatus for inspecting defect |
Sep. 8, 2009 |
| 7586593 |
Inspection method and inspection apparatus |
Sep. 8, 2009 |
| 7577353 |
Device and method for optically inspecting a surface |
Aug. 18, 2009 |
| 7576848 |
System and method to decrease probe size for improved laser ultrasound detection |
Aug. 18, 2009 |
| 7576849 |
Method and apparatus for optically controlling the quality of objects having a circular edge |
Aug. 18, 2009 |
| 7564543 |
Defective pixel correction apparatus for liquid crystal panel |
Jul. 21, 2009 |
| 7557909 |
Printed matter inspection device, printing press and printed matter inspection method |
Jul. 7, 2009 |
| 7557326 |
Laser joining head assembly and laser joining method |
Jul. 7, 2009 |
| 7554654 |
Surface characteristic analysis |
Jun. 30, 2009 |
| 7551272 |
Method and an apparatus for simultaneous 2D and 3D optical inspection and acquisition of optical inspection data of an object |
Jun. 23, 2009 |
| 7551273 |
Mask defect inspection apparatus |
Jun. 23, 2009 |
| 7551762 |
Method and system for automatic vision inspection and classification of microarray slides |
Jun. 23, 2009 |
| 7548309 |
Inspection apparatus, inspection method, and manufacturing method of pattern substrate |
Jun. 16, 2009 |
| 7545502 |
Methods for detecting compression wood in lumber |
Jun. 9, 2009 |
| 7538866 |
Optical sensor and method for optically inspecting surfaces |
May. 26, 2009 |
| 7535563 |
Systems configured to inspect a specimen |
May. 19, 2009 |
| 7535560 |
Method and system for the inspection of integrated circuit devices having leads |
May. 19, 2009 |
| 7530906 |
Golf ball manufacturing method |
May. 12, 2009 |
| 7532316 |
Display panel inspection apparatus and method |
May. 12, 2009 |
| 7532318 |
Wafer edge inspection |
May. 12, 2009 |
| 7528940 |
System and method for inspecting an object using an acousto-optic device |
May. 5, 2009 |
| 7528942 |
Method and apparatus for detecting defects |
May. 5, 2009 |
| 7528944 |
Methods and systems for detecting pinholes in a film formed on a wafer or for monitoring a thermal process tool |
May. 5, 2009 |
| 7525661 |
Laser photo-thermo-acoustic (PTA) frequency swept heterodyned lock-in depth profilometry imaging system |
Apr. 28, 2009 |
| 7525649 |
Surface inspection system using laser line illumination with two dimensional imaging |
Apr. 28, 2009 |
| 7518716 |
Granular product inspection device |
Apr. 14, 2009 |
| 7511807 |
Method and apparatus for detection of inclusion in glass |
Mar. 31, 2009 |
| 7508974 |
Electronic component products and method of manufacturing electronic component products |
Mar. 24, 2009 |
| 7504625 |
Substrate inspection method, manufacturing method of semiconductor device and substrate inspection apparatus |
Mar. 17, 2009 |
| 7505124 |
Automated inspection system and method |
Mar. 17, 2009 |
| 7505149 |
Apparatus for surface inspection and method and apparatus for inspecting substrate |
Mar. 17, 2009 |
| 7502101 |
Apparatus and method for enhanced critical dimension scatterometry |
Mar. 10, 2009 |
| 7502102 |
System and method of imaging the characteristics of an object |
Mar. 10, 2009 |
| 7495759 |
Damage and wear detection for rotary cutting blades |
Feb. 24, 2009 |
| 7495758 |
Apparatus and methods for two-dimensional and three-dimensional inspection of a workpiece |
Feb. 24, 2009 |
| 7495757 |
Semiconductor manufacturing apparatus and wafer processing method |
Feb. 24, 2009 |
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