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Class Information
Number: 356/150
Name: Optics: measuring and testing > Angle measuring or angular axial alignment > Sides of angle or axes being aligned transverse to optical axis (e.g., drift meter)
Description: Subject matter where the axes being aligned or lines determining the angle being measured lie in a plane transverse to the optical axis of the measuring or aligning device.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7333191 |
Scanning probe microscope and measurement method using the same |
Feb. 19, 2008 |
| 7315360 |
Surface coordinate system |
Jan. 1, 2008 |
| 7238935 |
Light detection device |
Jul. 3, 2007 |
| 7188348 |
Optical disc drive apparatus and method |
Mar. 6, 2007 |
| 7001830 |
System and method of pattern recognition and metrology structure for an X-initiative layout design |
Feb. 21, 2006 |
| 6922483 |
Methods for measuring DMD low frequency spatial uniformity |
Jul. 26, 2005 |
| 6867854 |
Liquid to solid angle of contact measurement |
Mar. 15, 2005 |
| 6765662 |
Surface analysis |
Jul. 20, 2004 |
| 6674521 |
Optical method and system for rapidly measuring relative angular alignment of flat surfaces |
Jan. 6, 2004 |
| 6628378 |
Methods and apparatus for aligning rolls |
Sep. 30, 2003 |
| 6612702 |
Projection display device |
Sep. 2, 2003 |
| 6559955 |
Straightness measuring apparatus for moving stage |
May. 6, 2003 |
| 6476914 |
Process and device for ascertaining whether two successive shafts are in alignment |
Nov. 5, 2002 |
| 6407806 |
Angle compensation method |
Jun. 18, 2002 |
| 6404485 |
Rotation amount detecting system of deflection mirror for optical disc drive |
Jun. 11, 2002 |
| 6351313 |
Device for detecting the position of two bodies |
Feb. 26, 2002 |
| 5861946 |
System for performing contact angle measurements of a substrate |
Jan. 19, 1999 |
| 5852300 |
Device for sensing a flat zone of a wafer for use in a wafer probe tester |
Dec. 22, 1998 |
| 5838445 |
Method and apparatus for determining surface roughness |
Nov. 17, 1998 |
| 5815256 |
Apparatus and method for measuring in-plane distribution of surface free energy |
Sep. 29, 1998 |
| 5659389 |
Non-intrusive throttle body calibration |
Aug. 19, 1997 |
| 5648847 |
Method and apparatus for normalizing a laser beam to a reflective surface |
Jul. 15, 1997 |
| 5644400 |
Method and apparatus for determining the center and orientation of a wafer-like object |
Jul. 1, 1997 |
| 5570189 |
Split-field pupil plane determination apparatus |
Oct. 29, 1996 |
| 5473424 |
Tilting apparatus |
Dec. 5, 1995 |
| 5467186 |
Attracting nozzle control apparatus for a chip component mounting machine |
Nov. 14, 1995 |
| 5452078 |
Method and apparatus for finding wafer index marks and centers |
Sep. 19, 1995 |
| 5383016 |
Method for aligning two reflective surfaces |
Jan. 17, 1995 |
| 5379112 |
Process for relative measurement of the center-line of an aperture and the center-line of a cylindrical outline |
Jan. 3, 1995 |
| 5371951 |
Two-axis inclinometer |
Dec. 13, 1994 |
| 5268733 |
Method and apparatus for measuring contact angles of liquid droplets on substrate surfaces |
Dec. 7, 1993 |
| 5264918 |
Method and device for detecting the center of a wafer |
Nov. 23, 1993 |
| 5229834 |
Sensor for detecting and measuring the angle of rotation of a plane of light polarization |
Jul. 20, 1993 |
| 5222033 |
Method of retrieving frames on a microfiche using arbitrarily designated frames |
Jun. 22, 1993 |
| 5218415 |
Device for optically detecting inclination of a surface |
Jun. 8, 1993 |
| 5140167 |
Method and apparatus for determining cleave end angle of an optical fiber |
Aug. 18, 1992 |
| 5110210 |
Precision angle sensor |
May. 5, 1992 |
| 5074660 |
Method and apparatus for measuring rotating movements |
Dec. 24, 1991 |
| 5073711 |
Fiber-optic remote angular position sensor including a polarization track |
Dec. 17, 1991 |
| 5046843 |
Method and apparatus for measuring the three-dimensional orientation of a body in space |
Sep. 10, 1991 |
| 5042945 |
Lithographic mask structure and device for positioning the same |
Aug. 27, 1991 |
| 5035503 |
Electro optically corrected coordinate measuring machine |
Jul. 30, 1991 |
| 5007739 |
Length measuring apparatus |
Apr. 16, 1991 |
| 4982188 |
System for measuring positional characteristics of an ejected object |
Jan. 1, 1991 |
| 4947909 |
Process and apparatus for optimizing volume of boards cut from a log |
Aug. 14, 1990 |
| 4907035 |
Universal edged-based wafer alignment apparatus |
Mar. 6, 1990 |
| 4898464 |
Method and apparatus for determining the position of an object |
Feb. 6, 1990 |
| 4896032 |
Active boresight drift measurement and calibration apparatus |
Jan. 23, 1990 |
| 4890918 |
Docking alignment system |
Jan. 2, 1990 |
| 4867556 |
Apparatus for determining the path of a pulsed light beam |
Sep. 19, 1989 |
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