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Browse by Category: Main > Optical & Optics
Class Information
Number: 356/139.07
Name: Optics: measuring and testing > Angle measuring or angular axial alignment > Automatic following or aligning while indicating measurement > With photodetection of reflected beam angle with respect to a unidirectional source beam
Description: Subject matter including a source beam directed along one axis to the object from which its reflected direction, with respect to its projected direction, is indicated and either followed or aligned.


Sub-classes under this class:

Class Number Class Name Patents
356/139.08 With source beam moving to follow or align 59


Patents under this class:
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Patent Number Title Of Patent Date Issued
7515257 Short-range/long-range integrated target (SLIT) for video guidance sensor rendezvous and docking Apr. 7, 2009
7502100 Three-dimensional position measurement method and apparatus used for three-dimensional position measurement Mar. 10, 2009
7440585 Autonomous vehicle and motion control therefor Oct. 21, 2008
7385684 Angular position sensor Jun. 10, 2008
7359041 Method and system for optically tracking a target using a triangulation technique Apr. 15, 2008
7330246 Tilt meter based on the field transmission through a resonator Feb. 12, 2008
7233887 Method of photomask correction and its optimization using localized frequency analysis Jun. 19, 2007
7212294 Method for determination of the level of two or more measurement points, and an arrangement for this purpose May. 1, 2007
7023537 System for monitoring the movements of construction work parts Apr. 4, 2006
6922483 Methods for measuring DMD low frequency spatial uniformity Jul. 26, 2005
6756581 Deviation detecting device, rotary laser apparatus with the same, and position determining system with deviation detecting/correcting device Jun. 29, 2004
6741341 Reentry vehicle interceptor with IR and variable FOV laser radar May. 25, 2004
6693272 Light path deviation detecting apparatus and confocal microscope Feb. 17, 2004
6678059 Apparatus for measuring 6-degree-of-freedom motions of rigid body by using three-facet mirror Jan. 13, 2004
6587191 In-action boresight Jul. 1, 2003
6445446 Surveying instrument Sep. 3, 2002
6435008 Apparatus and method for determining porosity Aug. 20, 2002
6437859 Device for detecting optical position Aug. 20, 2002
6396608 Method and device for calibrating the deviation of a received beam from its desired position in a terminal May. 28, 2002
6262800 Dual mode semi-active laser/laser radar seeker Jul. 17, 2001
6249338 Laser survey instrument Jun. 19, 2001
6133988 Device for the measurement of distances or of the angle of incidence of a light beam Oct. 17, 2000
6097481 Bang-bang laser spot tracker Aug. 1, 2000
6075586 Laser survey instrument Jun. 13, 2000
6046800 Position detection surveying device Apr. 4, 2000
6011613 Laser survey instrument Jan. 4, 2000
5978076 Reference light generator Nov. 2, 1999
5669580 Sensor device for a missile Sep. 23, 1997
5475600 Mobile robot which utilizes inertial navigation to calculate shortest return distance Dec. 12, 1995
5313409 Arrangement for performing position determination May. 17, 1994
5216480 Surveying instrument Jun. 1, 1993
5202742 Laser radar for a vehicle lateral guidance system Apr. 13, 1993
5166745 Rapid re-targeting, space-based, boresight alignment system and method for neutral particle beams Nov. 24, 1992
5026156 Method and system for pulse interval modulation Jun. 25, 1991
4886353 Measuring device employing laser interferometry Dec. 12, 1989
4846297 Automated guided vehicle Jul. 11, 1989
4790402 Automated guided vehicle Dec. 13, 1988
4790651 Tracking laser interferometer Dec. 13, 1988
4764982 Secure communication system Aug. 16, 1988
4701050 Semiconductor exposure apparatus and alignment method therefor Oct. 20, 1987
4668089 Exposure apparatus and method of aligning exposure mask with workpiece May. 26, 1987
4600305 Dynamic energy centroid locator and processor (declp) Jul. 15, 1986
4558949 Horizontal position detecting device Dec. 17, 1985
4425037 Apparatus for projecting a series of images onto dies of a semiconductor wafer Jan. 10, 1984
4287412 Photoelectric direction finder Sep. 1, 1981
4123651 Apparatus and method for speckle tracking Oct. 31, 1978
4103998 Automatic alignment apparatus Aug. 1, 1978
4097007 Missile guidance system utilizing polarization Jun. 27, 1978
4090068 Process for the automatic adjustment of semiconductor wafers May. 16, 1978
4065211 Precision X-ray diffraction system incorporating a laser aligner Dec. 27, 1977

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