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Class Information
Number: 348/126
Name: Television > Special applications > Flaw detector > Of electronic circuit chip or board
Description: Subject matter wherein the object to be inspected is a semiconductor substrate or a board on which multiple semiconductor devices are integrated.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7576348 |
One-dimensional phase contrast microscopy with a traveling lens generated by a step function change |
Aug. 18, 2009 |
| 7570798 |
Method of manufacturing ball array devices using an inspection apparatus having one or more cameras and ball array devices produced according to the method |
Aug. 4, 2009 |
| 7551769 |
Data structures and algorithms for precise defect location by analyzing artifacts |
Jun. 23, 2009 |
| 7545970 |
Visual inspection method and visual inspection apparatus |
Jun. 9, 2009 |
| 7522664 |
Remote live video inspection |
Apr. 21, 2009 |
| 7519216 |
Systems and methods of maintaining equipment for manufacturing semiconductor devices |
Apr. 14, 2009 |
| 7505619 |
System and method for conducting adaptive fourier filtering to detect defects in dense logic areas of an inspection surface |
Mar. 17, 2009 |
| 7466854 |
Size checking method and apparatus |
Dec. 16, 2008 |
| 7457455 |
Pattern defect inspection method and apparatus |
Nov. 25, 2008 |
| 7457453 |
Pattern inspection method and apparatus |
Nov. 25, 2008 |
| 7412090 |
Method of managing wafer defects |
Aug. 12, 2008 |
| 7388979 |
Method and apparatus for inspecting pattern defects |
Jun. 17, 2008 |
| 7385687 |
Inspection device |
Jun. 10, 2008 |
| 7372632 |
Apparatus and methods for the inspection of microvias in printed circuit boards |
May. 13, 2008 |
| 7316938 |
Adjustable film frame aligner |
Jan. 8, 2008 |
| 7314403 |
Apparatus and method for fabricating liquid crystal display panel |
Jan. 1, 2008 |
| 7283660 |
Multi-layer printed circuit board fabrication system and method |
Oct. 16, 2007 |
| 7266235 |
Pattern inspection method and apparatus |
Sep. 4, 2007 |
| 7254263 |
Apparatus and method for defect detection and program thereof |
Aug. 7, 2007 |
| 7236625 |
Systems and method for identifying foreign objects and debris (FOD) and defects during fabrication of a composite structure |
Jun. 26, 2007 |
| 7199816 |
Device and method for picking up image of component, and component mounting apparatus |
Apr. 3, 2007 |
| 7190822 |
Method for customizing an integrated circuit element |
Mar. 13, 2007 |
| 7181058 |
Method and system for inspecting electronic components mounted on printed circuit boards |
Feb. 20, 2007 |
| 7177458 |
Reduction of false alarms in PCB inspection |
Feb. 13, 2007 |
| 7149340 |
Mask defect analysis for both horizontal and vertical processing effects |
Dec. 12, 2006 |
| 7149343 |
Methods for analyzing defect artifacts to precisely locate corresponding defects |
Dec. 12, 2006 |
| 7145162 |
Wire loop height measurement apparatus and method |
Dec. 5, 2006 |
| 7133550 |
Pattern inspection method and apparatus |
Nov. 7, 2006 |
| 7116817 |
Method and apparatus for inspecting a semiconductor device |
Oct. 3, 2006 |
| 7113629 |
Pattern inspecting apparatus and method |
Sep. 26, 2006 |
| 7110591 |
System and method for recognizing markers on printed circuit boards |
Sep. 19, 2006 |
| 7075565 |
Optical inspection system |
Jul. 11, 2006 |
| 7053395 |
Wafer defect detection system with traveling lens multi-beam scanner |
May. 30, 2006 |
| 7031511 |
Hole inspection apparatus and method |
Apr. 18, 2006 |
| 7024031 |
System and method for inspection using off-angle lighting |
Apr. 4, 2006 |
| 7016526 |
Pixel based machine for patterned wafers |
Mar. 21, 2006 |
| 6987874 |
Method and apparatus for managing surface image of thin film device, and method and apparatus for manufacturing thin film device using the same |
Jan. 17, 2006 |
| 6978041 |
Review work supporting system |
Dec. 20, 2005 |
| 6952492 |
Method and apparatus for inspecting a semiconductor device |
Oct. 4, 2005 |
| 6950548 |
Creating geometric model descriptions for use in machine vision inspection systems |
Sep. 27, 2005 |
| 6950549 |
Visual inspection method and visual inspection apparatus |
Sep. 27, 2005 |
| 6943826 |
Apparatus for debugging imaging devices and method of testing imaging devices |
Sep. 13, 2005 |
| 6941009 |
Method for evaluating pattern defects on a water surface |
Sep. 6, 2005 |
| 6940537 |
Inspecting apparatus of printed state or the like in flexible printed circuit board |
Sep. 6, 2005 |
| 6937753 |
Automated wafer defect inspection system and a process of performing such inspection |
Aug. 30, 2005 |
| 6925202 |
System and method of providing mask quality control |
Aug. 2, 2005 |
| 6901160 |
Directional lighting and method to distinguish three dimensional information |
May. 31, 2005 |
| 6870951 |
Method and apparatus to facilitate auto-alignment of images for defect inspection and defect analysis |
Mar. 22, 2005 |
| 6853744 |
System and method for confirming electrical connection defects |
Feb. 8, 2005 |
| 6850637 |
Lighting arrangement for automated optical inspection system |
Feb. 1, 2005 |
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