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Class Information
Number: 348/125
Name: Television > Special applications > Flaw detector
Description: Subject matter wherein a picture signal generator is utilized to view an object and the signals so generated produce a display whereby imperfections in the object may be visually observed, or wherein the signals generated are compared with signals representative of a standard to provide an indication of whether imperfections exist in the object.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7619668 |
Abnormality detecting apparatus for imaging apparatus |
Nov. 17, 2009 |
| 7616803 |
Surface inspection method and apparatus |
Nov. 10, 2009 |
| 7599545 |
Method and its apparatus for inspecting defects |
Oct. 6, 2009 |
| 7583832 |
Method and its apparatus for classifying defects |
Sep. 1, 2009 |
| 7580558 |
Screen printing apparatus |
Aug. 25, 2009 |
| 7502068 |
Sensor for imaging inside equipment |
Mar. 10, 2009 |
| 7492940 |
Mask defect analysis system |
Feb. 17, 2009 |
| 7492941 |
Mask defect analysis system |
Feb. 17, 2009 |
| 7456859 |
Image pickup device |
Nov. 25, 2008 |
| 7454052 |
Pixel based machine for patterned wafers |
Nov. 18, 2008 |
| 7440608 |
Method and system for detecting image defects |
Oct. 21, 2008 |
| 7436992 |
Methods and apparatus for testing a component |
Oct. 14, 2008 |
| 7425982 |
Method and apparatus for resampling line scan data |
Sep. 16, 2008 |
| 7424146 |
Defect inspection method |
Sep. 9, 2008 |
| 7417243 |
High-sensitivity optical scanning using memory integration |
Aug. 26, 2008 |
| 7409080 |
Inspection method of electric part |
Aug. 5, 2008 |
| 7408570 |
Web inspection system |
Aug. 5, 2008 |
| 7408569 |
Image processing device, image processing method and recording medium |
Aug. 5, 2008 |
| 7379580 |
Method for detecting defects |
May. 27, 2008 |
| 7340084 |
Quality assessment of product in bulk flow |
Mar. 4, 2008 |
| 7305115 |
Method and system for improving ability of a machine vision system to discriminate features of a target |
Dec. 4, 2007 |
| 7274812 |
Image processing device and method |
Sep. 25, 2007 |
| 7272253 |
Method for non-destructive inspection, apparatus thereof and digital camera system |
Sep. 18, 2007 |
| 7260244 |
Print inspection method and print inspection apparatus |
Aug. 21, 2007 |
| 7257247 |
Mask defect analysis system |
Aug. 14, 2007 |
| 7224834 |
Computer system for relieving fatigue |
May. 29, 2007 |
| 7218769 |
Image data management system and computer-readable recording medium |
May. 15, 2007 |
| 7199816 |
Device and method for picking up image of component, and component mounting apparatus |
Apr. 3, 2007 |
| 7181059 |
Apparatus and methods for the inspection of objects |
Feb. 20, 2007 |
| 7162072 |
Semiconductor processing device, semiconductor processing system and semiconductor processing management method |
Jan. 9, 2007 |
| 7162073 |
Methods and apparatuses for detecting classifying and measuring spot defects in an image of an object |
Jan. 9, 2007 |
| 7145162 |
Wire loop height measurement apparatus and method |
Dec. 5, 2006 |
| 7129509 |
High-sensitivity optical scanning using memory integration |
Oct. 31, 2006 |
| 7116817 |
Method and apparatus for inspecting a semiconductor device |
Oct. 3, 2006 |
| 7110590 |
Method and return vending machine device for handling empty beverage containers |
Sep. 19, 2006 |
| 7065238 |
Defect inspection method and defect inspection equipment |
Jun. 20, 2006 |
| 7027637 |
Adaptive threshold determination for ball grid array component modeling |
Apr. 11, 2006 |
| 7019771 |
Inspection device for components |
Mar. 28, 2006 |
| 6987875 |
Probe mark inspection method and apparatus |
Jan. 17, 2006 |
| 6983065 |
Method for extracting features from an image using oriented filters |
Jan. 3, 2006 |
| 6973209 |
Defect inspection system |
Dec. 6, 2005 |
| 6970590 |
Side lit, 3D edge location method |
Nov. 29, 2005 |
| 6958769 |
High resolution sheet metal scanner with independent tracking light source |
Oct. 25, 2005 |
| 6959108 |
Image based defect detection system |
Oct. 25, 2005 |
| 6952492 |
Method and apparatus for inspecting a semiconductor device |
Oct. 4, 2005 |
| 6937754 |
Inspection equipment |
Aug. 30, 2005 |
| 6928185 |
Defect inspection method and defect inspection apparatus |
Aug. 9, 2005 |
| 6922481 |
Programming apparatus of a visual inspection program |
Jul. 26, 2005 |
| 6920241 |
System and method for bundled location and regional inspection |
Jul. 19, 2005 |
| 6885393 |
Illuminating unit for an article-sensing camera |
Apr. 26, 2005 |
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