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Class Information
Number: 33/831
Name: Geometrical instruments > Distance measuring > Opposed contacts > Micrometer > Details (e.g., spindle or anvil adjustment, material
Description: Subject matter which is directed to a detail of a specific element of the micrometer.


Patents under this class:

Patent Number Title Of Patent Date Issued
7584551 Absolute position measuring apparatus Sep. 8, 2009
7552544 Digital displacement measuring instrument Jun. 30, 2009
7484314 Micrometer screw gauge with non-rotating measuring screw Feb. 3, 2009
7467480 Digital displacement measuring instrument Dec. 23, 2008
7111413 Precision distance-measuring instrument Sep. 26, 2006
7043852 Measuring instrument May. 16, 2006
7013576 Measuring device using multi-start threaded spindle Mar. 21, 2006
6782635 Measurement gauge having extensions Aug. 31, 2004
6519867 Measuring device Feb. 18, 2003
6505414 Comparator Jan. 14, 2003
6463671 Micrometer Oct. 15, 2002
6308433 Micrometer that holds displayed displacement when retraction amount is less than a set amount Oct. 30, 2001
6260286 Micrometer Jul. 17, 2001
6243965 Electronic micrometer Jun. 12, 2001
6219932 Clip-on micrometer table Apr. 24, 2001
6178658 Micrometer Jan. 30, 2001
6176021 Micrometer Jan. 23, 2001
6115934 Micrometer, method for manufacturing cylindrical component for micrometer Sep. 12, 2000
5829155 Micrometer Nov. 3, 1998
5596813 Measuring instrument with diamond coated contacts Jan. 28, 1997
5469629 Brake rotor thickness measurement gage Nov. 28, 1995
5463818 Wide-width micrometer and method of using the same Nov. 7, 1995
5421101 Dedicated crimp measuring gauge Jun. 6, 1995
4986323 Adjustable stop apparatus Jan. 22, 1991
4550507 Thread construction in length measuring instrument and method for manufacturing thread construction Nov. 5, 1985



 
 
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