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Class Information
Number:
33/823
Name:
Geometrical instruments
>
Distance measuring
>
Opposed contacts
>
Micrometer
>
With preliminary setting arrangement
> Micrometer slidably mounted on a beam
Description:
Subject matter wherein a micrometer is movably mounted as a unit on a support for bringing one of the contacts to an approximate distance.
Sub-classes under this class:
Class Number
Class Name
Patents
33/824
Other contact slidable on beam
0
Patents under this class:
Patent Number
Title Of Patent
Date Issued
5287631
Precision extended-length micrometer with displacement meter probe adapter
Feb. 22, 1994
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