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Class Information
Number: 33/561
Name: Geometrical instruments > Gauge > Movable contact probe, per se > With electrical switch or transducer responsive to probe
Description: Subject matter wherein there is an (a) electric switch or (b) electric transducer responsive to the contact member or the contact member forms part of an electric closure device.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7395698 |
Three-dimensional nanoscale metrology using FIRAT probe |
Jul. 8, 2008 |
| 7367133 |
Device and method for coordinate measurement |
May. 6, 2008 |
| 7347000 |
Touch probe |
Mar. 25, 2008 |
| 7328519 |
Machine adaptation |
Feb. 12, 2008 |
| 7318285 |
Surface profile measuring instrument |
Jan. 15, 2008 |
| 7316076 |
Coordinate measuring device and a method for measuring the position of an object |
Jan. 8, 2008 |
| 7310891 |
Head for the linear dimension checking of mechanical pieces |
Dec. 25, 2007 |
| 7269911 |
Touch probe |
Sep. 18, 2007 |
| 7243439 |
Touch sensor |
Jul. 17, 2007 |
| 7228641 |
Bearing arrangement |
Jun. 12, 2007 |
| 7228642 |
Probe for a coordinate measuring machine |
Jun. 12, 2007 |
| 7202680 |
Touch probe |
Apr. 10, 2007 |
| 7185440 |
Sensing contact probe |
Mar. 6, 2007 |
| 7168179 |
Touch probe comprising a switch with contacts protected by inert gas |
Jan. 30, 2007 |
| 7159327 |
Touch probe with transmission device and spring for urging the device against guide surfaces |
Jan. 9, 2007 |
| 7155839 |
Probe head |
Jan. 2, 2007 |
| 7146741 |
Measuring probe with diaphragms and modules |
Dec. 12, 2006 |
| 7146742 |
Device for recognizing a probe head used in a measuring instrument |
Dec. 12, 2006 |
| 7100429 |
Surface profile measuring instrument and surface profile measuring method |
Sep. 5, 2006 |
| 7100297 |
Probe or stylus orientation |
Sep. 5, 2006 |
| 7076882 |
Head and apparatus for the linear dimension checking of mechanical pieces |
Jul. 18, 2006 |
| 7076883 |
Scanning probe |
Jul. 18, 2006 |
| 7065893 |
Measurement probe and using method for the same |
Jun. 27, 2006 |
| 7036239 |
Adjustable probe |
May. 2, 2006 |
| 6951060 |
Method for transmitting control commands from a transmitting element to a measuring probe |
Oct. 4, 2005 |
| 6938353 |
Adjustable probe |
Sep. 6, 2005 |
| 6922905 |
Probe head for a coordinate measuring apparatus |
Aug. 2, 2005 |
| 6922904 |
Method and system for analyzing transmitted signals from a probe system |
Aug. 2, 2005 |
| 6907673 |
Adjustable probe |
Jun. 21, 2005 |
| 6812850 |
Measuring apparatus |
Nov. 2, 2004 |
| 6782634 |
Sensor and method for locating a discontinuity |
Aug. 31, 2004 |
| 6760977 |
Trigger probe and method for assembling a trigger probe |
Jul. 13, 2004 |
| 6708420 |
Piezoelectric touch probe |
Mar. 23, 2004 |
| 6678966 |
Reseat system of touch signal probe |
Jan. 20, 2004 |
| 6665945 |
Method for operating a touch probe system and a touch probe system for executing the method |
Dec. 23, 2003 |
| 6643944 |
Touch signal probe and signal processing apparatus and signal processing method of the same |
Nov. 11, 2003 |
| 6640459 |
Multidimensional contact mechanics measurement system |
Nov. 4, 2003 |
| 6622114 |
Method for determining the weight of a probe of a coordinate measuring machine |
Sep. 16, 2003 |
| 6553682 |
Touch probe |
Apr. 29, 2003 |
| 6526672 |
Head for the linear dimension checking of mechanical pieces |
Mar. 4, 2003 |
| 6523273 |
Reseat system for touch probe in coordinates measuring machine |
Feb. 25, 2003 |
| 6516529 |
Touch signal probe |
Feb. 11, 2003 |
| 6487896 |
Head, system and method for the linear dimension checking of a mechanical piece |
Dec. 3, 2002 |
| 6487785 |
Method and circuit for adjusting a switching threshold of a touch probe |
Dec. 3, 2002 |
| 6484571 |
Surface configuration measuring method |
Nov. 26, 2002 |
| 6459281 |
Head for the linear dimension checking |
Oct. 1, 2002 |
| 6457373 |
Shock protection device for position-measuring probes |
Oct. 1, 2002 |
| 6446496 |
Surface texture measuring instrument |
Sep. 10, 2002 |
| 6438856 |
Apparatus for fine positioning of a component, and coordinate measuring machine having an apparatus for fine positioning of a component |
Aug. 27, 2002 |
| 6434851 |
Constant pressure mechanism of probe |
Aug. 20, 2002 |
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