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Class Information
Number: 33/559
Name: Geometrical instruments > Gauge > Movable contact probe, per se
Description: Subject matter which includes only the contact member with or without a transducer responsive to the contact member.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7594337 |
Power and/or signal paths for a machine tool accessory |
Sep. 29, 2009 |
| 7594338 |
Contour measuring probe for measuring aspects of objects |
Sep. 29, 2009 |
| 7594339 |
Sensor module for a probe of a tactile coordinate measuring machine |
Sep. 29, 2009 |
| 7591078 |
CMM arm with exoskeleton |
Sep. 22, 2009 |
| 7578210 |
Sensor leg assembly for a contour follower |
Aug. 25, 2009 |
| 7571550 |
Stylus for key duplicating machine with replaceable segmented stylus |
Aug. 11, 2009 |
| 7557933 |
Measuring probe, sample surface measuring apparatus and sample surface measuring method |
Jul. 7, 2009 |
| 7543394 |
Exchanging device |
Jun. 9, 2009 |
| 7542872 |
Form measuring instrument, form measuring method and form measuring program |
Jun. 2, 2009 |
| 7520067 |
Three-dimensional measurement probe |
Apr. 21, 2009 |
| 7503125 |
Coordinate measuring method and device |
Mar. 17, 2009 |
| 7500319 |
Measurement probe for use in coordinate measuring machines |
Mar. 10, 2009 |
| 7464484 |
Probe head |
Dec. 16, 2008 |
| 7426022 |
Liquid crystal module brightness measurement apparatus and brightness measurement apparatus |
Sep. 16, 2008 |
| 7415775 |
Orientable probe |
Aug. 26, 2008 |
| 7412779 |
Measuring tool |
Aug. 19, 2008 |
| 7398603 |
Distance measuring probe with air discharge system |
Jul. 15, 2008 |
| 7395606 |
CMM arm with exoskeleton |
Jul. 8, 2008 |
| 7395727 |
Strain detection for automated nano-manipulation |
Jul. 8, 2008 |
| 7392596 |
Probe head |
Jul. 1, 2008 |
| 7392692 |
Surface scan measuring device, surface scan measuring method, surface scan measuring program and recording medium |
Jul. 1, 2008 |
| 7367132 |
Contact-type displacement measuring apparatus |
May. 6, 2008 |
| 7363721 |
Countersink gauge having self-centering probe |
Apr. 29, 2008 |
| 7350310 |
Articulating device |
Apr. 1, 2008 |
| 7347000 |
Touch probe |
Mar. 25, 2008 |
| 7337551 |
Probe head for a coordinate measuring machine |
Mar. 4, 2008 |
| 7328519 |
Machine adaptation |
Feb. 12, 2008 |
| 7328518 |
Surface roughness/contour shape measuring apparatus |
Feb. 12, 2008 |
| 7316076 |
Coordinate measuring device and a method for measuring the position of an object |
Jan. 8, 2008 |
| 7316077 |
Probe for sensing the position of an object |
Jan. 8, 2008 |
| 7310891 |
Head for the linear dimension checking of mechanical pieces |
Dec. 25, 2007 |
| 7296364 |
Sensor module for a probe head of a tactile coordinated measuring machine |
Nov. 20, 2007 |
| 7293365 |
Probe or stylus orientation |
Nov. 13, 2007 |
| 7292354 |
Apparatus for photoelectric measurement of an original |
Nov. 6, 2007 |
| 7282017 |
Tool-switching device |
Oct. 16, 2007 |
| 7263780 |
Motorized orientable measuring head |
Sep. 4, 2007 |
| 7246448 |
Method for calibrating a probe |
Jul. 24, 2007 |
| 7231725 |
Probing pin and probe system equipped therewith |
Jun. 19, 2007 |
| 7228641 |
Bearing arrangement |
Jun. 12, 2007 |
| 7227647 |
Method for measuring surface properties and co-ordinate measuring device |
Jun. 5, 2007 |
| 7213344 |
Motorized orientable measuring head |
May. 8, 2007 |
| 7213345 |
Motorized orientable measuring head |
May. 8, 2007 |
| 7207120 |
Scanning head for a measuring device |
Apr. 24, 2007 |
| 7197835 |
Detector supporting mechanism |
Apr. 3, 2007 |
| 7178253 |
Coordinate measuring device with a vibration damping system |
Feb. 20, 2007 |
| 7174651 |
Portable coordinate measurement machine |
Feb. 13, 2007 |
| 7162383 |
Calibration method for surface texture measuring instrument, calibration program for surface texture measuring instrument, recording medium storing the calibration program and surface texture |
Jan. 9, 2007 |
| 7146741 |
Measuring probe with diaphragms and modules |
Dec. 12, 2006 |
| 7142313 |
Interaxis angle correction method |
Nov. 28, 2006 |
| 7124514 |
Probe for high speed scanning |
Oct. 24, 2006 |
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