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Class Information
Number: 324/769
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device > With barrier layer > Field effect transistor
Description: Subject matter wherein a logic circuit includes one or more unipolar transistors in which current carriers are injected at a source terminal and pass to a drain terminal through a channel of semiconductor material whose conductivity depends largely on an electrical field applied to the semiconductor from a control electrode (gate).

Patents under this class:
1 2 3 4 5 6 7 8

Patent Number Title Of Patent Date Issued
5537054 Method for testing an on-off function of semiconductor devices which have an isolated terminal Jul. 16, 1996
5528163 Method of inspecting cells of liquid crystal display Jun. 18, 1996
5521524 Method and system for screening reliability of semiconductor circuits May. 28, 1996
5519336 Method for electrically characterizing the insulator in SOI devices May. 21, 1996
5510725 Method and apparatus for testing a power bridge for an electric vehicle propulsion system Apr. 23, 1996
5508632 Method of simulating hot carrier deterioration of an MOS transistor Apr. 16, 1996
5504431 Device for and method of evaluating semiconductor integrated circuit Apr. 2, 1996
5495180 DC biasing and AC loading of high gain frequency transistors Feb. 27, 1996
5493238 Parameter extraction apparatus using MISFET devices of different gate lengths Feb. 20, 1996
5493231 Method and apparatus for measuring the barrier height distribution in an insulated gate field effect transistor Feb. 20, 1996
5486772 Reliability test method for semiconductor trench devices Jan. 23, 1996
5442302 Method and apparatus for measuring high-frequency C-V characteristics of MIS device Aug. 15, 1995
5428300 Method and apparatus for testing TFT-LCD Jun. 27, 1995
5426375 Method and apparatus for optimizing high speed performance and hot carrier lifetime in a MOS integrated circuit Jun. 20, 1995
5420522 Method and system for fault testing integrated circuits using a light source May. 30, 1995
5404109 Method and apparatus for testing circuits containing active devices Apr. 4, 1995
5394101 Method for detecting mobile ions in a semiconductor device Feb. 28, 1995
5381105 Method of testing a semiconductor device having a first circuit electrically isolated from a second circuit Jan. 10, 1995
5325054 Method and system for screening reliability of semiconductor circuits Jun. 28, 1994
5309085 Measuring circuit with a biosensor utilizing ion sensitive field effect transistors May. 3, 1994
5304925 Semiconductor device Apr. 19, 1994
5287313 Method of testing data-holding capability of a semiconductor memory device Feb. 15, 1994
5285119 Semiconductor integrated tri-state circuitry with test means Feb. 8, 1994
5233637 System for generating an analog regulating voltage Aug. 3, 1993
5166608 Arrangement for high speed testing of field-effect transistors and memory cells employing the same Nov. 24, 1992
5136280 Switch status indicator and self tester Aug. 4, 1992
4942357 Method of testing a charge-coupled device Jul. 17, 1990
4795964 Method and apparatus for measuring the capacitance of complementary field-effect transistor devices Jan. 3, 1989
4739388 Integrated circuit structure for a quality check of a semiconductor substrate wafer Apr. 19, 1988
4701701 Apparatus for measuring characteristics of circuit elements Oct. 20, 1987
4686462 Fast recovery power supply Aug. 11, 1987
4658156 Voltage detection circuit for detecting input voltage larger in absolute value than power supply voltage Apr. 14, 1987
4607219 Method of inspecting semiconductor non-volatile memory devices Aug. 19, 1986
4542340 Testing method and structure for leakage current characterization in the manufacture of dynamic RAM cells Sep. 17, 1985
4453127 Determination of true electrical channel length of surface FET Jun. 5, 1984
4140967 Merged array PLA device, circuit, fabrication method and testing technique Feb. 20, 1979

1 2 3 4 5 6 7 8

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