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Class Information
Number: 324/769
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device > With barrier layer > Field effect transistor
Description: Subject matter wherein a logic circuit includes one or more unipolar transistors in which current carriers are injected at a source terminal and pass to a drain terminal through a channel of semiconductor material whose conductivity depends largely on an electrical field applied to the semiconductor from a control electrode (gate).










Patents under this class:
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Patent Number Title Of Patent Date Issued
6301168 CMOS cell and circuit design for improved IDDQ testing Oct. 9, 2001
6297661 Semiconductor switch fault detection Oct. 2, 2001
6274397 Method to preserve the testing chip for package's quality Aug. 14, 2001
6275059 Method for testing and diagnosing MOS transistors Aug. 14, 2001
6272655 Method of reducing test time for NVM cell-based FPGA Aug. 7, 2001
6258437 Test structure and methodology for characterizing etching in an integrated circuit fabrication process Jul. 10, 2001
6242757 Capacitor circuit structure for determining overlay error Jun. 5, 2001
6242937 Hot carrier measuring circuit Jun. 5, 2001
6239609 Reduced voltage quiescent current test methodology for integrated circuits May. 29, 2001
6236225 Method of testing the gate oxide in integrated DMOS power transistors and integrated device comprising a DMOS power transistor May. 22, 2001
6211693 Testability circuit for cascode circuits used for high voltage interface Apr. 3, 2001
6211689 Method for testing semiconductor device and semiconductor device with transistor circuit for marking Apr. 3, 2001
6204682 TFT and reliability evaluation method thereof Mar. 20, 2001
6198301 Method for determining the hot carrier lifetime of a transistor Mar. 6, 2001
6188233 Method for determining proximity effects on electrical characteristics of semiconductor devices Feb. 13, 2001
6188234 Method of determining dielectric time-to-breakdown Feb. 13, 2001
6181153 Method and system for detecting faults in a flip-chip package Jan. 30, 2001
6175245 CMOS SOI contact integrity test method Jan. 16, 2001
6173235 Method of estimating lifetime of floating SOI-MOSFET Jan. 9, 2001
6169415 Characteristic evaluation apparatus for insulated gate type transistors Jan. 2, 2001
6166558 Method for measuring gate length and drain/source gate overlap Dec. 26, 2000
6151561 Method of estimating lifetime of floating SOI-MOSFET Nov. 21, 2000
6148273 Method of estimating lifetime of floating SOI-MOSFET Nov. 14, 2000
6144040 Van der pauw structure to measure the resistivity of a doped area under diffusion areas and gate structures Nov. 7, 2000
6133746 Method for determining a reliable oxide thickness Oct. 17, 2000
6133582 Methods and apparatuses for binning partially completed integrated circuits based upon test results Oct. 17, 2000
6127830 Process and circuitry for monitoring a control circuit Oct. 3, 2000
6127836 Electronic test apparatus Oct. 3, 2000
6111423 Method and apparatus for measuring pinch-off voltage of a field effect transistor Aug. 29, 2000
6073082 Method of estimating lifetime of floating SOI-MOSFET Jun. 6, 2000
6069485 C-V method to extract lateral channel doping profiles of MOSFETs May. 30, 2000
6060900 Method for measuring current density in a semiconductor device with kink effect May. 9, 2000
6057701 Constant resistance deep level transient spectroscopy (CR-DLTS) system and method, averging methods for DLTS, and apparatus for carrying out the methods May. 2, 2000
6051984 Wafer-level method of hot-carrier reliability test for semiconductor wafers Apr. 18, 2000
6051986 Method of testing a transistor Apr. 18, 2000
6047247 Method of estimating degradation with consideration of hot carrier effects Apr. 4, 2000
6046601 Method for measuring the kink effect of a semiconductor device Apr. 4, 2000
6025734 Method of monitoring ion contamination in integrated circuits Feb. 15, 2000
6020753 TFT and reliability evaluation method thereof Feb. 1, 2000
6016062 Process related damage monitor (predator)--systematic variation of antenna parameters to determine charge damage Jan. 18, 2000
6014034 Method for testing semiconductor thin gate oxide Jan. 11, 2000
6005409 Detection of process-induced damage on transistors in real time Dec. 21, 1999
5999011 Method of fast testing of hot carrier effects Dec. 7, 1999
5990699 Method for detecting opens through time variant current measurement Nov. 23, 1999
5986283 Test structure for determining how lithographic patterning of a gate conductor affects transistor properties Nov. 16, 1999
5966024 Sensitive method of evaluating process induced damage in MOSFETs using a differential amplifier operational principle Oct. 12, 1999
5962867 Abatement of electron beam charging distortion during dimensional measurements of integrated circuit patterns with scanning electron microscopy by the utilization of specially designed test st Oct. 5, 1999
5959309 Sensor to monitor plasma induced charging damage Sep. 28, 1999
5959464 Loss-less load current sensing driver and method therefor Sep. 28, 1999
5956563 Method for reducing a transient thermal mismatch Sep. 21, 1999

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