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Class Information
Number: 324/769
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device > With barrier layer > Field effect transistor
Description: Subject matter wherein a logic circuit includes one or more unipolar transistors in which current carriers are injected at a source terminal and pass to a drain terminal through a channel of semiconductor material whose conductivity depends largely on an electrical field applied to the semiconductor from a control electrode (gate).

Patents under this class:
1 2 3 4 5 6 7 8

Patent Number Title Of Patent Date Issued
6636068 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer Oct. 21, 2003
6617873 Semiconductor integrated circuit and testing method thereof Sep. 9, 2003
6614051 Device for monitoring substrate charging and method of fabricating same Sep. 2, 2003
6603328 Semiconductor integrated circuit Aug. 5, 2003
6573744 S-parameter microscopy for semiconductor devices Jun. 3, 2003
6563333 Dynamic register with IDDQ testing capability May. 13, 2003
6559672 Characteristic evaluation apparatus for insulated gate type transistors May. 6, 2003
6556025 DC/low frequency sub-atto signal level measurement circuit Apr. 29, 2003
6549029 Circuit and method for measuring capacitance Apr. 15, 2003
6541285 Method of estimating lifetime of semiconductor device, and method of reliability simulation Apr. 1, 2003
6541993 Transistor device testing employing virtual device fixturing Apr. 1, 2003
6535015 Device and method for testing performance of silicon structures Mar. 18, 2003
6529031 Integrated circuit configuration for testing transistors, and a semiconductor wafer having such a circuit configuration Mar. 4, 2003
6507076 Microwave transistor subjected to burn-in testing Jan. 14, 2003
6496028 Method and apparatus for testing electronic devices Dec. 17, 2002
6496959 Method and system for estimating plasma damage to semiconductor device for layout design Dec. 17, 2002
6492830 Method and circuit for measuring charge dump of an individual transistor in an SOI device Dec. 10, 2002
6489799 Integrated circuit device having process parameter measuring circuit Dec. 3, 2002
6489800 Method of testing an integrated circuit Dec. 3, 2002
6487687 Voltage level shifter with testable cascode devices Nov. 26, 2002
6486692 Method of positive mobile iron contamination (PMIC) detection and apparatus of performing the same Nov. 26, 2002
6486682 Determination of dielectric constants of thin dielectric materials in a MOS (metal oxide semiconductor) stack Nov. 26, 2002
6476632 Ring oscillator design for MOSFET device reliability investigations and its use for in-line monitoring Nov. 5, 2002
6476633 Semiconductor integrated circuit and testing method thereof Nov. 5, 2002
6472233 MOSFET test structure for capacitance-voltage measurements Oct. 29, 2002
6469538 Current monitoring and latchup detection circuit and method of operation Oct. 22, 2002
6456105 Method for determining transistor gate oxide thickness Sep. 24, 2002
6456104 Method and structure for in-line monitoring of negative bias temperature instability in field effect transistors Sep. 24, 2002
6452415 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer Sep. 17, 2002
6420894 Implementation of iscan cell for self-resetting dynamic circuit Jul. 16, 2002
6414511 Arrangement for transient-current testing of a digital electronic CMOS circuit Jul. 2, 2002
6411117 Dynamic register with IDDQ testing capability Jun. 25, 2002
6407573 Device for evaluating characteristic of insulated gate transistor Jun. 18, 2002
6404222 Chip capacitance measurement circuit Jun. 11, 2002
6396298 Active feedback pulsed measurement method May. 28, 2002
6396075 Transient fuse for change-induced damage detection May. 28, 2002
6391668 Method of determining a trap density of a semiconductor/oxide interface by a contactless charge technique May. 21, 2002
6380506 Use of hot carrier effects to trim analog transistor pair Apr. 30, 2002
6380557 Test chip for evaluating fillers of molding material with dams formed on a semiconductor substrate to define slits for capturing the fillers Apr. 30, 2002
6377067 Testing method for buried strap and deep trench leakage current Apr. 23, 2002
6373274 Characteristic evaluation apparatus for insulated gate type transistors Apr. 16, 2002
6365426 Method of determining the impact of plasma-charging damage on yield and reliability in submicron integrated circuits Apr. 2, 2002
6359461 Test structure for determining the properties of densely packed transistors Mar. 19, 2002
6351135 TDDB test pattern and method for testing TDDB of MOS capacitor dielectric Feb. 26, 2002
6346820 Characteristics evaluation circuit for semiconductor wafer and its evaluation method Feb. 12, 2002
6339339 TFT and reliability evaluation method thereof Jan. 15, 2002
6313658 Device and method for isolating a short-circuited integrated circuit (IC) from other IC's on a semiconductor wafer Nov. 6, 2001
6310487 Semiconductor integrated circuit and testing method thereof Oct. 30, 2001
6304094 On-chip substrate regular test mode Oct. 16, 2001
6300145 Ion implantation and laser anneal to create n-doped structures in silicon Oct. 9, 2001

1 2 3 4 5 6 7 8

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