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Class Information
Number: 324/769
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device > With barrier layer > Field effect transistor
Description: Subject matter wherein a logic circuit includes one or more unipolar transistors in which current carriers are injected at a source terminal and pass to a drain terminal through a channel of semiconductor material whose conductivity depends largely on an electrical field applied to the semiconductor from a control electrode (gate).










Patents under this class:
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Patent Number Title Of Patent Date Issued
7782076 Method and apparatus for statistical CMOS device characterization Aug. 24, 2010
7768290 Circuit and apparatus for detecting electric current Aug. 3, 2010
7764080 Methods of operating an electronic circuit for measurement of transistor variability and the like Jul. 27, 2010
7759963 Method for determining threshold voltage variation using a device array Jul. 20, 2010
7755379 Configurations and method for carrying out wafer level unclamped inductive switching (UIS) tests Jul. 13, 2010
7750659 Voltage detecting circuit and semiconductor device including the same Jul. 6, 2010
7750400 Integrated circuit modeling, design, and fabrication based on degradation mechanisms Jul. 6, 2010
7749777 Method of applying electrical stress to low-temperature poly-crystalline thin film transistor Jul. 6, 2010
7737717 Current-voltage-based method for evaluating thin dielectrics based on interface traps Jun. 15, 2010
7728601 Method of inspecting electronic circuit Jun. 1, 2010
7723995 Test switching circuit for a high speed data interface May. 25, 2010
7692442 Apparatus for detecting a current and temperature for an integrated circuit Apr. 6, 2010
7689377 Technique for aging induced performance drift compensation in an integrated circuit Mar. 30, 2010
7671621 Closed loop feedback control of integrated circuits Mar. 2, 2010
7656183 Method to extract gate to source/drain and overlap capacitances and test key structure therefor Feb. 2, 2010
7649373 Semiconductor integrated circuit with voltage drop detector Jan. 19, 2010
7622942 Method and apparatus for measuring device mismatches Nov. 24, 2009
7619435 Method and system for derivation of breakdown voltage for MOS integrated circuit devices Nov. 17, 2009
7616014 Pulsed I-V measurement method and apparatus Nov. 10, 2009
7616022 Circuit and method for detecting skew of transistors in a semiconductor device Nov. 10, 2009
7605598 Undercurrent sense arrangement and method Oct. 20, 2009
7602206 Method of forming a transistor diagnostic circuit Oct. 13, 2009
7598764 Transistor arrangement Oct. 6, 2009
7595654 Methods and apparatus for inline variability measurement of integrated circuit components Sep. 29, 2009
7595649 Method to accurately estimate the source and drain resistance of a MOSFET Sep. 29, 2009
7592876 Leakage oscillator based aging monitor Sep. 22, 2009
7592797 Semiconductor device and electronics device Sep. 22, 2009
7589550 Semiconductor device test system having reduced current leakage Sep. 15, 2009
7589551 On-wafer AC stress test circuit Sep. 15, 2009
7587298 Diagnostic method for root-cause analysis of FET performance variation Sep. 8, 2009
7586322 Test structure and method for measuring mismatch and well proximity effects Sep. 8, 2009
7586315 System and method for testing voltage endurance Sep. 8, 2009
7586314 Multi-pin CV measurement Sep. 8, 2009
7579859 Method for determining time dependent dielectric breakdown Aug. 25, 2009
7573285 Multiple point gate oxide integrity test method and system for the manufacture of semiconductor integrated circuits Aug. 11, 2009
7567091 Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer Jul. 28, 2009
7560951 Characterization array circuit Jul. 14, 2009
7557599 Apparatus and method for determining a current through a power semiconductor component Jul. 7, 2009
7550990 Method and apparatus for testing integrated circuits for susceptibility to latch-up Jun. 23, 2009
7548067 Methods for measuring capacitance Jun. 16, 2009
7538538 Method of using a four terminal hybrid silicon/organic field effect sensor device May. 26, 2009
7535246 Computing the characteristics of a field-effect-transistor (FET) May. 19, 2009
7532078 Scannable virtual rail method and ring oscillator circuit for measuring variations in device characteristics May. 12, 2009
7525333 Current sense circuit Apr. 28, 2009
7521955 Method and system for device characterization with array and decoder Apr. 21, 2009
7516037 Method evaluating threshold level of a data cell in a memory device Apr. 7, 2009
7511527 Methods and apparatus to test power transistors Mar. 31, 2009
7512915 Embedded test circuit for testing integrated circuits at the die level Mar. 31, 2009
7504849 On failure detecting apparatus of power supply circuit Mar. 17, 2009
7506282 Apparatus and methods for predicting and/or calibrating memory yields Mar. 17, 2009

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