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Class Information
Number: 324/769
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device > With barrier layer > Field effect transistor
Description: Subject matter wherein a logic circuit includes one or more unipolar transistors in which current carriers are injected at a source terminal and pass to a drain terminal through a channel of semiconductor material whose conductivity depends largely on an electrical field applied to the semiconductor from a control electrode (gate).
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7619435 |
Method and system for derivation of breakdown voltage for MOS integrated circuit devices |
Nov. 17, 2009 |
| 7616022 |
Circuit and method for detecting skew of transistors in a semiconductor device |
Nov. 10, 2009 |
| 7616014 |
Pulsed I-V measurement method and apparatus |
Nov. 10, 2009 |
| 7605598 |
Undercurrent sense arrangement and method |
Oct. 20, 2009 |
| 7602206 |
Method of forming a transistor diagnostic circuit |
Oct. 13, 2009 |
| 7598764 |
Transistor arrangement |
Oct. 6, 2009 |
| 7595654 |
Methods and apparatus for inline variability measurement of integrated circuit components |
Sep. 29, 2009 |
| 7595649 |
Method to accurately estimate the source and drain resistance of a MOSFET |
Sep. 29, 2009 |
| 7592797 |
Semiconductor device and electronics device |
Sep. 22, 2009 |
| 7592876 |
Leakage oscillator based aging monitor |
Sep. 22, 2009 |
| 7589551 |
On-wafer AC stress test circuit |
Sep. 15, 2009 |
| 7589550 |
Semiconductor device test system having reduced current leakage |
Sep. 15, 2009 |
| 7587298 |
Diagnostic method for root-cause analysis of FET performance variation |
Sep. 8, 2009 |
| 7586322 |
Test structure and method for measuring mismatch and well proximity effects |
Sep. 8, 2009 |
| 7586314 |
Multi-pin CV measurement |
Sep. 8, 2009 |
| 7586315 |
System and method for testing voltage endurance |
Sep. 8, 2009 |
| 7579859 |
Method for determining time dependent dielectric breakdown |
Aug. 25, 2009 |
| 7573285 |
Multiple point gate oxide integrity test method and system for the manufacture of semiconductor integrated circuits |
Aug. 11, 2009 |
| 7567091 |
Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
Jul. 28, 2009 |
| 7560951 |
Characterization array circuit |
Jul. 14, 2009 |
| 7557599 |
Apparatus and method for determining a current through a power semiconductor component |
Jul. 7, 2009 |
| 7550990 |
Method and apparatus for testing integrated circuits for susceptibility to latch-up |
Jun. 23, 2009 |
| 7548067 |
Methods for measuring capacitance |
Jun. 16, 2009 |
| 7538538 |
Method of using a four terminal hybrid silicon/organic field effect sensor device |
May. 26, 2009 |
| 7535246 |
Computing the characteristics of a field-effect-transistor (FET) |
May. 19, 2009 |
| 7532078 |
Scannable virtual rail method and ring oscillator circuit for measuring variations in device characteristics |
May. 12, 2009 |
| 7525333 |
Current sense circuit |
Apr. 28, 2009 |
| 7521955 |
Method and system for device characterization with array and decoder |
Apr. 21, 2009 |
| 7516037 |
Method evaluating threshold level of a data cell in a memory device |
Apr. 7, 2009 |
| 7511527 |
Methods and apparatus to test power transistors |
Mar. 31, 2009 |
| 7512915 |
Embedded test circuit for testing integrated circuits at the die level |
Mar. 31, 2009 |
| 7506282 |
Apparatus and methods for predicting and/or calibrating memory yields |
Mar. 17, 2009 |
| 7504849 |
On failure detecting apparatus of power supply circuit |
Mar. 17, 2009 |
| 7501848 |
Method and apparatus for measuring leakage current |
Mar. 10, 2009 |
| 7495456 |
System and method of determining pulse properties of semiconductor device |
Feb. 24, 2009 |
| 7489157 |
System and method for automatically measuring carrier density distribution by using capacitance-voltage characteristics of a MOS transistor device |
Feb. 10, 2009 |
| 7486086 |
Method for measuring intrinsic capacitance of a metal oxide semiconductor (MOS) device |
Feb. 3, 2009 |
| 7486099 |
System and method for testing power transistors |
Feb. 3, 2009 |
| 7480598 |
Characteristic evaluation apparatus for insulated gate type transistors |
Jan. 20, 2009 |
| 7471102 |
Measuring threshold voltage of transistors in a circuit |
Dec. 30, 2008 |
| 7439755 |
Electronic circuit for measurement of transistor variability and the like |
Oct. 21, 2008 |
| 7436169 |
Mechanical stress characterization in semiconductor device |
Oct. 14, 2008 |
| 7436200 |
Apparatus for testing a power supply |
Oct. 14, 2008 |
| 7429869 |
Method for measuring FET characteristics |
Sep. 30, 2008 |
| 7423446 |
Characterization array and method for determining threshold voltage variation |
Sep. 9, 2008 |
| 7408372 |
Method and apparatus for measuring device mismatches |
Aug. 5, 2008 |
| 7405090 |
Method of measuring an effective channel length and an overlap length in a metal-oxide semiconductor field effect transistor |
Jul. 29, 2008 |
| 7403031 |
Measurement apparatus for FET characteristics |
Jul. 22, 2008 |
| 7397265 |
MOS transistor characteristic detection apparatus and CMOS circuit characteristic automatic adjustment apparatus |
Jul. 8, 2008 |
| 7397264 |
Method for testing power MOSFET devices |
Jul. 8, 2008 |
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