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Class Information
Number: 324/768
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device > With barrier layer > Bipolar transistor
Description: Subject matter including a semiconductor device of the type having at least three electrodes (emitter, base, and collector), two potential barriers and having a controlled current flow of both majority and minority carriers (i.e., holes and electrons).
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7521955 |
Method and system for device characterization with array and decoder |
Apr. 21, 2009 |
| 7508192 |
Circuit with a capacitive element with method for testing the same |
Mar. 24, 2009 |
| 7486099 |
System and method for testing power transistors |
Feb. 3, 2009 |
| 7436169 |
Mechanical stress characterization in semiconductor device |
Oct. 14, 2008 |
| 7345500 |
Method and system for device characterization with array and decoder |
Mar. 18, 2008 |
| 7332924 |
Embedded test circuitry and a method for testing a semiconductor device for breakdown, wearout or failure |
Feb. 19, 2008 |
| 7327157 |
Switch device |
Feb. 5, 2008 |
| 7274206 |
Output power detection circuit |
Sep. 25, 2007 |
| 7193427 |
Method and apparatus for measuring relative, within-die leakage current and/or providing a temperature variation profile using a leakage inverter and ring oscillator |
Mar. 20, 2007 |
| 7161776 |
Method for monitoring a power output stage |
Jan. 9, 2007 |
| 7138804 |
Automatic transmission line pulse system |
Nov. 21, 2006 |
| 7005881 |
Current sensing for power MOSFET operable in linear and saturated regions |
Feb. 28, 2006 |
| 6903559 |
Method and apparatus to determine integrated circuit temperature |
Jun. 7, 2005 |
| 6888469 |
Method and apparatus for estimating semiconductor junction temperature |
May. 3, 2005 |
| 6836125 |
Method and a device for testing a power module |
Dec. 28, 2004 |
| 6690178 |
On-board microelectromechanical system (MEMS) sensing device for power semiconductors |
Feb. 10, 2004 |
| 6656809 |
Method to fabricate SiGe HBTs with controlled current gain and improved breakdown voltage characteristics |
Dec. 2, 2003 |
| 6650137 |
Circuit for monitoring an open collector output circuit with a significant offset |
Nov. 18, 2003 |
| 6541993 |
Transistor device testing employing virtual device fixturing |
Apr. 1, 2003 |
| 6529031 |
Integrated circuit configuration for testing transistors, and a semiconductor wafer having such a circuit configuration |
Mar. 4, 2003 |
| 6433573 |
Method and apparatus for measuring parameters of an electronic device |
Aug. 13, 2002 |
| 6359461 |
Test structure for determining the properties of densely packed transistors |
Mar. 19, 2002 |
| 6300145 |
Ion implantation and laser anneal to create n-doped structures in silicon |
Oct. 9, 2001 |
| 6292011 |
Method for measuring collector and emitter breakdown voltage of bipolar transistor |
Sep. 18, 2001 |
| 6259268 |
Voltage stress testable embedded dual capacitor structure and process for its testing |
Jul. 10, 2001 |
| 6258437 |
Test structure and methodology for characterizing etching in an integrated circuit fabrication process |
Jul. 10, 2001 |
| 6242937 |
Hot carrier measuring circuit |
Jun. 5, 2001 |
| 6222374 |
Wiring harness diagnostic system |
Apr. 24, 2001 |
| 6188235 |
System and method for verifying proper connection of an integrated circuit to a circuit board |
Feb. 13, 2001 |
| 6181142 |
Nonlinear current mirror for loop-gain control |
Jan. 30, 2001 |
| 6127830 |
Process and circuitry for monitoring a control circuit |
Oct. 3, 2000 |
| 6051985 |
Horizontal circuit drive analyzer and method of analyzing the horizontal circuit drive of a video display |
Apr. 18, 2000 |
| 6051984 |
Wafer-level method of hot-carrier reliability test for semiconductor wafers |
Apr. 18, 2000 |
| 5956563 |
Method for reducing a transient thermal mismatch |
Sep. 21, 1999 |
| 5942910 |
Method and circuit for providing accurate voltage sensing for a power transistor, or the like |
Aug. 24, 1999 |
| 5936422 |
Method for testing and matching electrical components |
Aug. 10, 1999 |
| 5917197 |
Integrated multi-layer test pads |
Jun. 29, 1999 |
| 5877033 |
System for detection of unsoldered components |
Mar. 2, 1999 |
| 5736863 |
Abatement of electron beam charging distortion during dimensional measurements of integrated circuit patterns with scanning electron microscopy by the utilization of specially designed test st |
Apr. 7, 1998 |
| 5694051 |
Inspecting transistors in an inverter circuit |
Dec. 2, 1997 |
| 5629633 |
Method for predicting an output current of a transistor |
May. 13, 1997 |
| 5625295 |
Bipolar transistor circuit capable of high precision measurement of current amplification factor |
Apr. 29, 1997 |
| 5615377 |
Method of simulating hot carrier deterioration of a P-MOS transistor |
Mar. 25, 1997 |
| 5600578 |
Test method for predicting hot-carrier induced leakage over time in short-channel IGFETs and products designed in accordance with test results |
Feb. 4, 1997 |
| 5598100 |
Device for and method of evaluating semiconductor integrated circuit |
Jan. 28, 1997 |
| 5510725 |
Method and apparatus for testing a power bridge for an electric vehicle propulsion system |
Apr. 23, 1996 |
| 5508626 |
Circuit for detecting the position of several bipolar contactors and application for a thrust reverser of a turbojet engine |
Apr. 16, 1996 |
| 5508632 |
Method of simulating hot carrier deterioration of an MOS transistor |
Apr. 16, 1996 |
| 5504431 |
Device for and method of evaluating semiconductor integrated circuit |
Apr. 2, 1996 |
| 5497095 |
Apparatus for inspecting electric component for inverter circuit |
Mar. 5, 1996 |
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