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Browse by Category: Main > Electrical & Energy
Class Information
Number: 324/767
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device > With barrier layer > Diode
Description: Subject matter including a two electrode (anode and cathode), single junction (PN) semiconductor device used as an active switching element responsive to respective input logic signals to perform the logic function.










Patents under this class:
1 2 3 4 5

Patent Number Title Of Patent Date Issued
7733114 Test handler including gripper-type test contactor Jun. 8, 2010
7684960 Methods and systems for semiconductor diode junction protection Mar. 23, 2010
7679381 Method and apparatus for nondestructively evaluating light-emitting materials Mar. 16, 2010
7671620 Testing system for solar cells Mar. 2, 2010
7663394 Start signal detector circuit Feb. 16, 2010
7652480 Methods and systems for testing a functional status of a light unit Jan. 26, 2010
7592825 Methods and systems for semiconductor diode junction screening and lifetime estimation Sep. 22, 2009
7579858 Semiconductor device and inspection method thereof Aug. 25, 2009
7564882 Integrated circuit having on-chip laser burn-in circuit Jul. 21, 2009
7554100 Fabricating method of semiconductor light-emitting device Jun. 30, 2009
7545111 Testing inverter driven electric motor shut-off path Jun. 9, 2009
7505496 Systems and methods for real-time compensation for non-linearity in optical sources for analog signal transmission Mar. 17, 2009
7501848 Method and apparatus for measuring leakage current Mar. 10, 2009
7474115 Organic electronic device display defect detection Jan. 6, 2009
7463050 System and method for controlling temperature during burn-in Dec. 9, 2008
7449897 Current fault detection for light emitters Nov. 11, 2008
7449905 Automated characterization system for laser chip on a submount Nov. 11, 2008
7439753 Inverter test device and a method thereof Oct. 21, 2008
7414386 Methods for testing optical transmitter components Aug. 19, 2008
7382148 System and method for testing an LED and a connector thereof Jun. 3, 2008
7298167 Power supply system Nov. 20, 2007
7205784 Probe for combined signals Apr. 17, 2007
7145353 Double side probing of semiconductor devices Dec. 5, 2006
7111218 Apparatus with self-test circuit Sep. 19, 2006
7053649 Image display device and method of testing the same May. 30, 2006
7049833 Method for optimizing the accuracy of an electronic circuit May. 23, 2006
7030642 Quick attachment fixture and power card for diode-based light devices Apr. 18, 2006
7023232 Image display device, drive circuit device and defect detection method of light-emitting diode Apr. 4, 2006
7019548 Laser production and product qualification via accelerated life testing based on statistical modeling Mar. 28, 2006
6977517 Laser production and product qualification via accelerated life testing based on statistical modeling Dec. 20, 2005
6967487 Distributed diode fault check Nov. 22, 2005
6956226 Light image sensor test of opto-electronics for in-circuit test Oct. 18, 2005
6946858 Method and apparatus for measuring photoelectric conversion device, and process and apparatus for producing photoelectric conversion device Sep. 20, 2005
6943567 Method for detecting the operability of a number of identical zener diodes that are connected in parallel to one another and to a solenoid Sep. 13, 2005
6897662 Method and apparatus for optimizing the accuracy of an electronic circuit May. 24, 2005
6888357 Electric circuit arrangement and method for checking the intactness of a photodiode array May. 3, 2005
6888469 Method and apparatus for estimating semiconductor junction temperature May. 3, 2005
6873172 Automated laser diode test system Mar. 29, 2005
6856129 Current probe device having an integrated amplifier Feb. 15, 2005
6797936 Automated laser diode testing Sep. 28, 2004
6775000 Method and apparatus for wafer-level testing of semiconductor laser Aug. 10, 2004
6771091 Method and system for elevated temperature measurement with probes designed for room temperature measurement Aug. 3, 2004
6680621 Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current Jan. 20, 2004
6670820 Method and apparatus for evaluating electroluminescence properties of semiconductor materials and devices Dec. 30, 2003
6639421 Measuring apparatus and method for measuring characteristic of solar cell Oct. 28, 2003
6621288 Timing margin alteration via the insulator of a SOI die Sep. 16, 2003
6597195 Method of and cassette structure for burn-in and life testing of multiple LEDs and the like Jul. 22, 2003
6563326 Bus-driveable sensor apparatus with direction-dependent current/voltage characteristic curve and method for testing the apparatus May. 13, 2003
6522158 Non-contact mobile charge measurement with leakage band-bending and dipole correction Feb. 18, 2003
6496013 Device for testing circuit boards Dec. 17, 2002

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