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Class Information
Number: 324/767
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device > With barrier layer > Diode
Description: Subject matter including a two electrode (anode and cathode), single junction (PN) semiconductor device used as an active switching element responsive to respective input logic signals to perform the logic function.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7592825 |
Methods and systems for semiconductor diode junction screening and lifetime estimation |
Sep. 22, 2009 |
| 7579858 |
Semiconductor device and inspection method thereof |
Aug. 25, 2009 |
| 7564882 |
Integrated circuit having on-chip laser burn-in circuit |
Jul. 21, 2009 |
| 7554100 |
Fabricating method of semiconductor light-emitting device |
Jun. 30, 2009 |
| 7545111 |
Testing inverter driven electric motor shut-off path |
Jun. 9, 2009 |
| 7505496 |
Systems and methods for real-time compensation for non-linearity in optical sources for analog signal transmission |
Mar. 17, 2009 |
| 7501848 |
Method and apparatus for measuring leakage current |
Mar. 10, 2009 |
| 7474115 |
Organic electronic device display defect detection |
Jan. 6, 2009 |
| 7463050 |
System and method for controlling temperature during burn-in |
Dec. 9, 2008 |
| 7449905 |
Automated characterization system for laser chip on a submount |
Nov. 11, 2008 |
| 7449897 |
Current fault detection for light emitters |
Nov. 11, 2008 |
| 7439753 |
Inverter test device and a method thereof |
Oct. 21, 2008 |
| 7414386 |
Methods for testing optical transmitter components |
Aug. 19, 2008 |
| 7382148 |
System and method for testing an LED and a connector thereof |
Jun. 3, 2008 |
| 7298167 |
Power supply system |
Nov. 20, 2007 |
| 7205784 |
Probe for combined signals |
Apr. 17, 2007 |
| 7145353 |
Double side probing of semiconductor devices |
Dec. 5, 2006 |
| 7111218 |
Apparatus with self-test circuit |
Sep. 19, 2006 |
| 7053649 |
Image display device and method of testing the same |
May. 30, 2006 |
| 7049833 |
Method for optimizing the accuracy of an electronic circuit |
May. 23, 2006 |
| 7030642 |
Quick attachment fixture and power card for diode-based light devices |
Apr. 18, 2006 |
| 7023232 |
Image display device, drive circuit device and defect detection method of light-emitting diode |
Apr. 4, 2006 |
| 7019548 |
Laser production and product qualification via accelerated life testing based on statistical modeling |
Mar. 28, 2006 |
| 6977517 |
Laser production and product qualification via accelerated life testing based on statistical modeling |
Dec. 20, 2005 |
| 6967487 |
Distributed diode fault check |
Nov. 22, 2005 |
| 6956226 |
Light image sensor test of opto-electronics for in-circuit test |
Oct. 18, 2005 |
| 6946858 |
Method and apparatus for measuring photoelectric conversion device, and process and apparatus for producing photoelectric conversion device |
Sep. 20, 2005 |
| 6943567 |
Method for detecting the operability of a number of identical zener diodes that are connected in parallel to one another and to a solenoid |
Sep. 13, 2005 |
| 6897662 |
Method and apparatus for optimizing the accuracy of an electronic circuit |
May. 24, 2005 |
| 6888469 |
Method and apparatus for estimating semiconductor junction temperature |
May. 3, 2005 |
| 6888357 |
Electric circuit arrangement and method for checking the intactness of a photodiode array |
May. 3, 2005 |
| 6873172 |
Automated laser diode test system |
Mar. 29, 2005 |
| 6856129 |
Current probe device having an integrated amplifier |
Feb. 15, 2005 |
| 6797936 |
Automated laser diode testing |
Sep. 28, 2004 |
| 6775000 |
Method and apparatus for wafer-level testing of semiconductor laser |
Aug. 10, 2004 |
| 6771091 |
Method and system for elevated temperature measurement with probes designed for room temperature measurement |
Aug. 3, 2004 |
| 6680621 |
Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current |
Jan. 20, 2004 |
| 6670820 |
Method and apparatus for evaluating electroluminescence properties of semiconductor materials and devices |
Dec. 30, 2003 |
| 6639421 |
Measuring apparatus and method for measuring characteristic of solar cell |
Oct. 28, 2003 |
| 6621288 |
Timing margin alteration via the insulator of a SOI die |
Sep. 16, 2003 |
| 6597195 |
Method of and cassette structure for burn-in and life testing of multiple LEDs and the like |
Jul. 22, 2003 |
| 6563326 |
Bus-driveable sensor apparatus with direction-dependent current/voltage characteristic curve and method for testing the apparatus |
May. 13, 2003 |
| 6522158 |
Non-contact mobile charge measurement with leakage band-bending and dipole correction |
Feb. 18, 2003 |
| 6496013 |
Device for testing circuit boards |
Dec. 17, 2002 |
| 6489798 |
Method and apparatus for testing image sensing circuit arrays |
Dec. 3, 2002 |
| 6448805 |
Method and apparatus for wafer-level testing of semiconductor lasers |
Sep. 10, 2002 |
| 6437592 |
Characterization of a semiconductor/dielectric interface by photocurrent measurements |
Aug. 20, 2002 |
| 6414511 |
Arrangement for transient-current testing of a digital electronic CMOS circuit |
Jul. 2, 2002 |
| 6342791 |
Diode defect detecting device |
Jan. 29, 2002 |
| 6335630 |
Contactless method for measuring total charge of an oxide layer on a semiconductor wafer using corona charge |
Jan. 1, 2002 |
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