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Class Information
Number: 324/766
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device > With barrier layer
Description: Subject matter having a region in which the mobile-carrier charge density is insufficient to neutralize the net fixed charge density of donors and acceptors.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7579859 |
Method for determining time dependent dielectric breakdown |
Aug. 25, 2009 |
| 7521954 |
Method for determining a minority carrier diffusion length using surface photo voltage measurements |
Apr. 21, 2009 |
| 7514940 |
System and method for determining effective channel dimensions of metal oxide semiconductor devices |
Apr. 7, 2009 |
| 7339393 |
Gate drive circuit for an insulated gate power transistor |
Mar. 4, 2008 |
| 7282941 |
Method of measuring semiconductor wafers with an oxide enhanced probe |
Oct. 16, 2007 |
| 7268575 |
Method of NBTI prediction |
Sep. 11, 2007 |
| 7265571 |
Method and device for determining a characteristic of a semiconductor sample |
Sep. 4, 2007 |
| 7230812 |
Predictive applications for devices with thin dielectric regions |
Jun. 12, 2007 |
| 7106090 |
Optical semiconductor device with multiple quantum well structure |
Sep. 12, 2006 |
| 7084661 |
Scanning kelvin microprobe system and process for analyzing a surface |
Aug. 1, 2006 |
| 7043959 |
Method for calibrating semiconductor test instrument |
May. 16, 2006 |
| 7026831 |
Method and device for measuring the diffusion length of minority carriers in a semiconductor sample |
Apr. 11, 2006 |
| 7026837 |
Method and apparatus for determining the dielectric constant of a low permittivity dielectric on a semiconductor wafer |
Apr. 11, 2006 |
| 6977512 |
Method and apparatus for characterizing shared contacts in high-density SRAM cell design |
Dec. 20, 2005 |
| 6967499 |
Dual ramp rate dielectric breakdown testing methodology |
Nov. 22, 2005 |
| 6963215 |
Operation of semiconductor devices subject to hot carrier injection |
Nov. 8, 2005 |
| 6960926 |
Method and apparatus for characterizing a circuit with multiple inputs |
Nov. 1, 2005 |
| 6894517 |
Method for monitoring oxide quality |
May. 17, 2005 |
| 6888469 |
Method and apparatus for estimating semiconductor junction temperature |
May. 3, 2005 |
| 6856160 |
Maximum VCC calculation method for hot carrier qualification |
Feb. 15, 2005 |
| 6836139 |
Method and apparatus for determining defect and impurity concentration in semiconducting material of a semiconductor wafer |
Dec. 28, 2004 |
| 6822473 |
Determination of permeability of layer material within interconnect |
Nov. 23, 2004 |
| 6815974 |
Determining composition of mixed dielectrics |
Nov. 9, 2004 |
| 6812729 |
System and method for characterizing the quality of the interface between a silicon and a gate insulator in a MOS device |
Nov. 2, 2004 |
| 6812717 |
Use of a coefficient of a power curve to evaluate a semiconductor wafer |
Nov. 2, 2004 |
| 6803780 |
Sample chuck with compound construction |
Oct. 12, 2004 |
| 6777972 |
Method and apparatus for detecting breakdown in ultra thin dielectric layers |
Aug. 17, 2004 |
| 6731130 |
Method of determining gate oxide thickness of an operational MOSFET |
May. 4, 2004 |
| 6724214 |
Test structures for on-chip real-time reliability testing |
Apr. 20, 2004 |
| 6714037 |
Methodology for an assessment of the degree of barrier permeability at via bottom during electromigration using dissimilar barrier thickness |
Mar. 30, 2004 |
| 6677766 |
Shallow trench isolation step height detection method |
Jan. 13, 2004 |
| 6621290 |
Characterization of barrier layers in integrated circuit interconnects |
Sep. 16, 2003 |
| 6613595 |
Test structure and method for flash memory tunnel oxide quality |
Sep. 2, 2003 |
| 6597193 |
Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current |
Jul. 22, 2003 |
| 6593748 |
Process integration of electrical thickness measurement of gate oxide and tunnel oxides by corona discharge technique |
Jul. 15, 2003 |
| 6583641 |
Method of determining integrity of a gate dielectric |
Jun. 24, 2003 |
| 6563334 |
Insulating film method and apparatus therefor |
May. 13, 2003 |
| 6559475 |
Test pattern for evaluating a process of silicide film formation |
May. 6, 2003 |
| 6512384 |
Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages |
Jan. 28, 2003 |
| 6505138 |
Function-based control interface for integrated circuit tester prober and handler devices |
Jan. 7, 2003 |
| 6489801 |
Apparatus and method for evaluating a semiconductor wafer |
Dec. 3, 2002 |
| 6489798 |
Method and apparatus for testing image sensing circuit arrays |
Dec. 3, 2002 |
| 6456098 |
Method of testing memory cells with a hysteresis curve |
Sep. 24, 2002 |
| 6431749 |
Method and device to measure the temperature of microwave components |
Aug. 13, 2002 |
| 6426644 |
Apparatus and method for determining the active dopant profile in a semiconductor wafer |
Jul. 30, 2002 |
| 6407558 |
Method of determining the doping concentration across a surface of a semiconductor material |
Jun. 18, 2002 |
| 6400165 |
Ultra-fast probe |
Jun. 4, 2002 |
| 6369603 |
Radio frequency coupling apparatus and method for measuring minority carrier lifetimes in semiconductor materials |
Apr. 9, 2002 |
| 6346820 |
Characteristics evaluation circuit for semiconductor wafer and its evaluation method |
Feb. 12, 2002 |
| 6346821 |
Method for nondestructive measurement of minority carrier diffusion length and minority carrier lifetime in semiconductor devices |
Feb. 12, 2002 |
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