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Class Information
Number: 324/765
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device
Description: Subject matter including a determination of faults in a material which is a solid or liquid conductor with resistivity between that of metals and that of insulators.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7309850 |
Measurement of current-voltage characteristic curves of solar cells and solar modules |
Dec. 18, 2007 |
| 7308627 |
Self-timed reliability and yield vehicle with gated data and clock |
Dec. 11, 2007 |
| 7307528 |
RFID tag design with circuitry for wafer level testing |
Dec. 11, 2007 |
| 7307443 |
Test socket for an integrated circuit |
Dec. 11, 2007 |
| 7307442 |
Integrated circuit test array including test module |
Dec. 11, 2007 |
| 7307441 |
Integrated circuit chips and wafers including on-chip test element group circuits, and methods of fabricating and testing same |
Dec. 11, 2007 |
| 7307440 |
Semiconductor integrated circuit tester with interchangeable tester module |
Dec. 11, 2007 |
| 7307434 |
Operation voltage supply apparatus and operation voltage supply method for semiconductor device |
Dec. 11, 2007 |
| 7307433 |
Intelligent probe card architecture |
Dec. 11, 2007 |
| 7304491 |
Interconnect for testing semiconductor components |
Dec. 4, 2007 |
| 7304487 |
Test method of semiconductor devices |
Dec. 4, 2007 |
| 7304485 |
Analysis of the quality of contacts and vias in multi-metal fabrication processes of semiconductor devices, method and test chip architecture |
Dec. 4, 2007 |
| 7301359 |
Testing apparatus, and testing method |
Nov. 27, 2007 |
| 7301357 |
Inspection method and inspection equipment |
Nov. 27, 2007 |
| 7301327 |
Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces |
Nov. 27, 2007 |
| 7301325 |
Method and apparatus for creating performance limits from parametric measurements |
Nov. 27, 2007 |
| 7299566 |
Substrate-placing mechanism having substrate-heating function |
Nov. 27, 2007 |
| 7299389 |
Test circuit, integrated circuit, and test method |
Nov. 20, 2007 |
| 7298161 |
Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability |
Nov. 20, 2007 |
| 7298159 |
Method of measuring the leakage current of a deep trench isolation structure |
Nov. 20, 2007 |
| 7298158 |
Network analyzing apparatus and test method |
Nov. 20, 2007 |
| 7298157 |
Device for generating internal voltages in burn-in test mode |
Nov. 20, 2007 |
| 7298156 |
Electronic part test apparatus |
Nov. 20, 2007 |
| 7298154 |
Probe apparatus |
Nov. 20, 2007 |
| 7298150 |
Test apparatus and test method |
Nov. 20, 2007 |
| 7295031 |
Method for non-contact testing of marginal integrated circuit connections |
Nov. 13, 2007 |
| 7295030 |
Thin film transistor tester and corresponding test method |
Nov. 13, 2007 |
| 7295029 |
Chip-scale package for integrated circuits |
Nov. 13, 2007 |
| 7295021 |
Process and circuit for protection of test contacts in high current measurement of semiconductor components |
Nov. 13, 2007 |
| 7294853 |
Substrate for mounting a semiconductor |
Nov. 13, 2007 |
| 7292058 |
Method for estimating the early failure rate of semiconductor devices |
Nov. 6, 2007 |
| 7288954 |
Compliant contact pin test assembly and methods thereof |
Oct. 30, 2007 |
| 7288953 |
Method for testing using a universal wafer carrier for wafer level die burn-in |
Oct. 30, 2007 |
| 7285973 |
Methods for standardizing a test head assembly |
Oct. 23, 2007 |
| 7285948 |
Method and apparatus providing single cable bi-directional triggering between instruments |
Oct. 23, 2007 |
| 7283918 |
Apparatus for analyzing fault of semiconductor integrated circuit, method for the same, and computer readable medium for the same |
Oct. 16, 2007 |
| 7282942 |
Enhanced sampling methodology for semiconductor processing |
Oct. 16, 2007 |
| 7282941 |
Method of measuring semiconductor wafers with an oxide enhanced probe |
Oct. 16, 2007 |
| 7282940 |
Semiconductor device with electrode pads for test probe |
Oct. 16, 2007 |
| 7282937 |
On-chip frequency degradation compensation |
Oct. 16, 2007 |
| 7282931 |
Full wafer contacter and applications thereof |
Oct. 16, 2007 |
| 7282930 |
Device for testing thin elements |
Oct. 16, 2007 |
| 7282925 |
Apparatus to facilitate functional shock and vibration testing of device connections and related method |
Oct. 16, 2007 |
| 7282905 |
System and method for IDDQ measurement in system on a chip (SOC) design |
Oct. 16, 2007 |
| 7279923 |
LSI inspection method and defect inspection data analysis apparatus |
Oct. 9, 2007 |
| 7279922 |
Sub-sampling of weakly-driven nodes |
Oct. 9, 2007 |
| 7279921 |
Apparatus and method for testing power and ground pins on a semiconductor integrated circuit |
Oct. 9, 2007 |
| 7279920 |
Expeditious and low cost testing of RFID ICs |
Oct. 9, 2007 |
| 7279919 |
Systems and methods of allocating device testing resources to sites of a probe card |
Oct. 9, 2007 |
| 7279918 |
Methods for wafer level burn-in |
Oct. 9, 2007 |
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