| |
 |
|
Class Information
Number: 324/765
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device
Description: Subject matter including a determination of faults in a material which is a solid or liquid conductor with resistivity between that of metals and that of insulators.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 6903568 |
Circuit for reducing leakage current in a processor |
Jun. 7, 2005 |
| 6900645 |
Semiconductor device test method and semiconductor device tester |
May. 31, 2005 |
| 6900648 |
Tester for printed circuit boards |
May. 31, 2005 |
| 6900654 |
Method and apparatus for evaluating a known good die using both wire bond and flip-chip interconnects |
May. 31, 2005 |
| 6900655 |
Determination of whether integrated circuit is acceptable or not in wafer-level burn-in test |
May. 31, 2005 |
| 6900656 |
Method of testing an integrated circuit and an integrated circuit test apparatus |
May. 31, 2005 |
| 6901344 |
Apparatus and method for verification of system interconnect upon hot-plugging of electronic field replaceable units |
May. 31, 2005 |
| 6900065 |
Apparatus and method for enhanced voltage contrast analysis |
May. 31, 2005 |
| 6897476 |
Test structure for determining electromigration and interlayer dielectric failure |
May. 24, 2005 |
| 6897645 |
Docking system and method for docking in automated testing systems |
May. 24, 2005 |
| 6897646 |
Method for testing wafers to be tested and calibration apparatus |
May. 24, 2005 |
| 6897666 |
Embedded voltage regulator and active transient control device in probe head for improved power delivery and method |
May. 24, 2005 |
| 6897667 |
Test system for silicon substrate having electrical contacts |
May. 24, 2005 |
| 6897670 |
Parallel integrated circuit test apparatus and test method |
May. 24, 2005 |
| 6897672 |
Apparatus to prevent damage to probe card |
May. 24, 2005 |
| 6897673 |
Method and integrated circuit for capacitor measurement with digital readout |
May. 24, 2005 |
| 6897674 |
Adaptive integrated circuit based on transistor current measurements |
May. 24, 2005 |
| 6898746 |
Method of and apparatus for testing a serial differential/mixed signal device |
May. 24, 2005 |
| 6893884 |
Method and apparatus for measuring dopant profile of a semiconductor |
May. 17, 2005 |
| 6894308 |
IC with comparator receiving expected and mask data from pads |
May. 17, 2005 |
| 6894477 |
Electrical current monitor |
May. 17, 2005 |
| 6894503 |
Preconditional quiescent current testing of a semiconductor device |
May. 17, 2005 |
| 6894517 |
Method for monitoring oxide quality |
May. 17, 2005 |
| 6894518 |
Circuit analysis and manufacture using electric field-induced effects |
May. 17, 2005 |
| 6894519 |
Apparatus and method for determining electrical properties of a semiconductor wafer |
May. 17, 2005 |
| 6894520 |
Semiconductor device and capacitance measurement method |
May. 17, 2005 |
| 6894521 |
Burn-in carrier for a semiconductor die |
May. 17, 2005 |
| 6894522 |
Specific site backside underlaying and micromasking method for electrical characterization of semiconductor devices |
May. 17, 2005 |
| 6894523 |
System and method for testing semiconductor devices |
May. 17, 2005 |
| 6894524 |
Daisy chain gang testing |
May. 17, 2005 |
| 6894525 |
Method and device for time measurement on semiconductor modules employing the ball-grid-array technique |
May. 17, 2005 |
| 6894526 |
Apparatus for determining burn-in reliability from wafer level burn-in |
May. 17, 2005 |
| 6891384 |
Multi-socket board for open/short tester |
May. 10, 2005 |
| 6891387 |
System for probing, testing, burn-in, repairing and programming of integrated circuits |
May. 10, 2005 |
| 6891390 |
Circuit analysis using electric field-induced effects |
May. 10, 2005 |
| 6891391 |
Measuring method, inspection method, inspection device, semiconductor device, method of manufacturing a semiconductor device, and method of manufacturing an element substrate |
May. 10, 2005 |
| 6891392 |
Substrate impedance measurement |
May. 10, 2005 |
| 6891393 |
Synchronous semiconductor device, and inspection system and method for the same |
May. 10, 2005 |
| 6891431 |
Integrated semiconductor circuit configuration |
May. 10, 2005 |
| 6892154 |
Method and apparatus for developing multiple test cases from a base test case |
May. 10, 2005 |
| 6892338 |
Analog/digital characteristics testing device and IC testing apparatus |
May. 10, 2005 |
| 6886976 |
Method for controlling the temperature of an electronic component under test |
May. 3, 2005 |
| 6888363 |
Method and device for cooling/heating die during burn in |
May. 3, 2005 |
| 6888364 |
Test system and test contactor for electronic modules |
May. 3, 2005 |
| 6888365 |
Semiconductor wafer testing system |
May. 3, 2005 |
| 6888366 |
Apparatus and method for testing a plurality of semiconductor chips |
May. 3, 2005 |
| 6888367 |
Method and apparatus for testing integrated circuit core modules |
May. 3, 2005 |
| 6888469 |
Method and apparatus for estimating semiconductor junction temperature |
May. 3, 2005 |
| 6889164 |
Method and apparatus of determining defect-free semiconductor integrated circuit |
May. 3, 2005 |
| 6889348 |
Tester architecture construction data generating method, tester architecture constructing method and test circuit |
May. 3, 2005 |
|
|
|
