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Class Information
Number: 324/765
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device
Description: Subject matter including a determination of faults in a material which is a solid or liquid conductor with resistivity between that of metals and that of insulators.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7112986 |
Method for testing using a universal wafer carrier for wafer level die burn-in |
Sep. 26, 2006 |
| 7112985 |
Method for testing using a universal wafer carrier for wafer level die burn-in |
Sep. 26, 2006 |
| 7112984 |
System LSI |
Sep. 26, 2006 |
| 7112983 |
Apparatus and method for single die backside probing of semiconductor devices |
Sep. 26, 2006 |
| 7112982 |
Method for evaluating semiconductor device |
Sep. 26, 2006 |
| 7112981 |
Method of debugging a 3D packaged IC |
Sep. 26, 2006 |
| 7112980 |
System and method for testing devices utilizing capacitively coupled signaling |
Sep. 26, 2006 |
| 7112979 |
Testing arrangement to distribute integrated circuits |
Sep. 26, 2006 |
| 7112792 |
Defect inspection and charged particle beam apparatus |
Sep. 26, 2006 |
| 7109740 |
Method for retesting semiconductor device |
Sep. 19, 2006 |
| 7109739 |
Wafer-level opto-electronic testing apparatus and method |
Sep. 19, 2006 |
| 7109738 |
Method for modeling inductive effects on circuit performance |
Sep. 19, 2006 |
| 7109737 |
Arrangements having IC voltage and thermal resistance designated on a per IC basis |
Sep. 19, 2006 |
| 7109736 |
System for measuring signal path resistance for an integrated circuit tester interconnect structure |
Sep. 19, 2006 |
| 7109734 |
Characterizing circuit performance by separating device and interconnect impact on signal delay |
Sep. 19, 2006 |
| 7109732 |
Electronic component test apparatus |
Sep. 19, 2006 |
| 7109730 |
Non-contact tester for electronic circuits |
Sep. 19, 2006 |
| 7109725 |
Integrated circuit test probe |
Sep. 19, 2006 |
| 7105366 |
Method for in-line testing of flip-chip semiconductor assemblies |
Sep. 12, 2006 |
| 7106049 |
Zero-temperature-gradient zero-bias thermally stimulated current technique to characterize defects in semiconductors or insulators |
Sep. 12, 2006 |
| 7106073 |
Method and system for area efficient charge-based capacitance measurement |
Sep. 12, 2006 |
| 7106082 |
Stage driving apparatus and probe method |
Sep. 12, 2006 |
| 7106083 |
Testing system and testing method for DUTs |
Sep. 12, 2006 |
| 7106084 |
Method of screening semiconductor device |
Sep. 12, 2006 |
| 7106085 |
Electronic circuit unit having small size and good productivity |
Sep. 12, 2006 |
| 7106086 |
Method of dynamically switching voltage screen test levels based on initial device parameter measurements |
Sep. 12, 2006 |
| 7106087 |
Method and apparatus for evaluating semiconductor device |
Sep. 12, 2006 |
| 7102357 |
Determination of worst case voltage in a power supply loop |
Sep. 5, 2006 |
| 7102363 |
Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits |
Sep. 5, 2006 |
| 7102371 |
Bilevel probe |
Sep. 5, 2006 |
| 7102375 |
Pin electronics with high voltage functionality |
Sep. 5, 2006 |
| 7102376 |
Power semiconductor module with detector for detecting main circuit current through power semiconductor element |
Sep. 5, 2006 |
| 7102377 |
Packaging reliability superchips |
Sep. 5, 2006 |
| 7098054 |
Method and structure for determining thermal cycle reliability |
Aug. 29, 2006 |
| 7098649 |
Testing circuits on substrates |
Aug. 29, 2006 |
| 7098676 |
Multi-functional structure for enhanced chip manufacturibility and reliability for low k dielectrics semiconductors and a crackstop integrity screen and monitor |
Aug. 29, 2006 |
| 7098682 |
Testing method and tester for semiconductor integrated circuit device comprising high-speed input/output element |
Aug. 29, 2006 |
| 7098878 |
Semiconductor device and liquid crystal panel driver device |
Aug. 29, 2006 |
| 7099789 |
Characterizing distribution signatures in integrated circuit technology |
Aug. 29, 2006 |
| 7095239 |
Method for detecting defects that exhibit repetitive patterns |
Aug. 22, 2006 |
| 7095242 |
In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays |
Aug. 22, 2006 |
| 7096142 |
Report format editor for circuit test |
Aug. 22, 2006 |
| 7091733 |
Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method |
Aug. 15, 2006 |
| 7091736 |
Method and apparatus for selecting multiple settings for an integrated circuit function |
Aug. 15, 2006 |
| 7091737 |
Apparatus and methods for self-heating burn-in processes |
Aug. 15, 2006 |
| 7087899 |
Sample electrification measurement method and charged particle beam apparatus |
Aug. 8, 2006 |
| 7088117 |
Wafer burn-in and test employing detachable cartridge |
Aug. 8, 2006 |
| 7088121 |
Non-contact method and apparatus for on-line interconnect characterization in VLSI circuits |
Aug. 8, 2006 |
| 7088122 |
Test arrangement for testing semiconductor circuit chips |
Aug. 8, 2006 |
| 7088123 |
System and method for extraction of C-V characteristics of ultra-thin oxides |
Aug. 8, 2006 |
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