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Class Information
Number: 324/765
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device
Description: Subject matter including a determination of faults in a material which is a solid or liquid conductor with resistivity between that of metals and that of insulators.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7129726 |
Testing device and testing method of a semiconductor device |
Oct. 31, 2006 |
| 7129722 |
Methods of improving reliability of an electro-optical module |
Oct. 31, 2006 |
| 7129697 |
Dynamic register with IDDQ testing capability |
Oct. 31, 2006 |
| 7129695 |
Electrical test circuit with an active-load and an output sampling capability |
Oct. 31, 2006 |
| 7127690 |
Method and system for defect evaluation using quiescent power plane current (IDDQ) voltage linearity |
Oct. 24, 2006 |
| 7126367 |
Test apparatus, test method, electronic device, and electronic device manufacturing method |
Oct. 24, 2006 |
| 7126366 |
Semiconductor test apparatus |
Oct. 24, 2006 |
| 7126363 |
Die carrier |
Oct. 24, 2006 |
| 7126359 |
Device monitor for RF and DC measurement |
Oct. 24, 2006 |
| 7123042 |
Methods, apparatus and systems for wafer-level burn-in stressing of semiconductor devices |
Oct. 17, 2006 |
| 7123041 |
LSI inspection method and defect inspection data analysis apparatus |
Oct. 17, 2006 |
| 7123040 |
System and method for check-in control in wafer testing |
Oct. 17, 2006 |
| 7123039 |
Testing input/output voltages in integrated circuits |
Oct. 17, 2006 |
| 7123036 |
Test method for electronic modules |
Oct. 17, 2006 |
| 7119571 |
Test structure design for reliability test |
Oct. 10, 2006 |
| 7119570 |
Method of measuring performance of a semiconductor device and circuit for the same |
Oct. 10, 2006 |
| 7119569 |
Real-time in-line testing of semiconductor wafers |
Oct. 10, 2006 |
| 7119568 |
Methods for wafer level burn-in |
Oct. 10, 2006 |
| 7119567 |
System and method for testing one or more dies on a semiconductor wafer |
Oct. 10, 2006 |
| 7119347 |
Ion implantation apparatus and method |
Oct. 10, 2006 |
| 7116125 |
Semiconductor test device using leakage current and compensation system of leakage current |
Oct. 3, 2006 |
| 7116124 |
Apparatus to prevent damage to probe card |
Oct. 3, 2006 |
| 7116122 |
Method for ball grid array chip packages having improved testing and stacking characteristics |
Oct. 3, 2006 |
| 7116118 |
Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability |
Oct. 3, 2006 |
| 7114556 |
Burn-in oven heat exchanger having improved thermal conduction |
Oct. 3, 2006 |
| 7114110 |
Semiconductor device, and the method of testing or making of the semiconductor device |
Sep. 26, 2006 |
| 7112987 |
Semiconductor sensor with a field-effect transistor |
Sep. 26, 2006 |
| 7112986 |
Method for testing using a universal wafer carrier for wafer level die burn-in |
Sep. 26, 2006 |
| 7112985 |
Method for testing using a universal wafer carrier for wafer level die burn-in |
Sep. 26, 2006 |
| 7112984 |
System LSI |
Sep. 26, 2006 |
| 7112983 |
Apparatus and method for single die backside probing of semiconductor devices |
Sep. 26, 2006 |
| 7112982 |
Method for evaluating semiconductor device |
Sep. 26, 2006 |
| 7112981 |
Method of debugging a 3D packaged IC |
Sep. 26, 2006 |
| 7112980 |
System and method for testing devices utilizing capacitively coupled signaling |
Sep. 26, 2006 |
| 7112979 |
Testing arrangement to distribute integrated circuits |
Sep. 26, 2006 |
| 7112792 |
Defect inspection and charged particle beam apparatus |
Sep. 26, 2006 |
| 7109740 |
Method for retesting semiconductor device |
Sep. 19, 2006 |
| 7109739 |
Wafer-level opto-electronic testing apparatus and method |
Sep. 19, 2006 |
| 7109738 |
Method for modeling inductive effects on circuit performance |
Sep. 19, 2006 |
| 7109737 |
Arrangements having IC voltage and thermal resistance designated on a per IC basis |
Sep. 19, 2006 |
| 7109736 |
System for measuring signal path resistance for an integrated circuit tester interconnect structure |
Sep. 19, 2006 |
| 7109734 |
Characterizing circuit performance by separating device and interconnect impact on signal delay |
Sep. 19, 2006 |
| 7109732 |
Electronic component test apparatus |
Sep. 19, 2006 |
| 7109730 |
Non-contact tester for electronic circuits |
Sep. 19, 2006 |
| 7109725 |
Integrated circuit test probe |
Sep. 19, 2006 |
| 7105366 |
Method for in-line testing of flip-chip semiconductor assemblies |
Sep. 12, 2006 |
| 7106049 |
Zero-temperature-gradient zero-bias thermally stimulated current technique to characterize defects in semiconductors or insulators |
Sep. 12, 2006 |
| 7106073 |
Method and system for area efficient charge-based capacitance measurement |
Sep. 12, 2006 |
| 7106082 |
Stage driving apparatus and probe method |
Sep. 12, 2006 |
| 7106083 |
Testing system and testing method for DUTs |
Sep. 12, 2006 |
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