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Class Information
Number: 324/765
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device
Description: Subject matter including a determination of faults in a material which is a solid or liquid conductor with resistivity between that of metals and that of insulators.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7190155 |
Test apparatus and testing method |
Mar. 13, 2007 |
| 7187194 |
Device for probe card power bus voltage drop reduction |
Mar. 6, 2007 |
| 7187193 |
MCU test device for multiple integrated circuit chips |
Mar. 6, 2007 |
| 7187192 |
Semiconductor test device having clock recovery circuit |
Mar. 6, 2007 |
| 7187191 |
Sensor device for determining the layer thickness of a thin layer |
Mar. 6, 2007 |
| 7187190 |
Contact pad arrangement on a die |
Mar. 6, 2007 |
| 7187188 |
Chuck with integrated wafer support |
Mar. 6, 2007 |
| 7187179 |
Wiring test structures for determining open and short circuits in semiconductor devices |
Mar. 6, 2007 |
| 7187163 |
Parametric measuring circuit for minimizing oscillation effect |
Mar. 6, 2007 |
| 7186576 |
Stacked die module and techniques for forming a stacked die module |
Mar. 6, 2007 |
| 7183790 |
System and method for testing devices utilizing capacitively coupled signaling |
Feb. 27, 2007 |
| 7183789 |
Comparing on die response and expected response applied to outputs |
Feb. 27, 2007 |
| 7183788 |
Wireless radio frequency technique design and method for testing of integrated circuits and wafers |
Feb. 27, 2007 |
| 7183787 |
Contact resistance device for improved process control |
Feb. 27, 2007 |
| 7183786 |
Modifying a semiconductor device to provide electrical parameter monitoring |
Feb. 27, 2007 |
| 7183780 |
Electrical open/short contact alignment structure for active region vs. gate region |
Feb. 27, 2007 |
| 7183570 |
IC with comparator receiving expected and mask data from pads |
Feb. 27, 2007 |
| 7180321 |
Tester interface module |
Feb. 20, 2007 |
| 7180320 |
Adaptive integrated circuit based on transistor current measurements |
Feb. 20, 2007 |
| 7180318 |
Multi-pitch test probe assembly for testing semiconductor dies having contact pads |
Feb. 20, 2007 |
| 7180284 |
Testing circuits on substrates |
Feb. 20, 2007 |
| 7178018 |
Network interface sharing methods and apparatuses that support kernel mode data traffic and user mode data traffic |
Feb. 13, 2007 |
| 7178017 |
Network interface sharing methods and apparatuses that support kernel mode data traffic and user mode data traffic |
Feb. 13, 2007 |
| 7176804 |
Protection of power semiconductor components |
Feb. 13, 2007 |
| 7176707 |
Back side component placement and bonding |
Feb. 13, 2007 |
| 7176706 |
Capacitance measurement method of micro structures of integrated circuits |
Feb. 13, 2007 |
| 7176705 |
Thermal optical chuck |
Feb. 13, 2007 |
| 7176675 |
Proximity sensitive defect monitor |
Feb. 13, 2007 |
| 7176487 |
Semiconductor integrated circuit |
Feb. 13, 2007 |
| 7174490 |
Test system rider utilized for automated at-speed testing of high serial pin count multiple gigabit per second devices |
Feb. 6, 2007 |
| 7174450 |
Network interface sharing methods and apparatuses that support kernel mode data traffic and user mode data traffic |
Feb. 6, 2007 |
| 7174449 |
Network interface sharing methods and apparatuses that support kernel mode data traffic and user mode data traffic |
Feb. 6, 2007 |
| 7174448 |
Network interface sharing methods and apparatuses that support kernel mode data traffic and user mode data traffic |
Feb. 6, 2007 |
| 7173447 |
Method and apparatus for diagnosing fault in semiconductor device |
Feb. 6, 2007 |
| 7173446 |
Mechanism to stabilize power delivered to a device under test |
Feb. 6, 2007 |
| 7173445 |
Sensor for inspection instrument and inspection instrument |
Feb. 6, 2007 |
| 7173444 |
Structure and method for parallel testing of dies on a semiconductor wafer |
Feb. 6, 2007 |
| 7173443 |
Semiconductor test system |
Feb. 6, 2007 |
| 7171598 |
Tester system having a multi-purpose memory |
Jan. 30, 2007 |
| 7171335 |
System and method for the analysis of semiconductor test data |
Jan. 30, 2007 |
| 7171333 |
On-wafer method and apparatus for pre-processing measurements of process and environment-dependent circuit performance variables for statistical analysis |
Jan. 30, 2007 |
| 7170310 |
System and method using locally heated island for integrated circuit testing |
Jan. 30, 2007 |
| 7170309 |
TDDB test pattern and method for testing TDDB of MOS capacitor dielectric |
Jan. 30, 2007 |
| 7170308 |
On-chip voltage regulator using feedback on process/product parameters |
Jan. 30, 2007 |
| 7170300 |
Apparatus and method for inspecting interface between ground layer and substrate of microstrip by using scattering parameters |
Jan. 30, 2007 |
| 7170189 |
Semiconductor wafer and testing method therefor |
Jan. 30, 2007 |
| 7170090 |
Method and structure for testing metal-insulator-metal capacitor structures under high temperature at wafer level |
Jan. 30, 2007 |
| 7168163 |
Full wafer silicon probe card for burn-in and testing and test system including same |
Jan. 30, 2007 |
| 7167978 |
Network interface sharing methods and apparatuses that support kernel mode data traffic and user mode data traffic |
Jan. 23, 2007 |
| 7167977 |
Network interface sharing methods and apparatuses that support kernel mode data traffic and user mode data traffic |
Jan. 23, 2007 |
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