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Class Information
Number: 324/765
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device
Description: Subject matter including a determination of faults in a material which is a solid or liquid conductor with resistivity between that of metals and that of insulators.


Sub-classes under this class:

Class Number Class Name Patents
324/766 With barrier layer 121


Patents under this class:

Patent Number Title Of Patent Date Issued
7619435 Method and system for derivation of breakdown voltage for MOS integrated circuit devices Nov. 17, 2009
7619434 System for multiple layer printed circuit board misregistration testing Nov. 17, 2009
7619433 Test circuit for a semiconductor integrated circuit Nov. 17, 2009
7619432 Tandem handler system and method for reduced index time Nov. 17, 2009
7616021 Method and device for determining an operational lifetime of an integrated circuit device Nov. 10, 2009
7616017 Probe station thermal chuck with shielding for capacitive current Nov. 10, 2009
7615781 Semiconductor wafer and semiconductor device, and method for manufacturing same Nov. 10, 2009
7614147 Method of creating contour structures to highlight inspection region Nov. 10, 2009
7613916 Method for burning chips Nov. 3, 2009
7612575 Electronic device test apparatus for successively testing electronic devices Nov. 3, 2009
7612571 System and method for estimation of integrated circuit signal characteristics using optical measurements Nov. 3, 2009
7610538 Test apparatus and performance board for diagnosis Oct. 27, 2009
7610532 Serializer/de-serializer bus controller interface Oct. 27, 2009
7609082 System for measuring signal path resistance for an integrated circuit tester interconnect structure Oct. 27, 2009
7609081 Testing system and method for testing an electronic device Oct. 27, 2009
7609080 Voltage fault detection and protection Oct. 27, 2009
7609078 Contact alignment verification/adjustment fixture Oct. 27, 2009
7607056 Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices Oct. 20, 2009
7605596 Probe card, apparatus and method for inspecting an object Oct. 20, 2009
7603603 Configurable memory architecture with built-in testing mechanism Oct. 13, 2009
7603598 Semiconductor device for testing semiconductor process and method thereof Oct. 13, 2009
7603248 Testing circuit and testing method for semiconductor device and semiconductor chip Oct. 13, 2009
7602206 Method of forming a transistor diagnostic circuit Oct. 13, 2009
7602205 Electromigration tester for high capacity and high current Oct. 13, 2009
7602199 Mini-prober for TFT-LCD testing Oct. 13, 2009
7602172 Test apparatus having multiple head boards at one handler and its test method Oct. 13, 2009
7600167 Flip-flop, shift register, and scan test circuit Oct. 6, 2009
7598763 Probe contacting electrode and electronic device Oct. 6, 2009
7598762 Semiconductor driver circuit with signal swing balance and enhanced testing Oct. 6, 2009
7598759 Routing engine, method of routing a test probe and testing system employing the same Oct. 6, 2009
7598731 Systems and methods for adjusting threshold voltage Oct. 6, 2009
7598730 Semiconductor wafer examination method and semiconductor chip manufacturing method Oct. 6, 2009
7598728 System and method for utilizing an automatic circuit tester system having multiple automatic circuit tester platforms Oct. 6, 2009
7596731 Test time reduction algorithm Sep. 29, 2009
7595654 Methods and apparatus for inline variability measurement of integrated circuit components Sep. 29, 2009
7595653 Pressure testing apparatus and method for pressure testing Sep. 29, 2009
7592828 Method and device of measuring interface trap density in semiconductor device Sep. 22, 2009
7592827 Apparatus and method for electrical detection and localization of shorts in metal interconnect lines Sep. 22, 2009
7592826 Method and apparatus for detecting EM energy using surface plasmon polaritons Sep. 22, 2009
7592825 Methods and systems for semiconductor diode junction screening and lifetime estimation Sep. 22, 2009
7592817 Alignment correction system and method of use Sep. 22, 2009
7592797 Semiconductor device and electronics device Sep. 22, 2009
7589549 Driver circuit and test apparatus Sep. 15, 2009
7589548 Design-for-test micro probe Sep. 15, 2009
7589546 Inspection apparatus and method for semiconductor IC Sep. 15, 2009
7589545 Device for final inspection Sep. 15, 2009
7587298 Diagnostic method for root-cause analysis of FET performance variation Sep. 8, 2009
7586315 System and method for testing voltage endurance Sep. 8, 2009
7586314 Multi-pin CV measurement Sep. 8, 2009
7586300 Isolation buffers with controlled equal time delays Sep. 8, 2009



 
 
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