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Class Information
Number: 324/765
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device
Description: Subject matter including a determination of faults in a material which is a solid or liquid conductor with resistivity between that of metals and that of insulators.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7404117 |
Component testing and recovery |
Jul. 22, 2008 |
| 7403031 |
Measurement apparatus for FET characteristics |
Jul. 22, 2008 |
| 7403030 |
Using parametric measurement units as a source of power for a device under test |
Jul. 22, 2008 |
| 7403026 |
Electronic switching circuit, switching circuit test arrangement and method for determining the operativeness of an electronic switching circuit |
Jul. 22, 2008 |
| 7402995 |
Jig device for transporting and testing integrated circuit chip |
Jul. 22, 2008 |
| 7400255 |
Wireless functional testing of RFID tag |
Jul. 15, 2008 |
| 7400162 |
Integrated circuit testing methods using well bias modification |
Jul. 15, 2008 |
| 7400161 |
Electronic device test system |
Jul. 15, 2008 |
| 7400160 |
Semiconductor integrated circuit device, measurement method therefore and measurement system for measuring AC characteristics thereof |
Jul. 15, 2008 |
| 7400157 |
Composite wiring structure having a wiring block and an insulating layer with electrical connections to probes |
Jul. 15, 2008 |
| 7399990 |
Wafer-level package having test terminal |
Jul. 15, 2008 |
| 7397289 |
Skew adjusting method, skew adjusting apparatus, and test apparatus |
Jul. 8, 2008 |
| 7397263 |
Sensor differentiated fault isolation |
Jul. 8, 2008 |
| 7397262 |
Burn-in system power stage |
Jul. 8, 2008 |
| 7397261 |
Monitoring system for detecting and characterizing classes of leakage in CMOS devices |
Jul. 8, 2008 |
| 7397258 |
Burn-in system with heating blocks accommodated in cooling blocks |
Jul. 8, 2008 |
| 7397255 |
Micro Kelvin probes and micro Kelvin probe methodology |
Jul. 8, 2008 |
| 7397253 |
Transmission line pulse (TLP) system calibration technique |
Jul. 8, 2008 |
| 7394280 |
Method of electro migration testing |
Jul. 1, 2008 |
| 7394279 |
Method of measuring a surface voltage of an insulating layer |
Jul. 1, 2008 |
| 7394278 |
Methods and apparatus for integrated circuit loopback testing |
Jul. 1, 2008 |
| 7394277 |
Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method |
Jul. 1, 2008 |
| 7394276 |
Active cancellation matrix for process parameter measurements |
Jul. 1, 2008 |
| 7394275 |
Systems and methods for generating and evaluating high frequency, low voltage swing signals at in-circuit testing |
Jul. 1, 2008 |
| 7394274 |
On-chip frequency degradation compensation |
Jul. 1, 2008 |
| 7394273 |
On-chip electromigration monitoring system |
Jul. 1, 2008 |
| 7392444 |
Non-volatile memory evaluating method and non-volatile memory |
Jun. 24, 2008 |
| 7391228 |
On-die heating circuit and control loop for rapid heating of the die |
Jun. 24, 2008 |
| 7389581 |
Method of forming compliant contact structures |
Jun. 24, 2008 |
| 7388396 |
Strip test method |
Jun. 17, 2008 |
| 7388395 |
Test semiconductor device and method for determining Joule heating effects in such a device |
Jun. 17, 2008 |
| 7388394 |
Multiple layer printed circuit board having misregistration testing pattern |
Jun. 17, 2008 |
| 7388393 |
Semiconductor test apparatus |
Jun. 17, 2008 |
| 7385412 |
Systems and methods for testing microfeature devices |
Jun. 10, 2008 |
| 7385410 |
Method of and apparatus for testing for integrated circuit contact defects |
Jun. 10, 2008 |
| 7385385 |
System for testing DUT and tester for use therewith |
Jun. 10, 2008 |
| 7382147 |
Semiconductor device testing |
Jun. 3, 2008 |
| 7382141 |
Testing a batch of electrical components |
Jun. 3, 2008 |
| 7382117 |
Delay circuit and test apparatus using delay element and buffer |
Jun. 3, 2008 |
| 7379836 |
Method of using automated test equipment to screen for leakage inducing defects after calibration to intrinsic leakage |
May. 27, 2008 |
| 7379395 |
Precise time measurement apparatus and method |
May. 27, 2008 |
| 7378864 |
Test apparatus having multiple test sites at one handler and its test method |
May. 27, 2008 |
| 7378863 |
Synchronous semiconductor device, and inspection system and method for the same |
May. 27, 2008 |
| 7378859 |
System and method for estimation of integrated circuit signal characteristics using optical measurements |
May. 27, 2008 |
| 7378836 |
Automated loading/unloading of devices for burn-in testing |
May. 27, 2008 |
| 7375633 |
Methods and systems for in-line RFID transponder testing |
May. 20, 2008 |
| 7375543 |
Electrostatic discharge testing |
May. 20, 2008 |
| 7375542 |
Automated test equipment with DIB mounted three dimensional tester electronics bricks |
May. 20, 2008 |
| 7375541 |
Testing method utilizing at least one signal between integrated circuits, and integrated circuit and testing system thereof |
May. 20, 2008 |
| 7375540 |
Process monitor for monitoring and compensating circuit performance |
May. 20, 2008 |
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