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Class Information
Number: 324/765
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device
Description: Subject matter including a determination of faults in a material which is a solid or liquid conductor with resistivity between that of metals and that of insulators.

Sub-classes under this class:

Class Number Class Name Patents
324/766 With barrier layer 124

Patents under this class:

Patent Number Title Of Patent Date Issued
7805641 Test apparatus for regulating a test signal supplied to a device under test and method thereof Sep. 28, 2010
7804317 Test device for determining charge damage to a transistor Sep. 28, 2010
7804307 Capacitance measurement systems and methods Sep. 28, 2010
7804291 Semiconductor test device with heating circuit Sep. 28, 2010
7802160 Test apparatus and calibration method Sep. 21, 2010
7802154 Method and apparatus for generating high-frequency command and address signals for high-speed semiconductor memory device testing Sep. 21, 2010
7802141 Semiconductor device having one-chip microcomputer and over-voltage application testing method Sep. 21, 2010
7801699 Regression test modules for detecting and reporting changes in process design kits Sep. 21, 2010
7800393 Electronic device test apparatus for successively testing electronic devices Sep. 21, 2010
7800392 Detection control circuit for anti-leakage Sep. 21, 2010
7800391 Apparatus for testing a chip and methods of making and using the same Sep. 21, 2010
7800389 Integrated circuit having built-in self-test features Sep. 21, 2010
7800382 System for testing an integrated circuit of a device and its method of use Sep. 21, 2010
7797601 Slack-based transition-fault testing Sep. 14, 2010
7795939 Method and system for setup/hold characterization in sequential cells Sep. 14, 2010
7795897 Test apparatus and driver circuit Sep. 14, 2010
7795896 High-power optical burn-in Sep. 14, 2010
7795895 Loop-back testing method and apparatus for IC Sep. 14, 2010
7795894 Built-in-self-test arrangement for a single multiple-integrated circuit package and methods thereof Sep. 14, 2010
7795615 Capacitor integrated in a structure surrounding a die Sep. 14, 2010
7795593 Surface contamination analyzer for semiconductor wafers Sep. 14, 2010
7793174 Semiconductor apparatus and test method therefor Sep. 7, 2010
7792396 Probe card for testing in-wafer photonic integrated circuits (PICs) and method of use Sep. 7, 2010
7788557 Baseboard testing interface and testing method thereof Aug. 31, 2010
7786743 Probe tile for probing semiconductor wafer Aug. 31, 2010
7786721 Multilayer type test board assembly for high-precision inspection Aug. 31, 2010
7783452 Signal measurement apparatus and test apparatus Aug. 24, 2010
7782076 Method and apparatus for statistical CMOS device characterization Aug. 24, 2010
7782075 Electronic device, load fluctuation compensation circuit, power supply, and test apparatus Aug. 24, 2010
7782074 System that detects damage in adjacent dice Aug. 24, 2010
7782073 High accuracy and universal on-chip switch matrix testline Aug. 24, 2010
7782064 Test apparatus and test module Aug. 24, 2010
7782043 Variable bandwidth DC bias for AC measurement system Aug. 24, 2010
RE41516 Socketless/boardless test interposer card Aug. 17, 2010
7779314 System and related method for chip I/O test Aug. 17, 2010
7779313 Testing apparatus and testing method Aug. 17, 2010
7779311 Testing and recovery in a multilayer device Aug. 17, 2010
7777515 Methods and systems for semiconductor testing using reference dice Aug. 17, 2010
7777514 Methods for transferring integrated circuits to a printed circuit board Aug. 17, 2010
7777513 Power supply voltage detection circuit and semiconductor integrated circuit device Aug. 17, 2010
7777512 Semiconductor device Aug. 17, 2010
7777509 Method and apparatus for electrical testing Aug. 17, 2010
7777507 Integrated circuit testing with laser stimulation and emission analysis Aug. 17, 2010
7772868 Accurate capacitance measurement for ultra large scale integrated circuits Aug. 10, 2010
7772867 Structures for testing and locating defects in integrated circuits Aug. 10, 2010
7772831 Systems and methods for testing packaged dies Aug. 10, 2010
7770082 Semiconductor integrated circuit and test method therefor Aug. 3, 2010
7768290 Circuit and apparatus for detecting electric current Aug. 3, 2010
7768289 Testing method and testing device for an integrated circuit Aug. 3, 2010
7768286 Electronic device testing apparatus and temperature control method in an electronic device testing apparatus Aug. 3, 2010

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