| |
 |
|
Class Information
Number: 324/765
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device
Description: Subject matter including a determination of faults in a material which is a solid or liquid conductor with resistivity between that of metals and that of insulators.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7619435 |
Method and system for derivation of breakdown voltage for MOS integrated circuit devices |
Nov. 17, 2009 |
| 7619434 |
System for multiple layer printed circuit board misregistration testing |
Nov. 17, 2009 |
| 7619433 |
Test circuit for a semiconductor integrated circuit |
Nov. 17, 2009 |
| 7619432 |
Tandem handler system and method for reduced index time |
Nov. 17, 2009 |
| 7616021 |
Method and device for determining an operational lifetime of an integrated circuit device |
Nov. 10, 2009 |
| 7616017 |
Probe station thermal chuck with shielding for capacitive current |
Nov. 10, 2009 |
| 7615781 |
Semiconductor wafer and semiconductor device, and method for manufacturing same |
Nov. 10, 2009 |
| 7614147 |
Method of creating contour structures to highlight inspection region |
Nov. 10, 2009 |
| 7613916 |
Method for burning chips |
Nov. 3, 2009 |
| 7612575 |
Electronic device test apparatus for successively testing electronic devices |
Nov. 3, 2009 |
| 7612571 |
System and method for estimation of integrated circuit signal characteristics using optical measurements |
Nov. 3, 2009 |
| 7610538 |
Test apparatus and performance board for diagnosis |
Oct. 27, 2009 |
| 7610532 |
Serializer/de-serializer bus controller interface |
Oct. 27, 2009 |
| 7609082 |
System for measuring signal path resistance for an integrated circuit tester interconnect structure |
Oct. 27, 2009 |
| 7609081 |
Testing system and method for testing an electronic device |
Oct. 27, 2009 |
| 7609080 |
Voltage fault detection and protection |
Oct. 27, 2009 |
| 7609078 |
Contact alignment verification/adjustment fixture |
Oct. 27, 2009 |
| 7607056 |
Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices |
Oct. 20, 2009 |
| 7605596 |
Probe card, apparatus and method for inspecting an object |
Oct. 20, 2009 |
| 7603603 |
Configurable memory architecture with built-in testing mechanism |
Oct. 13, 2009 |
| 7603598 |
Semiconductor device for testing semiconductor process and method thereof |
Oct. 13, 2009 |
| 7603248 |
Testing circuit and testing method for semiconductor device and semiconductor chip |
Oct. 13, 2009 |
| 7602206 |
Method of forming a transistor diagnostic circuit |
Oct. 13, 2009 |
| 7602205 |
Electromigration tester for high capacity and high current |
Oct. 13, 2009 |
| 7602199 |
Mini-prober for TFT-LCD testing |
Oct. 13, 2009 |
| 7602172 |
Test apparatus having multiple head boards at one handler and its test method |
Oct. 13, 2009 |
| 7600167 |
Flip-flop, shift register, and scan test circuit |
Oct. 6, 2009 |
| 7598763 |
Probe contacting electrode and electronic device |
Oct. 6, 2009 |
| 7598762 |
Semiconductor driver circuit with signal swing balance and enhanced testing |
Oct. 6, 2009 |
| 7598759 |
Routing engine, method of routing a test probe and testing system employing the same |
Oct. 6, 2009 |
| 7598731 |
Systems and methods for adjusting threshold voltage |
Oct. 6, 2009 |
| 7598730 |
Semiconductor wafer examination method and semiconductor chip manufacturing method |
Oct. 6, 2009 |
| 7598728 |
System and method for utilizing an automatic circuit tester system having multiple automatic circuit tester platforms |
Oct. 6, 2009 |
| 7596731 |
Test time reduction algorithm |
Sep. 29, 2009 |
| 7595654 |
Methods and apparatus for inline variability measurement of integrated circuit components |
Sep. 29, 2009 |
| 7595653 |
Pressure testing apparatus and method for pressure testing |
Sep. 29, 2009 |
| 7592828 |
Method and device of measuring interface trap density in semiconductor device |
Sep. 22, 2009 |
| 7592827 |
Apparatus and method for electrical detection and localization of shorts in metal interconnect lines |
Sep. 22, 2009 |
| 7592826 |
Method and apparatus for detecting EM energy using surface plasmon polaritons |
Sep. 22, 2009 |
| 7592825 |
Methods and systems for semiconductor diode junction screening and lifetime estimation |
Sep. 22, 2009 |
| 7592817 |
Alignment correction system and method of use |
Sep. 22, 2009 |
| 7592797 |
Semiconductor device and electronics device |
Sep. 22, 2009 |
| 7589549 |
Driver circuit and test apparatus |
Sep. 15, 2009 |
| 7589548 |
Design-for-test micro probe |
Sep. 15, 2009 |
| 7589546 |
Inspection apparatus and method for semiconductor IC |
Sep. 15, 2009 |
| 7589545 |
Device for final inspection |
Sep. 15, 2009 |
| 7587298 |
Diagnostic method for root-cause analysis of FET performance variation |
Sep. 8, 2009 |
| 7586315 |
System and method for testing voltage endurance |
Sep. 8, 2009 |
| 7586314 |
Multi-pin CV measurement |
Sep. 8, 2009 |
| 7586300 |
Isolation buffers with controlled equal time delays |
Sep. 8, 2009 |
|
|
|
