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Class Information
Number: 324/765
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Test of semiconductor device
Description: Subject matter including a determination of faults in a material which is a solid or liquid conductor with resistivity between that of metals and that of insulators.


Sub-classes under this class:

Class Number Class Name Patents
324/766 With barrier layer 118


Patents under this class:

Patent Number Title Of Patent Date Issued
7404117 Component testing and recovery Jul. 22, 2008
7403031 Measurement apparatus for FET characteristics Jul. 22, 2008
7403030 Using parametric measurement units as a source of power for a device under test Jul. 22, 2008
7403026 Electronic switching circuit, switching circuit test arrangement and method for determining the operativeness of an electronic switching circuit Jul. 22, 2008
7402995 Jig device for transporting and testing integrated circuit chip Jul. 22, 2008
7400255 Wireless functional testing of RFID tag Jul. 15, 2008
7400162 Integrated circuit testing methods using well bias modification Jul. 15, 2008
7400161 Electronic device test system Jul. 15, 2008
7400160 Semiconductor integrated circuit device, measurement method therefore and measurement system for measuring AC characteristics thereof Jul. 15, 2008
7400157 Composite wiring structure having a wiring block and an insulating layer with electrical connections to probes Jul. 15, 2008
7399990 Wafer-level package having test terminal Jul. 15, 2008
7397289 Skew adjusting method, skew adjusting apparatus, and test apparatus Jul. 8, 2008
7397263 Sensor differentiated fault isolation Jul. 8, 2008
7397262 Burn-in system power stage Jul. 8, 2008
7397261 Monitoring system for detecting and characterizing classes of leakage in CMOS devices Jul. 8, 2008
7397258 Burn-in system with heating blocks accommodated in cooling blocks Jul. 8, 2008
7397255 Micro Kelvin probes and micro Kelvin probe methodology Jul. 8, 2008
7397253 Transmission line pulse (TLP) system calibration technique Jul. 8, 2008
7394280 Method of electro migration testing Jul. 1, 2008
7394279 Method of measuring a surface voltage of an insulating layer Jul. 1, 2008
7394278 Methods and apparatus for integrated circuit loopback testing Jul. 1, 2008
7394277 Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method Jul. 1, 2008
7394276 Active cancellation matrix for process parameter measurements Jul. 1, 2008
7394275 Systems and methods for generating and evaluating high frequency, low voltage swing signals at in-circuit testing Jul. 1, 2008
7394274 On-chip frequency degradation compensation Jul. 1, 2008
7394273 On-chip electromigration monitoring system Jul. 1, 2008
7392444 Non-volatile memory evaluating method and non-volatile memory Jun. 24, 2008
7391228 On-die heating circuit and control loop for rapid heating of the die Jun. 24, 2008
7389581 Method of forming compliant contact structures Jun. 24, 2008
7388396 Strip test method Jun. 17, 2008
7388395 Test semiconductor device and method for determining Joule heating effects in such a device Jun. 17, 2008
7388394 Multiple layer printed circuit board having misregistration testing pattern Jun. 17, 2008
7388393 Semiconductor test apparatus Jun. 17, 2008
7385412 Systems and methods for testing microfeature devices Jun. 10, 2008
7385410 Method of and apparatus for testing for integrated circuit contact defects Jun. 10, 2008
7385385 System for testing DUT and tester for use therewith Jun. 10, 2008
7382147 Semiconductor device testing Jun. 3, 2008
7382141 Testing a batch of electrical components Jun. 3, 2008
7382117 Delay circuit and test apparatus using delay element and buffer Jun. 3, 2008
7379836 Method of using automated test equipment to screen for leakage inducing defects after calibration to intrinsic leakage May. 27, 2008
7379395 Precise time measurement apparatus and method May. 27, 2008
7378864 Test apparatus having multiple test sites at one handler and its test method May. 27, 2008
7378863 Synchronous semiconductor device, and inspection system and method for the same May. 27, 2008
7378859 System and method for estimation of integrated circuit signal characteristics using optical measurements May. 27, 2008
7378836 Automated loading/unloading of devices for burn-in testing May. 27, 2008
7375633 Methods and systems for in-line RFID transponder testing May. 20, 2008
7375543 Electrostatic discharge testing May. 20, 2008
7375542 Automated test equipment with DIB mounted three dimensional tester electronics bricks May. 20, 2008
7375541 Testing method utilizing at least one signal between integrated circuits, and integrated circuit and testing system thereof May. 20, 2008
7375540 Process monitor for monitoring and compensating circuit performance May. 20, 2008



 
 
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