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Class Information
Number: 324/764
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With identification of dut
Description: Subject matter wherein a device under test (DUT) has unique marks or codes that can be read to determine the identity of the DUT.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7577926 |
Security-sensitive semiconductor product, particularly a smart-card chip |
Aug. 18, 2009 |
| 7543198 |
Test data reporting and analyzing using data array and related data analysis |
Jun. 2, 2009 |
| 7487571 |
Control adjustable device configurations to induce parameter variations to control parameter skews |
Feb. 10, 2009 |
| 7439730 |
Apparatus and method for detecting photon emissions from transistors |
Oct. 21, 2008 |
| 7403029 |
Massively parallel interface for electronic circuit |
Jul. 22, 2008 |
| 7372289 |
Semiconductor integrated circuit device and power supply voltage monitor system employing it |
May. 13, 2008 |
| 7368678 |
Method for sorting integrated circuit devices |
May. 6, 2008 |
| 7348791 |
High voltage, high frequency, high reliability, high density, high temperature automated test equipment (ATE) switch design |
Mar. 25, 2008 |
| RE40188 |
System and method for providing an integrated circuit with a unique identification |
Mar. 25, 2008 |
| 7323862 |
Apparatus and method for detecting photon emissions from transistors |
Jan. 29, 2008 |
| 7323899 |
System and method for resumed probing of a wafer |
Jan. 29, 2008 |
| 7265568 |
Semi-conductor component test process and a system for testing semi-conductor components |
Sep. 4, 2007 |
| 7257504 |
Production of radio frequency ID tags |
Aug. 14, 2007 |
| 7230442 |
Semi-conductor component testing process and system for testing semi-conductor components |
Jun. 12, 2007 |
| 7231552 |
Method and apparatus for independent control of devices under test connected in parallel |
Jun. 12, 2007 |
| 7219418 |
Method to prevent damage to probe card |
May. 22, 2007 |
| 7148716 |
System and method for the probing of a wafer |
Dec. 12, 2006 |
| 7138818 |
Massively parallel interface for electronic circuit |
Nov. 21, 2006 |
| 7053645 |
System and method for detecting defects in a thin-film-transistor array |
May. 30, 2006 |
| 7031791 |
Method and system for a reject management protocol within a back-end integrated circuit manufacturing process |
Apr. 18, 2006 |
| 7012443 |
System used to test plurality of DUTs in parallel and method thereof |
Mar. 14, 2006 |
| 6891363 |
Apparatus and method for detecting photon emissions from transistors |
May. 10, 2005 |
| 6883113 |
System and method for temporally isolating environmentally sensitive integrated circuit faults |
Apr. 19, 2005 |
| 6769101 |
Systems and methods providing scan-based delay test generation |
Jul. 27, 2004 |
| 6597194 |
Difference frequency imaging and spectroscopy to measure dopants using an alternating current scanning tunneling microscope |
Jul. 22, 2003 |
| 6590408 |
Microelectronic fabrication electrical test apparatus and method providing enhanced electrical test accuracy |
Jul. 8, 2003 |
| 6577151 |
Inspection device for wiring of an integrated circuit |
Jun. 10, 2003 |
| 6549027 |
Apparatus and method for testing for compatibility between circuit boards |
Apr. 15, 2003 |
| 6483335 |
Simple chip identification |
Nov. 19, 2002 |
| 6452402 |
Apparatus for determining the type of external device being connected |
Sep. 17, 2002 |
| 6339338 |
Apparatus for reducing power supply noise in an integrated circuit |
Jan. 15, 2002 |
| 6268740 |
System for testing semiconductor device formed on semiconductor wafer |
Jul. 31, 2001 |
| 6246334 |
Board ID display system |
Jun. 12, 2001 |
| 6225818 |
Integrated circuits including function identification circuits having operating modes that identify corresponding functions of the integrated circuits |
May. 1, 2001 |
| 6161213 |
System for providing an integrated circuit with a unique identification |
Dec. 12, 2000 |
| 6158119 |
Circuit board panel test strip and associated method of assembly |
Dec. 12, 2000 |
| 6154043 |
Method and apparatus for identifying the position of a selected semiconductor die relative to other dice formed from the same semiconductor wafer |
Nov. 28, 2000 |
| 6130530 |
Tester for power transformers and capacitors |
Oct. 10, 2000 |
| 5905640 |
Security via hole(s) for printed circuit boards |
May. 18, 1999 |
| 5832419 |
Apparatus and method for identifying an integrated device |
Nov. 3, 1998 |
| 5787174 |
Remote identification of integrated circuit |
Jul. 28, 1998 |
| 5787012 |
Integrated circuit with identification signal writing circuitry distributed on multiple metal layers |
Jul. 28, 1998 |
| 5705935 |
Method of managing mapping data indicative of excellent/defective chips on semiconductor wafer |
Jan. 6, 1998 |
| 5661626 |
Excess current detection and control circuit for power source in semiconductor test system |
Aug. 26, 1997 |
| 5589777 |
Circuit and method for testing a disk drive head assembly without probing |
Dec. 31, 1996 |
| 5565789 |
Process for encoding printed circuit boards |
Oct. 15, 1996 |
| 5465850 |
Integrated circuit test system |
Nov. 14, 1995 |
| 5467024 |
Integrated circuit test with programmable source for both AC and DC modes of operation |
Nov. 14, 1995 |
| 5162725 |
Modular metering instrument including multiple sensing probes |
Nov. 10, 1992 |
| 5157328 |
System for and method of detecting reverse packaging of PROM |
Oct. 20, 1992 |
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