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Class Information
Number: 324/763
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Dut including test circuit
Description: Subject matter wherein a device under test (DUT) has integral elements which can be manipulated to configure the DUT so that tests can be made.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 6930500 |
IDDQ testing of CMOS mixed-signal integrated circuits |
Aug. 16, 2005 |
| 6930501 |
Method for determining an ESD/latch-up strength of an integrated circuit |
Aug. 16, 2005 |
| 6929963 |
Semiconductor component and method of manufacture and monitoring |
Aug. 16, 2005 |
| 6931336 |
Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same |
Aug. 16, 2005 |
| 6927590 |
Method and circuit for testing a regulated power supply in an integrated circuit |
Aug. 9, 2005 |
| 6927592 |
Device for monitoring quiescent current of an electronic device |
Aug. 9, 2005 |
| 6924658 |
Device and method for checking signal transmission quality of circuit board |
Aug. 2, 2005 |
| 6922650 |
Semiconductor device tester and its method |
Jul. 26, 2005 |
| 6917213 |
Semiconductor integrated circuit device |
Jul. 12, 2005 |
| 6917208 |
Method and test structure for determining resistances at a plurality of interconnected resistors in an integrated circuit |
Jul. 12, 2005 |
| 6909301 |
Oscillation based access time measurement |
Jun. 21, 2005 |
| 6909303 |
Multichip module and testing method thereof |
Jun. 21, 2005 |
| 6909304 |
Display device and scanning circuit testing method |
Jun. 21, 2005 |
| 6909294 |
Time recording device and a time recording method employing a semiconductor element |
Jun. 21, 2005 |
| 6909293 |
Space-saving test structures having improved capabilities |
Jun. 21, 2005 |
| 6907377 |
Method and apparatus for interconnect built-in self test based system management performance tuning |
Jun. 14, 2005 |
| 6903564 |
Device aging determination circuit |
Jun. 7, 2005 |
| 6900688 |
Switch circuit |
May. 31, 2005 |
| 6900655 |
Determination of whether integrated circuit is acceptable or not in wafer-level burn-in test |
May. 31, 2005 |
| 6900628 |
Semiconductor integrated circuit allowing proper detection of pin contact failure |
May. 31, 2005 |
| 6901543 |
Utilizing slow ASIC logic BIST to preserve timing integrity across timing domains |
May. 31, 2005 |
| 6897673 |
Method and integrated circuit for capacitor measurement with digital readout |
May. 24, 2005 |
| 6897476 |
Test structure for determining electromigration and interlayer dielectric failure |
May. 24, 2005 |
| 6897674 |
Adaptive integrated circuit based on transistor current measurements |
May. 24, 2005 |
| 6894520 |
Semiconductor device and capacitance measurement method |
May. 17, 2005 |
| 6894526 |
Apparatus for determining burn-in reliability from wafer level burn-in |
May. 17, 2005 |
| 6891393 |
Synchronous semiconductor device, and inspection system and method for the same |
May. 10, 2005 |
| 6892154 |
Method and apparatus for developing multiple test cases from a base test case |
May. 10, 2005 |
| 6891389 |
System and method for detecting quiescent current in an integrated circuit |
May. 10, 2005 |
| 6888365 |
Semiconductor wafer testing system |
May. 3, 2005 |
| 6885207 |
Method and apparatus for testing electronic devices |
Apr. 26, 2005 |
| 6885208 |
Semiconductor device and test device for same |
Apr. 26, 2005 |
| 6885209 |
Device testing |
Apr. 26, 2005 |
| 6885210 |
System and method for measuring transistor leakage current with a ring oscillator with backbias controls |
Apr. 26, 2005 |
| 6885213 |
Circuit and method for accurately applying a voltage to a node of an integrated circuit |
Apr. 26, 2005 |
| 6885215 |
Voltage detector circuit with a programmable threshold point |
Apr. 26, 2005 |
| 6883113 |
System and method for temporally isolating environmentally sensitive integrated circuit faults |
Apr. 19, 2005 |
| 6882139 |
Electronic component, tester device and method for calibrating a tester device |
Apr. 19, 2005 |
| 6879173 |
Apparatus and method for detecting and rejecting high impedance failures in chip interconnects |
Apr. 12, 2005 |
| 6879925 |
Metal interconnect reliability evaluation device, method thereof, and recording medium storing program for evaluating reliability of metal interconnect |
Apr. 12, 2005 |
| 6876217 |
Method for testing semiconductor circuit devices |
Apr. 5, 2005 |
| 6876218 |
Method for accurate output voltage testing |
Apr. 5, 2005 |
| 6876221 |
Fault tolerant semiconductor system |
Apr. 5, 2005 |
| 6873146 |
Integrated circuit testing device and a method of use therefor |
Mar. 29, 2005 |
| 6870383 |
Semiconductor device with high speed switching of test modes |
Mar. 22, 2005 |
| 6870384 |
Test instrument with multiple analog modules |
Mar. 22, 2005 |
| 6870386 |
Method and apparatus for measuring sheet resistance |
Mar. 22, 2005 |
| 6867613 |
Built-in self timing test method and apparatus |
Mar. 15, 2005 |
| 6864699 |
Apparatus for testing integrated circuits having an integrated unit for testing digital and analog signals |
Mar. 8, 2005 |
| 6865503 |
Method and apparatus for telemetered probing of integrated circuit operation |
Mar. 8, 2005 |
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