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Class Information
Number: 324/763
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Dut including test circuit
Description: Subject matter wherein a device under test (DUT) has integral elements which can be manipulated to configure the DUT so that tests can be made.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 6597164 |
Test bus circuit and associated method |
Jul. 22, 2003 |
| 6591492 |
Angled edge connections for multichip structures |
Jul. 15, 2003 |
| 6590407 |
Apparatus for disabling and re-enabling access to IC test functions |
Jul. 8, 2003 |
| 6586921 |
Method and circuit for testing DC parameters of circuit input and output nodes |
Jul. 1, 2003 |
| 6583642 |
Apparatus and method for automatic determination of operating frequency with built-in self-test |
Jun. 24, 2003 |
| 6577151 |
Inspection device for wiring of an integrated circuit |
Jun. 10, 2003 |
| 6573742 |
Semiconductor integrated circuit with test points inserted thereinto |
Jun. 3, 2003 |
| 6570400 |
Method for disabling and re-enabling access to IC test functions |
May. 27, 2003 |
| 6567941 |
Event based test system storing pin calibration data in non-volatile memory |
May. 20, 2003 |
| 6566901 |
Printed circuit board testing apparatus |
May. 20, 2003 |
| 6563323 |
Method for testing a semiconductor integrated circuit |
May. 13, 2003 |
| 6564161 |
Arrangement for testing light emitting diode interface of an integrated network device |
May. 13, 2003 |
| 6559669 |
Synchronous semiconductor device, and inspection system and method for the same |
May. 6, 2003 |
| 6548910 |
Integrated circuit element, printed circuit board and electronic device having input/output terminals for testing and operation |
Apr. 15, 2003 |
| 6549081 |
Integrator/ comparator control of ring oscillator frequency and duty cycle |
Apr. 15, 2003 |
| 6541981 |
Automation of transmission line pulse testing of electrostatic discharge devices |
Apr. 1, 2003 |
| 6541994 |
Semiconductor device with a self-testing function and a method for testing the semiconductor device |
Apr. 1, 2003 |
| 6535014 |
Electrical parameter tester having decoupling means |
Mar. 18, 2003 |
| 6535011 |
Testing device and testing method for a semiconductor integrated circuit and storage medium having the testing program stored therein |
Mar. 18, 2003 |
| 6535831 |
Method for sourcing three level data from a two level tester pin faster than the maximum rate of a tester |
Mar. 18, 2003 |
| 6535013 |
Parameter variation probing technique |
Mar. 18, 2003 |
| 6531885 |
Method and apparatus for testing supply connections |
Mar. 11, 2003 |
| 6529030 |
IC testing apparatus |
Mar. 4, 2003 |
| 6518783 |
Circuit construction in back side of die and over a buried insulator |
Feb. 11, 2003 |
| 6518766 |
Method of inspecting an electrical disconnection between circuits by calculating physical quantities thereof based on capacitances regarding the circuits measured twice |
Feb. 11, 2003 |
| 6515495 |
Test structure in an integrated semiconductor |
Feb. 4, 2003 |
| 6507209 |
Tester accuracy using multiple passes |
Jan. 14, 2003 |
| 6504395 |
Method and apparatus for calibration and validation of high performance DUT power supplies |
Jan. 7, 2003 |
| 6504394 |
Configuration for trimming reference voltages in semiconductor chips, in particular semiconductor memories |
Jan. 7, 2003 |
| 6501291 |
Testing base for semiconductor devices |
Dec. 31, 2002 |
| 6498507 |
Circuit for testing an integrated circuit |
Dec. 24, 2002 |
| 6498508 |
Semiconductor integrated circuit device and testing method therefor |
Dec. 24, 2002 |
| 6496027 |
System for testing integrated circuit devices |
Dec. 17, 2002 |
| 6496028 |
Method and apparatus for testing electronic devices |
Dec. 17, 2002 |
| 6492828 |
System and method for detecting bonding status of bonding wire of semiconductor package |
Dec. 10, 2002 |
| 6489791 |
Build off self-test (Bost) testing method |
Dec. 3, 2002 |
| 6489796 |
Semiconductor device provided with boost circuit consuming less current |
Dec. 3, 2002 |
| 6489799 |
Integrated circuit device having process parameter measuring circuit |
Dec. 3, 2002 |
| 6489800 |
Method of testing an integrated circuit |
Dec. 3, 2002 |
| 6486690 |
Device under test board and testing method |
Nov. 26, 2002 |
| 6486649 |
Built-in frequency test circuit for testing the frequency of the output of a frequency generating circuit |
Nov. 26, 2002 |
| 6483335 |
Simple chip identification |
Nov. 19, 2002 |
| 6483338 |
Method and system of testing a chip |
Nov. 19, 2002 |
| 6484279 |
Testing system for evaluating integrated circuits, a testing system, and a method for testing an integrated circuit |
Nov. 19, 2002 |
| 6483337 |
Method for achieving synchronous non-destructive latchup characterization |
Nov. 19, 2002 |
| 6476630 |
Method for testing signal paths between an integrated circuit wafer and a wafer tester |
Nov. 5, 2002 |
| 6469493 |
Low cost CMOS tester with edge rate compensation |
Oct. 22, 2002 |
| 6469534 |
Semiconductor integrated circuit apparatus and electronic device |
Oct. 22, 2002 |
| 6469533 |
Measuring a characteristic of an integrated circuit |
Oct. 22, 2002 |
| 6469514 |
Timing calibration apparatus and method in a semiconductor integrated circuit tester |
Oct. 22, 2002 |
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