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Class Information
Number: 324/763
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Dut including test circuit
Description: Subject matter wherein a device under test (DUT) has integral elements which can be manipulated to configure the DUT so that tests can be made.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 6670802 |
Integrated circuit having a test operating mode and method for testing a multiplicity of such circuits |
Dec. 30, 2003 |
| 6668346 |
Digital process monitor |
Dec. 23, 2003 |
| 6664798 |
Integrated circuit with test interface |
Dec. 16, 2003 |
| 6664799 |
Method and apparatus for enabling a digital memory tester to read the frequency of a free running oscillator |
Dec. 16, 2003 |
| 6664801 |
IDDQ test methodology based on the sensitivity of fault current to power supply variations |
Dec. 16, 2003 |
| 6661246 |
Constant-current VDDQ testing of integrated circuits |
Dec. 9, 2003 |
| 6657452 |
Configuration for measurement of internal voltages of an integrated semiconductor apparatus |
Dec. 2, 2003 |
| 6657504 |
System and method of determining ring oscillator speed |
Dec. 2, 2003 |
| 6653855 |
External test auxiliary device to be used for testing semiconductor device |
Nov. 25, 2003 |
| 6650103 |
Magnetic snapback sensor circuit and electrostatic discharge circuit using same |
Nov. 18, 2003 |
| 6646461 |
Method and apparatus for testing semiconductor devices using improved testing sequence |
Nov. 11, 2003 |
| 6646460 |
Parallel scan distributors and collectors and process of testing integrated circuits |
Nov. 11, 2003 |
| 6646459 |
Method for disabling and re-enabling access to IC test functions |
Nov. 11, 2003 |
| 6642736 |
Tester for semiconductor integrated circuits and method for testing semiconductor integrated circuits |
Nov. 4, 2003 |
| 6642733 |
Apparatus for indentifying defects in electronic assemblies |
Nov. 4, 2003 |
| 6639397 |
Automatic test equipment for testing a device under test |
Oct. 28, 2003 |
| 6639396 |
Detecting structure formed on a PCB to detect unavailability of the lines |
Oct. 28, 2003 |
| 6640323 |
Testing system for evaluating integrated circuits, a testing system, and a method for testing an integrated circuit |
Oct. 28, 2003 |
| 6636066 |
Semiconductor integrated circuit and method for testing the same |
Oct. 21, 2003 |
| 6636064 |
Dual probe test structures for semiconductor integrated circuits |
Oct. 21, 2003 |
| 6630838 |
Method for implementing dynamic burn-in testing using static test signals |
Oct. 7, 2003 |
| 6628135 |
Analog-based on-chip voltage sensor |
Sep. 30, 2003 |
| 6629281 |
Method and system for at speed diagnostics and bit fail mapping |
Sep. 30, 2003 |
| 6629280 |
Method and apparatus for delaying ABIST start |
Sep. 30, 2003 |
| 6628134 |
DC stress supply circuit |
Sep. 30, 2003 |
| 6628126 |
Optical voltage measurement circuit and method for monitoring voltage supplies utilizing imaging circuit analysis |
Sep. 30, 2003 |
| 6624651 |
Kerf circuit for modeling of BEOL capacitances |
Sep. 23, 2003 |
| 6621289 |
Method and test circuit for developing integrated circuit fabrication processes |
Sep. 16, 2003 |
| 6621284 |
Post-package trimming of analog integrated circuits |
Sep. 16, 2003 |
| 6621283 |
Semiconductor device, method of testing the semiconductor device, and semiconductor integrated circuit |
Sep. 16, 2003 |
| 6617869 |
Electrical circuit with a testing device for testing the quality of electronic connections in the electrical circuit |
Sep. 9, 2003 |
| 6614253 |
On-circuit board continuity tester |
Sep. 2, 2003 |
| 6611477 |
Built-in self test using pulse generators |
Aug. 26, 2003 |
| 6605956 |
Device and method for testing integrated circuit dice in an integrated circuit module |
Aug. 12, 2003 |
| 6603327 |
Test module |
Aug. 5, 2003 |
| 6600332 |
Tablet with short testing function and method of measuring |
Jul. 29, 2003 |
| 6597194 |
Difference frequency imaging and spectroscopy to measure dopants using an alternating current scanning tunneling microscope |
Jul. 22, 2003 |
| 6597191 |
Semiconductor integrated circuit device |
Jul. 22, 2003 |
| 6597190 |
Method and apparatus for testing electronic devices |
Jul. 22, 2003 |
| 6597164 |
Test bus circuit and associated method |
Jul. 22, 2003 |
| 6591492 |
Angled edge connections for multichip structures |
Jul. 15, 2003 |
| 6590407 |
Apparatus for disabling and re-enabling access to IC test functions |
Jul. 8, 2003 |
| 6586921 |
Method and circuit for testing DC parameters of circuit input and output nodes |
Jul. 1, 2003 |
| 6583642 |
Apparatus and method for automatic determination of operating frequency with built-in self-test |
Jun. 24, 2003 |
| 6577151 |
Inspection device for wiring of an integrated circuit |
Jun. 10, 2003 |
| 6573742 |
Semiconductor integrated circuit with test points inserted thereinto |
Jun. 3, 2003 |
| 6570400 |
Method for disabling and re-enabling access to IC test functions |
May. 27, 2003 |
| 6567941 |
Event based test system storing pin calibration data in non-volatile memory |
May. 20, 2003 |
| 6566901 |
Printed circuit board testing apparatus |
May. 20, 2003 |
| 6564161 |
Arrangement for testing light emitting diode interface of an integrated network device |
May. 13, 2003 |
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