| |
 |
|
Class Information
Number: 324/763
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Dut including test circuit
Description: Subject matter wherein a device under test (DUT) has integral elements which can be manipulated to configure the DUT so that tests can be made.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7619431 |
High sensitivity magnetic built-in current sensor |
Nov. 17, 2009 |
| 7619432 |
Tandem handler system and method for reduced index time |
Nov. 17, 2009 |
| 7619433 |
Test circuit for a semiconductor integrated circuit |
Nov. 17, 2009 |
| 7616020 |
Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device |
Nov. 10, 2009 |
| 7617064 |
Self-test circuit for high-definition multimedia interface integrated circuits |
Nov. 10, 2009 |
| 7612574 |
Systems and methods for defect testing of externally accessible integrated circuit interconnects |
Nov. 3, 2009 |
| 7613237 |
Built-in test feature to facilitate system level stress testing of a high-speed serial link that uses a forwarding clock |
Nov. 3, 2009 |
| 7612573 |
Probe sensing pads and methods of detecting positions of probe needles relative to probe sensing pads |
Nov. 3, 2009 |
| 7609076 |
Method of measuring characteristic impedance of electrostatic discharge protecting circuit and apparatus for realizing the same |
Oct. 27, 2009 |
| 7609079 |
Probeless DC testing of CMOS I/O circuits |
Oct. 27, 2009 |
| 7609758 |
Method of phase shifting bits in a digital signal pattern |
Oct. 27, 2009 |
| 7605597 |
Intra-chip power and test signal generation for use with test structures on wafers |
Oct. 20, 2009 |
| 7605584 |
Voltage generating apparatus, current generating apparatus, and test apparatus |
Oct. 20, 2009 |
| 7602205 |
Electromigration tester for high capacity and high current |
Oct. 13, 2009 |
| 7598761 |
Semiconductor integrated circuit having a degradation notice signal generation circuit |
Oct. 6, 2009 |
| 7598731 |
Systems and methods for adjusting threshold voltage |
Oct. 6, 2009 |
| 7595654 |
Methods and apparatus for inline variability measurement of integrated circuit components |
Sep. 29, 2009 |
| 7592797 |
Semiconductor device and electronics device |
Sep. 22, 2009 |
| 7592824 |
Method and apparatus for test and characterization of semiconductor components |
Sep. 22, 2009 |
| 7589551 |
On-wafer AC stress test circuit |
Sep. 15, 2009 |
| 7580020 |
Semiconductor device and liquid crystal panel driver device |
Aug. 25, 2009 |
| 7577926 |
Security-sensitive semiconductor product, particularly a smart-card chip |
Aug. 18, 2009 |
| 7576554 |
Semiconductor devices and methods of testing the same |
Aug. 18, 2009 |
| 7573285 |
Multiple point gate oxide integrity test method and system for the manufacture of semiconductor integrated circuits |
Aug. 11, 2009 |
| 7573937 |
Phase rotator control test scheme |
Aug. 11, 2009 |
| 7574318 |
I/O port tester |
Aug. 11, 2009 |
| 7571365 |
Wafer scale testing using a 2 signal JTAG interface |
Aug. 4, 2009 |
| 7567091 |
Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
Jul. 28, 2009 |
| 7567882 |
Method for evaluating semiconductor device |
Jul. 28, 2009 |
| 7564254 |
Semiconductor device and test method thereof |
Jul. 21, 2009 |
| 7560945 |
Integrated circuit failure prediction |
Jul. 14, 2009 |
| 7560946 |
Method of acceptance for semiconductor devices |
Jul. 14, 2009 |
| 7557598 |
Method of inspecting quiescent power supply current in semiconductor integrated circuit and device for executing the method |
Jul. 7, 2009 |
| 7557587 |
Control apparatus, semiconductor integrated circuit apparatus, and source voltage supply control system |
Jul. 7, 2009 |
| 7557596 |
Test assembly including a test die for testing a semiconductor product die |
Jul. 7, 2009 |
| 7557597 |
Stacked chip security |
Jul. 7, 2009 |
| 7554335 |
Production test technique for RF circuits using embedded test sensors |
Jun. 30, 2009 |
| 7550987 |
Method and circuit for measuring operating and leakage current of individual blocks within an array of test circuit blocks |
Jun. 23, 2009 |
| 7550986 |
Semiconductor wafer having a dielectric reliability test structure, integrated circuit product and test method |
Jun. 23, 2009 |
| 7550976 |
Apparatus/method for measuring the switching time of output signals of a DUT |
Jun. 23, 2009 |
| 7548055 |
Testing an electronic device using test data from a plurality of testers |
Jun. 16, 2009 |
| 7548828 |
Automatic test equipment platform architecture using parallel user computers |
Jun. 16, 2009 |
| 7545161 |
Method and apparatus to measure threshold shifting of a MOSFET device and voltage difference between nodes |
Jun. 9, 2009 |
| 7543507 |
Failure analysis system for printed circuit board and method using the same |
Jun. 9, 2009 |
| 7543198 |
Test data reporting and analyzing using data array and related data analysis |
Jun. 2, 2009 |
| 7543196 |
Apparatus for testing integrated circuit |
Jun. 2, 2009 |
| 7541829 |
Method for correcting for asymmetry of threshold voltage shifts |
Jun. 2, 2009 |
| 7541825 |
Isolation circuit |
Jun. 2, 2009 |
| 7541815 |
Electronic device, testing apparatus, and testing method |
Jun. 2, 2009 |
| 7538560 |
System and method for component failure protection |
May. 26, 2009 |
|
|
|
