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Class Information
Number: 324/763
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Dut including test circuit
Description: Subject matter wherein a device under test (DUT) has integral elements which can be manipulated to configure the DUT so that tests can be made.

Patents under this class:

Patent Number Title Of Patent Date Issued
7805647 System and method for testing a plurality of circuits Sep. 28, 2010
7805641 Test apparatus for regulating a test signal supplied to a device under test and method thereof Sep. 28, 2010
7801699 Regression test modules for detecting and reporting changes in process design kits Sep. 21, 2010
7800392 Detection control circuit for anti-leakage Sep. 21, 2010
7800390 Load fluctuation correction circuit, electronic device, testing device, and load fluctuation correction method Sep. 21, 2010
7800389 Integrated circuit having built-in self-test features Sep. 21, 2010
7797602 Compressor/decompressor circuits coupled with TDO-TMS/TDI die channel circuitry Sep. 14, 2010
7795939 Method and system for setup/hold characterization in sequential cells Sep. 14, 2010
7795894 Built-in-self-test arrangement for a single multiple-integrated circuit package and methods thereof Sep. 14, 2010
7795893 Test mode enable circuit Sep. 14, 2010
7791357 On silicon interconnect capacitance extraction Sep. 7, 2010
7786746 Semiconductor integrated circuit apparatus, measurement result management system, and management server Aug. 31, 2010
7786724 Methods and apparatus for collecting process characterization data after first failure in a group of tested devices Aug. 31, 2010
7783311 Wireless communications system, transmitting station, and receiving station Aug. 24, 2010
7782073 High accuracy and universal on-chip switch matrix testline Aug. 24, 2010
7782064 Test apparatus and test module Aug. 24, 2010
7777513 Power supply voltage detection circuit and semiconductor integrated circuit device Aug. 17, 2010
7777512 Semiconductor device Aug. 17, 2010
7772867 Structures for testing and locating defects in integrated circuits Aug. 10, 2010
7772866 Structure and method of mapping signal intensity to surface voltage for integrated circuit inspection Aug. 10, 2010
7772590 Metal comb structures, methods for their fabrication and failure analysis Aug. 10, 2010
7768288 Detection device Aug. 3, 2010
7768287 Methods and apparatus for managing defective processors through power gating Aug. 3, 2010
7768278 High impedance, high parallelism, high temperature memory test system architecture Aug. 3, 2010
7768004 Semiconductor device including chips with electrically-isolated test elements and its manufacturing method Aug. 3, 2010
7764078 Test structure for monitoring leakage currents in a metallization layer Jul. 27, 2010
7759991 Scannable virtual rail ring oscillator circuit and system for measuring variations in device characteristics Jul. 20, 2010
7759958 Apparatus, system, and method for integrated component testing Jul. 20, 2010
7759957 Method for fabricating a test structure Jul. 20, 2010
7759928 Semiconductor device including an internal voltage generation circuit and a first test circuit Jul. 20, 2010
7757145 Test method, integrated circuit and test system Jul. 13, 2010
7757029 On the fly configuration of electronic device with attachable sub-modules Jul. 13, 2010
7750660 Integrated circuit with improved test capability via reduced pin count Jul. 6, 2010
7750659 Voltage detecting circuit and semiconductor device including the same Jul. 6, 2010
7750658 Integrated circuit and testing circuit therein for testing and failure analysis Jul. 6, 2010
7750657 Polishing head testing with movable pedestal Jul. 6, 2010
7750656 Circuit for distributing a test signal applied to a pad of an electronic device Jul. 6, 2010
7750400 Integrated circuit modeling, design, and fabrication based on degradation mechanisms Jul. 6, 2010
7746183 Measurement apparatus for improving performance of standard cell library Jun. 29, 2010
7746091 Sensor apparatus Jun. 29, 2010
7741863 Apparatus and methods for performing a test Jun. 22, 2010
7741862 Semiconductor device including a signal generator activated upon occurring of a timing signal Jun. 22, 2010
7733112 Semiconductor testing circuit and semiconductor testing method Jun. 8, 2010
7733110 Parallel scan distributors and collectors and process of testing integrated circuits Jun. 8, 2010
7733109 Test structure for resistive open detection using voltage contrast inspection and related methods Jun. 8, 2010
7730372 Device and method for testing integrated circuit dice in an integrated circuit module Jun. 1, 2010
7728614 Operating characteristic measurement device and methods thereof Jun. 1, 2010
7728604 Testing differential signal standards using device under test's built in resistors Jun. 1, 2010
7725785 Film-type semiconductor package and method using test pads shared by output channels, and test device, semiconductor device and method using patterns shared by test channels May. 25, 2010
7724016 Characterizing circuit performance by separating device and interconnect impact on signal delay May. 25, 2010

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