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Class Information
Number: 324/763
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > Dut including test circuit
Description: Subject matter wherein a device under test (DUT) has integral elements which can be manipulated to configure the DUT so that tests can be made.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7408368 |
Semiconductor integrated circuit device having pads respectively provided with pad portions |
Aug. 5, 2008 |
| 7405585 |
Versatile semiconductor test structure array |
Jul. 29, 2008 |
| 7405586 |
Ultra low pin count interface for die testing |
Jul. 29, 2008 |
| 7403028 |
Test structure and probe for differential signals |
Jul. 22, 2008 |
| 7403027 |
Apparatuses and methods for outputting signals during self-heat burn-in modes of operation |
Jul. 22, 2008 |
| 7403026 |
Electronic switching circuit, switching circuit test arrangement and method for determining the operativeness of an electronic switching circuit |
Jul. 22, 2008 |
| 7400134 |
Integrated circuit device with multiple chips in one package |
Jul. 15, 2008 |
| 7400160 |
Semiconductor integrated circuit device, measurement method therefore and measurement system for measuring AC characteristics thereof |
Jul. 15, 2008 |
| 7398169 |
Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device |
Jul. 8, 2008 |
| 7397261 |
Monitoring system for detecting and characterizing classes of leakage in CMOS devices |
Jul. 8, 2008 |
| 7397260 |
Structure and method for monitoring stress-induced degradation of conductive interconnects |
Jul. 8, 2008 |
| 7394272 |
Built-in self test for system in package |
Jul. 1, 2008 |
| 7395518 |
Back end of line clone test vehicle |
Jul. 1, 2008 |
| 7394274 |
On-chip frequency degradation compensation |
Jul. 1, 2008 |
| 7394273 |
On-chip electromigration monitoring system |
Jul. 1, 2008 |
| 7394239 |
Method and circuit arrangement for the self-testing of a reference voltage in electronic components |
Jul. 1, 2008 |
| 7394234 |
Power supply circuit and test apparatus |
Jul. 1, 2008 |
| 7382146 |
Semiconductor testing apparatus |
Jun. 3, 2008 |
| 7378862 |
Method and apparatus for eliminating automated testing equipment index time |
May. 27, 2008 |
| 7375541 |
Testing method utilizing at least one signal between integrated circuits, and integrated circuit and testing system thereof |
May. 20, 2008 |
| 7375540 |
Process monitor for monitoring and compensating circuit performance |
May. 20, 2008 |
| 7375371 |
Structure and method for thermally stressing or testing a semiconductor device |
May. 20, 2008 |
| 7373574 |
Semiconductor testing apparatus and method of testing semiconductor |
May. 13, 2008 |
| 7368933 |
Method for testing standby current of semiconductor package |
May. 6, 2008 |
| 7368932 |
Testing device for printed circuit board |
May. 6, 2008 |
| 7368931 |
On-chip self test circuit and self test method for signal distortion |
May. 6, 2008 |
| 7365554 |
Integrated circuit for determining a voltage |
Apr. 29, 2008 |
| 7365555 |
Semiconductor device, method for testing the same and IC card |
Apr. 29, 2008 |
| 7362120 |
Method and apparatus for die testing on wafer |
Apr. 22, 2008 |
| 7359822 |
Testing device |
Apr. 15, 2008 |
| 7358755 |
Ring oscillator system |
Apr. 15, 2008 |
| 7358718 |
Semiconductor device and electronics device |
Apr. 15, 2008 |
| 7355429 |
On-chip power supply noise detector |
Apr. 8, 2008 |
| 7355430 |
Parallel scan distributors and collectors and process of testing integrated circuits |
Apr. 8, 2008 |
| 7355435 |
On-chip detection of power supply vulnerabilities |
Apr. 8, 2008 |
| 7352169 |
Testing components of I/O paths of an integrated circuit |
Apr. 1, 2008 |
| 7352202 |
Method of Kelvin current sense in a semiconductor package |
Apr. 1, 2008 |
| 7349223 |
Enhanced compliant probe card systems having improved planarity |
Mar. 25, 2008 |
| 7348790 |
AC testing of leakage current in integrated circuits using RC time constant |
Mar. 25, 2008 |
| 7348789 |
Integrated circuit device with on-chip setup/hold measuring circuit |
Mar. 25, 2008 |
| 7350120 |
Buffered memory module and method for testing same |
Mar. 25, 2008 |
| 7345499 |
Method of Kelvin current sense in a semiconductor package |
Mar. 18, 2008 |
| 7345497 |
Protection circuit for semiconductor device and semiconductor device including the same |
Mar. 18, 2008 |
| 7345496 |
Semiconductor apparatus and test execution method for semiconductor apparatus |
Mar. 18, 2008 |
| 7345467 |
Voltage generating apparatus, current generating apparatus, and test apparatus |
Mar. 18, 2008 |
| 7342406 |
Methods and apparatus for inline variability measurement of integrated circuit components |
Mar. 11, 2008 |
| 7342404 |
Device for measurement and analysis of electrical signals of an integrated circuit component |
Mar. 11, 2008 |
| 7339390 |
Systems and methods for controlling of electro-migration |
Mar. 4, 2008 |
| 7339389 |
Semiconductor device incorporating characteristic evaluating circuit operated by high frequency clock signal |
Mar. 4, 2008 |
| 7339388 |
Intra-clip power and test signal generation for use with test structures on wafers |
Mar. 4, 2008 |
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