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Class Information
Number: 324/762
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements > Cantilever
Description: Subject matter including a probe element set at a first end of a beam wherein the beam has a first end and a second end and the second end is attached to a support.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7619429 |
Integrated probe module for LCD panel light inspection |
Nov. 17, 2009 |
| 7619430 |
Electrical testing probe assembly having nonparallel facing surfaces and slots formed thereon for receiving probes |
Nov. 17, 2009 |
| 7616016 |
Probe card assembly and kit |
Nov. 10, 2009 |
| 7605368 |
Vibration-type cantilever holder and scanning probe microscope |
Oct. 20, 2009 |
| 7602204 |
Probe card manufacturing method including sensing probe and the probe card, probe card inspection system |
Oct. 13, 2009 |
| 7602202 |
Semiconductor probe with high resolution resistive tip having doping control layer and method of fabricating the same |
Oct. 13, 2009 |
| 7589547 |
Forked probe for testing semiconductor devices |
Sep. 15, 2009 |
| 7589542 |
Hybrid probe for testing semiconductor devices |
Sep. 15, 2009 |
| 7586316 |
Probe board mounting apparatus |
Sep. 8, 2009 |
| 7586321 |
Electrical test probe and electrical test probe assembly |
Sep. 8, 2009 |
| 7583101 |
Probing structure with fine pitch probes |
Sep. 1, 2009 |
| 7583100 |
Test head for testing electrical components |
Sep. 1, 2009 |
| 7579856 |
Probe structures with physically suspended electronic components |
Aug. 25, 2009 |
| 7579855 |
Method for manufacturing electrical contact element for testing electronic device and electrical contact element manufactured thereby |
Aug. 25, 2009 |
| 7579850 |
Probe card and method for assembling the same |
Aug. 25, 2009 |
| 7579857 |
Electrical contact device of probe card |
Aug. 25, 2009 |
| 7573281 |
Probe for inspecting one or more semiconductor chips |
Aug. 11, 2009 |
| 7570061 |
Cantilever control device |
Aug. 4, 2009 |
| 7567089 |
Two-part microprobes for contacting electronic components and methods for making such probes |
Jul. 28, 2009 |
| 7560943 |
Alignment features in a probing device |
Jul. 14, 2009 |
| 7560942 |
Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus |
Jul. 14, 2009 |
| 7559139 |
Method for manufacturing a probe unit |
Jul. 14, 2009 |
| 7557595 |
Cantilever microprobes for contacting electronic components and methods for making such probes |
Jul. 7, 2009 |
| 7550855 |
Vertically spaced plural microsprings |
Jun. 23, 2009 |
| 7550983 |
Membrane probing system with local contact scrub |
Jun. 23, 2009 |
| 7548082 |
Inspection probe |
Jun. 16, 2009 |
| 7545160 |
Probe chip and probe card |
Jun. 9, 2009 |
| 7541821 |
Membrane probing system with local contact scrub |
Jun. 2, 2009 |
| 7538567 |
Probe card with balanced lateral force |
May. 26, 2009 |
| 7528618 |
Extended probe tips |
May. 5, 2009 |
| 7525328 |
Cap at resistors of electrical test probe |
Apr. 28, 2009 |
| 7523539 |
Method of manufacturing a probe |
Apr. 28, 2009 |
| 7518387 |
Shielded probe for testing a device under test |
Apr. 14, 2009 |
| 7514948 |
Vertical probe array arranged to provide space transformation |
Apr. 7, 2009 |
| 7511523 |
Cantilever microprobes for contacting electronic components and methods for making such probes |
Mar. 31, 2009 |
| 7511524 |
Contact tip structure of a connecting element |
Mar. 31, 2009 |
| 7504842 |
Probe holder for testing of a test device |
Mar. 17, 2009 |
| 7504840 |
Electrochemically fabricated microprobes |
Mar. 17, 2009 |
| 7501840 |
Probe assembly comprising a parallelogram link vertical probe made of a metal foil attached to the surface of a resin film |
Mar. 10, 2009 |
| 7501842 |
Shielded probe for testing a device under test |
Mar. 10, 2009 |
| 7501838 |
Contact assembly and LSI chip inspecting device using the same |
Mar. 10, 2009 |
| 7498829 |
Shielded probe for testing a device under test |
Mar. 3, 2009 |
| 7495461 |
Wafer probe |
Feb. 24, 2009 |
| 7492177 |
Bendable conductive connector |
Feb. 17, 2009 |
| 7489149 |
Shielded probe for testing a device under test |
Feb. 10, 2009 |
| 7482822 |
Apparatus and method for limiting over travel in a probe card assembly |
Jan. 27, 2009 |
| 7482823 |
Shielded probe for testing a device under test |
Jan. 27, 2009 |
| 7482826 |
Probe for scanning over a substrate and a data storage device |
Jan. 27, 2009 |
| 7477062 |
LSI test socket for BGA |
Jan. 13, 2009 |
| 7477061 |
Probe card |
Jan. 13, 2009 |
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