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Browse by Category: Main > Electrical & Energy
Class Information
Number: 324/762
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements > Cantilever
Description: Subject matter including a probe element set at a first end of a beam wherein the beam has a first end and a second end and the second end is attached to a support.










Patents under this class:
1 2 3 4 5 6 7 8 9

Patent Number Title Of Patent Date Issued
7800388 Curved spring structure with elongated section located under cantilevered section Sep. 21, 2010
7791364 Electronic device probe card with improved probe grouping Sep. 7, 2010
7786743 Probe tile for probing semiconductor wafer Aug. 31, 2010
7782070 Probing device Aug. 24, 2010
7782072 Single support structure probe group with staggered mounting pattern Aug. 24, 2010
RE41515 Contactor and production method for contactor Aug. 17, 2010
7777509 Method and apparatus for electrical testing Aug. 17, 2010
7772859 Probe for testing semiconductor devices with features that increase stress tolerance Aug. 10, 2010
7772861 Probe card Aug. 10, 2010
7768282 Apparatus and method for terminating probe apparatus of semiconductor wafer Aug. 3, 2010
7764074 Probe of detector for testing pins of electronic component Jul. 27, 2010
7759953 Active wafer probe Jul. 20, 2010
7755373 Device and method for sensing topographical variations on a surface using a probe Jul. 13, 2010
7737714 Probe assembly arrangement Jun. 15, 2010
7738351 Signal processing circuit and reproducing apparatus Jun. 15, 2010
7733104 Low force interconnects for probe cards Jun. 8, 2010
7733102 Ultra-fine area array pitch probe card Jun. 8, 2010
7724009 Method of making high-frequency probe, probe card using the high-frequency probe May. 25, 2010
7724006 Probe card, manufacturing method of probe card, semiconductor inspection apparatus and manufacturing method of semiconductor device May. 25, 2010
7721430 Approach for fabricating cantilever probes May. 25, 2010
7724010 Torsion spring probe contactor design May. 25, 2010
7710134 Probe card assembly May. 4, 2010
7701243 Electronic device testing using a probe tip having multiple contact features Apr. 20, 2010
7692436 Probe card substrate with bonded via Apr. 6, 2010
7688089 Compliant membrane thin film interposer probe for intergrated circuit device testing Mar. 30, 2010
7688097 Wafer probe Mar. 30, 2010
7688095 Interposer structures and methods of manufacturing the same Mar. 30, 2010
7688085 Contactor having a global spring structure and methods of making and using the contactor Mar. 30, 2010
7683646 Probe card and method of producing the same by a fine inkjet process Mar. 23, 2010
7678587 Cantilever-type probe and method of fabricating the same Mar. 16, 2010
7679386 Probe card including contactors formed projection portion Mar. 16, 2010
7679389 Probe for electrical test and electrical connecting apparatus using it Mar. 16, 2010
7679383 Cantilever probe card Mar. 16, 2010
7679388 Cantilever microprobes for contacting electronic components and methods for making such probes Mar. 16, 2010
7675301 Electronic components with plurality of contoured microelectronic spring contacts Mar. 9, 2010
7675302 Probe card assembly and method of attaching probes to the probe card assembly Mar. 9, 2010
7671616 Semiconductor probe having embossed resistive tip and method of fabricating the same Mar. 2, 2010
7649367 Low profile probe having improved mechanical scrub and reduced contact inductance Jan. 19, 2010
7640651 Fabrication process for co-fabricating multilayer probe array and a space transformer Jan. 5, 2010
7639494 Electronic apparatus Dec. 29, 2009
7629803 Probe card assembly and test probes therein Dec. 8, 2009
7629806 Method for forming connection pin, probe, connection pin, probe card and method for manufacturing probe card Dec. 8, 2009
7629807 Electrical test probe Dec. 8, 2009
RE41016 Probe card having groups of probe needles in a probing test apparatus for testing semiconductor integrated circuits Dec. 1, 2009
7619430 Electrical testing probe assembly having nonparallel facing surfaces and slots formed thereon for receiving probes Nov. 17, 2009
7619429 Integrated probe module for LCD panel light inspection Nov. 17, 2009
7616016 Probe card assembly and kit Nov. 10, 2009
7605368 Vibration-type cantilever holder and scanning probe microscope Oct. 20, 2009
7602204 Probe card manufacturing method including sensing probe and the probe card, probe card inspection system Oct. 13, 2009
7602202 Semiconductor probe with high resolution resistive tip having doping control layer and method of fabricating the same Oct. 13, 2009

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