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Class Information
Number: 324/762.01
Name: Electricity: measuring and testing >
Description:










Sub-classes under this class:

Class Number Class Name Patents
324/158.1 Miscellaneous 3,073
324/160 Electrical speed measuring 273
324/200 Magnetic 110
324/300 Particle precession resonance 658
324/323 Of geophysical surface or subsurface in situ 198
324/376 Of subsurface core sample 60
324/378 Internal-combustion engine ignition system or device 114
324/403 Electric lamp or discharge device 42
324/415 Electromechanical switching device 153
324/425 Electrolyte properties 247
324/451 A material property using thermoelectric phenomenon 31
324/452 A material property using electrostatic phenomenon 159
324/457 Electrostatic field 319
324/459 Using ionization effects 113
324/500 Fault detecting in electric circuits and of electric components 424
324/557 For insulation fault of noncircuit elements 179
324/600 Impedance, admittance or other quantities representative of electrical stimulus/response relationships 181
324/66 Conductor identification or location (e.g., phase identification) 305
324/71.1 Determining nonelectric properties by measuring electric properties 692
324/72 Testing potential in specific environment (e.g., lightning stroke) 456
324/73.1 Plural, automatically sequential tests 1,078
324/74 Testing and calibrating electric meters (e.g., watt-hour meters) 205
324/76.11 Measuring, testing, or sensing electricity, per se 578
324/800 Divining rods 1


Patents under this class:

Patent Number Title Of Patent Date Issued
8709834 Methods of fabricating semiconductor device Apr. 29, 2014
8710860 Method and system for testing indirect bandgap semiconductor devices using luminescence imaging Apr. 29, 2014
8709833 Measuring current and resistance using combined diodes/resistor structure to monitor integrated circuit manufacturing process variations Apr. 29, 2014
8704224 Semiconductor test structures Apr. 22, 2014
8692571 Apparatus and method for measuring degradation of CMOS VLSI elements Apr. 8, 2014
8689067 Control of clock gate cells during scan testing Apr. 1, 2014
8686779 Calibration of linear time-invariant system's step response Apr. 1, 2014
8686750 Method for evaluating semiconductor device Apr. 1, 2014
8686749 Thermal interface material, test structure and method of use Apr. 1, 2014
8680843 Magnetic field current sensors Mar. 25, 2014
8680883 Time dependent dielectric breakdown (TDDB) test structure of semiconductor device and method of performing TDDB test using the same Mar. 25, 2014
8674355 Integrated circuit test units with integrated physical and electrical test regions Mar. 18, 2014
8674718 Built off testing apparatus Mar. 18, 2014
8669775 Scribe line test modules for in-line monitoring of context dependent effects for ICs including MOS devices Mar. 11, 2014
8667345 Burn-in method for embedded multi media card, and test board using the same, and embedded multi media card tested by the same Mar. 4, 2014
8664978 Methods and apparatus for time to current conversion Mar. 4, 2014
8664971 Method of testing functioning of a semiconductor device Mar. 4, 2014
8664970 Method for accelerated lifetesting of large area OLED lighting panels Mar. 4, 2014
8653847 Testable integrated circuit, system in package and test instruction set Feb. 18, 2014
8655350 Semiconductor storage device and storage system Feb. 18, 2014
8648617 Semiconductor device and method of testing semiconductor device Feb. 11, 2014
8648618 Method and module for judging status of power supplies Feb. 11, 2014
8643395 Crosstalk suppression in wireless testing of semiconductor devices Feb. 4, 2014
8643539 Advance manufacturing monitoring and diagnostic tool Feb. 4, 2014
8633726 Semiconductor device evaluation apparatus and semiconductor device evaluation method Jan. 21, 2014
8633725 Scan or JTAG controllable capture clock generation Jan. 21, 2014
8624618 Apparatus and method for inspecting circuit of substrate Jan. 7, 2014
8624619 Semiconductor device and method of performing electrical test on same Jan. 7, 2014
8624620 Test system and write wafer Jan. 7, 2014
8618826 Method and apparatus for de-embedding Dec. 31, 2013
8618827 Measurement of electrical and mechanical characteristics of low-K dielectric in a semiconductor device Dec. 31, 2013
8621297 Scan path switches selectively connecting input buffer and test leads Dec. 31, 2013
8614591 Mother substrate of organic light emitting displays capable of sheet unit testing and method of sheet unit testing Dec. 24, 2013
8614583 Voltage detection circuit Dec. 24, 2013
8610448 One-sheet test device and test method thereof Dec. 17, 2013
8610449 Wafer unit for testing and test system Dec. 17, 2013
8610451 Post silicide testing for replacement high-k metal gate technologies Dec. 17, 2013
8604813 Built-off test device and test system including the same Dec. 10, 2013
8604815 Pin electronics circuit Dec. 10, 2013
8607109 Test circuitry including core output, expected response, and mask circuitry Dec. 10, 2013
8598899 Built-in test for an overvoltage protection circuit Dec. 3, 2013
8598891 Detection and mitigation of particle contaminants in MEMS devices Dec. 3, 2013
8593166 Semiconductor wafer, semiconductor circuit, substrate for testing and test system Nov. 26, 2013
8593167 Semiconductor device test method and apparatus, and semiconductor device Nov. 26, 2013
8593168 Semiconductor device Nov. 26, 2013
8593169 Frequency specific closed loop feedback control of integrated circuits Nov. 26, 2013
8586982 Semiconductor test chip device to mimic field thermal mini-cycles to assess reliability Nov. 19, 2013
8586983 Semiconductor chip embedded with a test circuit Nov. 19, 2013
8582378 Threshold voltage measurement device Nov. 12, 2013
8581613 Transmission-modulated photoconductive decay measurement system Nov. 12, 2013











 
 
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