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Class Information
Number: 324/761
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements > Pin
Description: Subject matter wherein the probe element is a connecting device such as a spring biased rod or a buckling beam (rod).
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7616016 |
Probe card assembly and kit |
Nov. 10, 2009 |
| 7616015 |
Wafer type probe card, method for fabricating the same, and semiconductor test apparatus having the same |
Nov. 10, 2009 |
| 7616019 |
Low profile electronic assembly test fixtures |
Nov. 10, 2009 |
| 7612572 |
Probe and method of manufacturing a probe |
Nov. 3, 2009 |
| 7605582 |
Modular interface |
Oct. 20, 2009 |
| 7602199 |
Mini-prober for TFT-LCD testing |
Oct. 13, 2009 |
| 7602203 |
Probe and probe card |
Oct. 13, 2009 |
| 7598756 |
Inspection device and inspection method |
Oct. 6, 2009 |
| 7598757 |
Double ended contact probe |
Oct. 6, 2009 |
| 7593872 |
Method and system for designing a probe card |
Sep. 22, 2009 |
| 7592821 |
Apparatus and method for managing thermally induced motion of a probe card assembly |
Sep. 22, 2009 |
| 7592822 |
Probing adapter for a signal acquisition probe having pivoting, compliant, variable spacing probing tips |
Sep. 22, 2009 |
| 7585548 |
Integrated compound nano probe card and method of making same |
Sep. 8, 2009 |
| 7586316 |
Probe board mounting apparatus |
Sep. 8, 2009 |
| 7586318 |
Differential measurement probe having a ground clip system for the probing tips |
Sep. 8, 2009 |
| 7586320 |
Plunger and chip-testing module applying the same |
Sep. 8, 2009 |
| 7579855 |
Method for manufacturing electrical contact element for testing electronic device and electrical contact element manufactured thereby |
Aug. 25, 2009 |
| 7570069 |
Resilient contact probes |
Aug. 4, 2009 |
| 7567089 |
Two-part microprobes for contacting electronic components and methods for making such probes |
Jul. 28, 2009 |
| 7564252 |
Semiconductor inspection apparatus |
Jul. 21, 2009 |
| 7560944 |
Differential measurement probe having a ground clip system for the probing tips |
Jul. 14, 2009 |
| 7557595 |
Cantilever microprobes for contacting electronic components and methods for making such probes |
Jul. 7, 2009 |
| 7546670 |
Method for producing thermally matched probe assembly |
Jun. 16, 2009 |
| 7545159 |
Electrical test probes with a contact element, methods of making and using the same |
Jun. 9, 2009 |
| 7538568 |
Spring loaded probe pin |
May. 26, 2009 |
| 7538566 |
Electrical test system including coaxial cables |
May. 26, 2009 |
| 7538565 |
High density integrated circuit apparatus, test probe and methods of use thereof |
May. 26, 2009 |
| 7538567 |
Probe card with balanced lateral force |
May. 26, 2009 |
| 7535241 |
Test probe with hollow tubular contact with bullet-nosed configuration at one end and crimped configuration on other end |
May. 19, 2009 |
| 7525299 |
Apparatus for accessing and probing the connections between a chip package and a printed circuit board |
Apr. 28, 2009 |
| 7525328 |
Cap at resistors of electrical test probe |
Apr. 28, 2009 |
| 7521949 |
Test pin, method of manufacturing same, and system containing same |
Apr. 21, 2009 |
| 7514948 |
Vertical probe array arranged to provide space transformation |
Apr. 7, 2009 |
| 7514943 |
Coordinate transforming apparatus for electrical signal connection |
Apr. 7, 2009 |
| 7511518 |
Method of making an interposer |
Mar. 31, 2009 |
| 7511523 |
Cantilever microprobes for contacting electronic components and methods for making such probes |
Mar. 31, 2009 |
| 7501838 |
Contact assembly and LSI chip inspecting device using the same |
Mar. 10, 2009 |
| 7501839 |
Interposer and test assembly for testing electronic devices |
Mar. 10, 2009 |
| 7501841 |
Probe assembly with multi-directional freedom of motion and mounting assembly therefor |
Mar. 10, 2009 |
| 7502963 |
Optimization by using output drivers for discrete input interface |
Mar. 10, 2009 |
| 7492177 |
Bendable conductive connector |
Feb. 17, 2009 |
| 7492174 |
Testing apparatus for surface mounted connectors |
Feb. 17, 2009 |
| 7492172 |
Chuck for holding a device under test |
Feb. 17, 2009 |
| 7489149 |
Shielded probe for testing a device under test |
Feb. 10, 2009 |
| 7482822 |
Apparatus and method for limiting over travel in a probe card assembly |
Jan. 27, 2009 |
| 7482823 |
Shielded probe for testing a device under test |
Jan. 27, 2009 |
| 7479780 |
Tester for in-circuit testing bed of nails fixture and testing circuit thereof |
Jan. 20, 2009 |
| 7477062 |
LSI test socket for BGA |
Jan. 13, 2009 |
| 7477066 |
Universal grid composite circuit board testing tool |
Jan. 13, 2009 |
| 7477065 |
Method for fabricating a plurality of elastic probes in a row |
Jan. 13, 2009 |
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