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Browse by Category: Main > Electrical & Energy
Class Information
Number: 324/761
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements > Pin
Description: Subject matter wherein the probe element is a connecting device such as a spring biased rod or a buckling beam (rod).










Patents under this class:
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Patent Number Title Of Patent Date Issued
7804314 Adjustable electrical probes for circuit breaker tester Sep. 28, 2010
7800386 Contact device and method for producing the same Sep. 21, 2010
7800388 Curved spring structure with elongated section located under cantilevered section Sep. 21, 2010
7795890 Reduced ground spring probe array and method for controlling signal spring probe impedance Sep. 14, 2010
7795888 Contact device to contact an electrical test specimen to be tested and a corresponding contact process Sep. 14, 2010
7795889 Probe device Sep. 14, 2010
7795892 Probe card Sep. 14, 2010
7786743 Probe tile for probing semiconductor wafer Aug. 31, 2010
7786740 Probe cards employing probes having retaining portions for potting in a potting region Aug. 31, 2010
7782070 Probing device Aug. 24, 2010
7777509 Method and apparatus for electrical testing Aug. 17, 2010
7772865 Probe for testing integrated circuit devices Aug. 10, 2010
7772864 Contact probe with reduced voltage drop and heat generation Aug. 10, 2010
7768283 Universal socketless test fixture Aug. 3, 2010
7768282 Apparatus and method for terminating probe apparatus of semiconductor wafer Aug. 3, 2010
7764074 Probe of detector for testing pins of electronic component Jul. 27, 2010
7764077 Semiconductor device including semiconductor evaluation element, and evaluation method using semiconductor device Jul. 27, 2010
7759949 Probes with self-cleaning blunt skates for contacting conductive pads Jul. 20, 2010
7759953 Active wafer probe Jul. 20, 2010
7759950 Electronic component device testing apparatus Jul. 20, 2010
7746090 System for testing connections of two connectors Jun. 29, 2010
7740508 Probe block assembly Jun. 22, 2010
7737711 Test apparatus having pogo probes for chip scale package Jun. 15, 2010
7737710 Socket, and test apparatus and method using the socket Jun. 15, 2010
7737708 Contact for use in testing integrated circuits Jun. 15, 2010
7733102 Ultra-fine area array pitch probe card Jun. 8, 2010
7733101 Knee probe having increased scrub motion Jun. 8, 2010
7728609 Replaceable probe apparatus for probing semiconductor wafer Jun. 1, 2010
7728613 Device under test pogo pin type contact element Jun. 1, 2010
7724009 Method of making high-frequency probe, probe card using the high-frequency probe May. 25, 2010
7724006 Probe card, manufacturing method of probe card, semiconductor inspection apparatus and manufacturing method of semiconductor device May. 25, 2010
7719296 Inspection contact structure and probe card May. 18, 2010
7710106 Temporary planar electrical contact device and method using vertically-compressible nanotube contact structures May. 4, 2010
7699616 High density planar electrical interface Apr. 20, 2010
7692433 Sawing tile corners on probe card substrates Apr. 6, 2010
7692435 Probe card and probe device for inspection of a semiconductor device Apr. 6, 2010
7692436 Probe card substrate with bonded via Apr. 6, 2010
7692438 Bimetallic probe with tip end Apr. 6, 2010
7688093 Sharing conversion board for testing chips Mar. 30, 2010
7683646 Probe card and method of producing the same by a fine inkjet process Mar. 23, 2010
7683647 Instrument per pin test head Mar. 23, 2010
7675305 Vertical-type electric contactor and manufacture method thereof Mar. 9, 2010
7675304 Probe assembly with multi-directional freedom of motion and mounting assembly therefor Mar. 9, 2010
7675302 Probe card assembly and method of attaching probes to the probe card assembly Mar. 9, 2010
7675299 Method and apparatus for making a determination relating to resistance of probes Mar. 9, 2010
7671616 Semiconductor probe having embossed resistive tip and method of fabricating the same Mar. 2, 2010
7663386 Probe card Feb. 16, 2010
7663387 Test socket Feb. 16, 2010
7659739 Knee probe having reduced thickness section for control of scrub motion Feb. 9, 2010
7659736 Mechanically reconfigurable vertical tester interface for IC probing Feb. 9, 2010

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