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Class Information
Number: 324/760
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements > With temperature control
Description: Subject matter including means to regulate temperature of the DUT or an apparatus used in testing.

Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16

Patent Number Title Of Patent Date Issued
7804291 Semiconductor test device with heating circuit Sep. 28, 2010
7804316 Pusher, pusher unit and semiconductor testing apparatus Sep. 28, 2010
7804318 Burning system having optic-electric transformer and comparator circuit and method for burning liquid crystal display Sep. 28, 2010
7795896 High-power optical burn-in Sep. 14, 2010
7791363 Low temperature probing apparatus Sep. 7, 2010
7791362 Inspection apparatus Sep. 7, 2010
7777510 Wafer inspecting apparatus, wafer inspecting method and computer program Aug. 17, 2010
7772863 Mechanical decoupling of a probe card assembly to improve thermal response Aug. 10, 2010
7768285 Probe card for semiconductor IC test and method of manufacturing the same Aug. 3, 2010
7768286 Electronic device testing apparatus and temperature control method in an electronic device testing apparatus Aug. 3, 2010
7765412 Methods and systems for dynamically changing device operating conditions Jul. 27, 2010
7750655 Multilayer substrate and probe card Jul. 6, 2010
7750654 Probe method, prober, and electrode reducing/plasma-etching processing mechanism Jul. 6, 2010
7737713 Apparatus for hot-probing integrated semiconductor circuits on wafers Jun. 15, 2010
7723980 Fully tested wafers having bond pads undamaged by probing and applications thereof May. 25, 2010
7719298 Full-wafer test and burn-in mechanism May. 18, 2010
7714599 Integrated circuit burn-in test system and associated methods May. 11, 2010
7714602 Socket for connecting ball-grid-array integrated circuit device to test circuit May. 11, 2010
7701237 Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device, and probe card used for burn-in stress and D/S tests Apr. 20, 2010
7696769 Method of obtaining accurately a heat-dissipating requirement for electronic systems Apr. 13, 2010
7696768 On-die heating circuit and control loop for rapid heating of the die Apr. 13, 2010
7692442 Apparatus for detecting a current and temperature for an integrated circuit Apr. 6, 2010
7688063 Apparatus and method for adjusting thermally induced movement of electro-mechanical assemblies Mar. 30, 2010
7689887 Automatic shutdown or throttling of a BIST state machine using thermal feedback Mar. 30, 2010
7683649 Testing system contactor Mar. 23, 2010
7675306 Prober apparatus and operating method therefor Mar. 9, 2010
7675307 Heating apparatus for semiconductor devices Mar. 9, 2010
7671615 Method and apparatus for controlling the temperature of electronic components Mar. 2, 2010
7667476 Measuring module for rapid measurement of electrical, electronic and mechanical components at cryogenic temperatures and measuring device having such a module Feb. 23, 2010
7667474 Probe device Feb. 23, 2010
7667475 Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion Feb. 23, 2010
7663389 Automated test equipment with DIB mounted three dimensional tester electronics bricks Feb. 16, 2010
7663388 Active thermal control unit for maintaining the set point temperature of a DUT Feb. 16, 2010
7663390 Inspection apparatus and method Feb. 16, 2010
7659738 Test sockets having peltier elements, test equipment including the same and methods of testing semiconductor packages using the same Feb. 9, 2010
7656180 Burn-in board connection device and method Feb. 2, 2010
7656152 Pusher for match plate of test handler Feb. 2, 2010
7652491 Probe support with shield for the examination of test substrates under use of probe supports Jan. 26, 2010
7649371 Thermal stratification methods Jan. 19, 2010
7649374 Temperature control in an integrated circuit Jan. 19, 2010
7642794 Method and system for compensating thermally induced motion of probe cards Jan. 5, 2010
7642795 Drive method and drive circuit of peltier element, attaching structure of peltier module and electronic device handling apparatus Jan. 5, 2010
7642800 Wafer test system wherein period of high voltage stress test of one chip overlaps period of function test of other chip Jan. 5, 2010
7639030 Creating a jet impingement pattern for a thermal control system Dec. 29, 2009
7639029 Heat sink pedestal with interface medium chamber Dec. 29, 2009
7633307 Method for determining temperature profile in semiconductor manufacturing test Dec. 15, 2009
7629805 Method and system to dynamically compensate for probe tip misalignement when testing integrated circuits Dec. 8, 2009
7626407 Miniature fluid-cooled heat sink with integral heater Dec. 1, 2009
7622936 Contact device for touch contacting an electrical test specimen, and corresponding method Nov. 24, 2009
7620519 Burn-in process of producing data correlating elevation of disk drive head to temperature and method of controlling the elevation of the disk drive head using the data Nov. 17, 2009

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