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Class Information
Number: 324/760
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements > With temperature control
Description: Subject matter including means to regulate temperature of the DUT or an apparatus used in testing.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7619426 |
Performance board and cover member |
Nov. 17, 2009 |
| 7619427 |
Temperature control device and temperature control method |
Nov. 17, 2009 |
| 7619428 |
Wafer level burn-in and electrical test system and method |
Nov. 17, 2009 |
| 7620519 |
Burn-in process of producing data correlating elevation of disk drive head to temperature and method of controlling the elevation of the disk drive head using the data |
Nov. 17, 2009 |
| 7616018 |
Integrated circuit probing apparatus having a temperature-adjusting mechanism |
Nov. 10, 2009 |
| 7616017 |
Probe station thermal chuck with shielding for capacitive current |
Nov. 10, 2009 |
| 7598722 |
Method and apparatus for sensing temperature |
Oct. 6, 2009 |
| 7595652 |
System and method for reducing heat dissipation during burn-in |
Sep. 29, 2009 |
| 7592821 |
Apparatus and method for managing thermally induced motion of a probe card assembly |
Sep. 22, 2009 |
| 7589551 |
On-wafer AC stress test circuit |
Sep. 15, 2009 |
| 7589546 |
Inspection apparatus and method for semiconductor IC |
Sep. 15, 2009 |
| 7589545 |
Device for final inspection |
Sep. 15, 2009 |
| 7579854 |
Probe station and method for measurements of semiconductor devices under defined atmosphere |
Aug. 25, 2009 |
| 7576553 |
Integrated circuit probing apparatus having a temperature-adjusting mechanism |
Aug. 18, 2009 |
| 7567090 |
Liquid recovery, collection method and apparatus in a non-recirculating test and burn-in application |
Jul. 28, 2009 |
| 7564253 |
Temperature characteristic inspection device |
Jul. 21, 2009 |
| 7560950 |
Packaging reliability superchips |
Jul. 14, 2009 |
| 7558064 |
Cooling apparatus |
Jul. 7, 2009 |
| 7554323 |
Direct facility water test head cooling architecture |
Jun. 30, 2009 |
| 7554349 |
Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environments |
Jun. 30, 2009 |
| 7554350 |
Burn-in system with heating blocks accommodated in cooling blocks |
Jun. 30, 2009 |
| 7549794 |
In-furnace temperature measuring method |
Jun. 23, 2009 |
| 7548080 |
Method and apparatus for burn-in optimization |
Jun. 16, 2009 |
| 7548081 |
System and method for controlling environmental parameters of a device under test |
Jun. 16, 2009 |
| 7541828 |
Burn-in sorter and sorting method using the same |
Jun. 2, 2009 |
| 7541824 |
Forced air cooling of components on a probecard |
Jun. 2, 2009 |
| 7541822 |
Wafer burn-in and text employing detachable cartridge |
Jun. 2, 2009 |
| 7536571 |
System and method to maintain data processing system operation in degraded system cooling condition |
May. 19, 2009 |
| 7532023 |
Apparatus and methods for self-heating burn-in processes |
May. 12, 2009 |
| 7518389 |
Interface assembly and dry gas enclosing apparatus using same |
Apr. 14, 2009 |
| 7514946 |
Semiconductor carrier tray, and burn-in board, burn-in test method, and semiconductor manufacturing method using the semiconductor carrier tray |
Apr. 7, 2009 |
| 7514947 |
Method of and system for functionally testing multiple devices in parallel in a burn-in-environment |
Apr. 7, 2009 |
| 7504845 |
Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis |
Mar. 17, 2009 |
| 7501844 |
Liquid cooled DUT card interface for wafer sort probing |
Mar. 10, 2009 |
| 7498830 |
Burn-in apparatus |
Mar. 3, 2009 |
| 7498831 |
Conduction-cooled accelerated test fixture |
Mar. 3, 2009 |
| 7495460 |
Body for keeping a wafer, heater unit and wafer prober |
Feb. 24, 2009 |
| 7492176 |
Prober and probe contact method |
Feb. 17, 2009 |
| 7489150 |
Apparatus and methods for self-heating burn-in processes |
Feb. 10, 2009 |
| 7482825 |
Burn-in testing apparatus and method |
Jan. 27, 2009 |
| 7479795 |
Temperature control apparatus |
Jan. 20, 2009 |
| 7479796 |
Functional and stress testing of LGA devices |
Jan. 20, 2009 |
| 7471100 |
Semiconductor integrated circuit tester with interchangeable tester module |
Dec. 30, 2008 |
| 7472038 |
Method of predicting microprocessor lifetime reliability using architecture-level structure-aware techniques |
Dec. 30, 2008 |
| 7466155 |
Functional and stress testing of LGA devices |
Dec. 16, 2008 |
| 7463017 |
Functional and stress testing of LGA devices |
Dec. 9, 2008 |
| 7457117 |
System for controlling the temperature of electronic devices |
Nov. 25, 2008 |
| 7456644 |
Functional and stress testing of LGA devices |
Nov. 25, 2008 |
| 7453277 |
Apparatus for full-wafer test and burn-in mechanism |
Nov. 18, 2008 |
| 7453279 |
Functional and stress testing of LGA devices |
Nov. 18, 2008 |
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