| |
 |
|
Class Information
Number: 324/759
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements > With recording of test results on dut
Description: Subject matter including means for receiving the results of a test on the DUT.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7555358 |
Process and method for continuous, non lot-based integrated circuit manufacturing |
Jun. 30, 2009 |
| 7543198 |
Test data reporting and analyzing using data array and related data analysis |
Jun. 2, 2009 |
| 7453932 |
Test device and setting method |
Nov. 18, 2008 |
| 7417449 |
Wafer stage storage structure speed testing |
Aug. 26, 2008 |
| 7404117 |
Component testing and recovery |
Jul. 22, 2008 |
| 7307528 |
RFID tag design with circuitry for wafer level testing |
Dec. 11, 2007 |
| 7265568 |
Semi-conductor component test process and a system for testing semi-conductor components |
Sep. 4, 2007 |
| 7230442 |
Semi-conductor component testing process and system for testing semi-conductor components |
Jun. 12, 2007 |
| 7042007 |
Semiconductor device and method for evaluating characteristics of the same |
May. 9, 2006 |
| 6891389 |
System and method for detecting quiescent current in an integrated circuit |
May. 10, 2005 |
| 6870382 |
System and method for evaluating the planarity and parallelism of an array of probe tips |
Mar. 22, 2005 |
| 6842025 |
Apparatus and method for multiple identical continuous records of characteristics on the surface of an object after selected stages of manufacture and treatment |
Jan. 11, 2005 |
| 6806724 |
Probe for combined signals |
Oct. 19, 2004 |
| 6801099 |
Methods for bi-directional signaling |
Oct. 5, 2004 |
| 6784683 |
Circuit configuration for selectively transmitting information items from a measuring device to chips on a wafer during chip fabrication |
Aug. 31, 2004 |
| 6759854 |
Test apparatus for testing devices under test and method for transmitting a test signal |
Jul. 6, 2004 |
| 6750666 |
Automated multi-chip module handler and testing system |
Jun. 15, 2004 |
| 6750672 |
Semiconductor inspecting system for inspecting a semiconductor integrated circuit device, and semiconductor inspecting method using the same |
Jun. 15, 2004 |
| 6724205 |
Probe for combined signals |
Apr. 20, 2004 |
| 6662323 |
Fast error diagnosis for combinational verification |
Dec. 9, 2003 |
| 6617871 |
Methods and apparatus for bi-directional signaling |
Sep. 9, 2003 |
| 6612022 |
Printed circuit board including removable auxiliary area with test points |
Sep. 2, 2003 |
| 6597188 |
Ground land for singulated ball grid array |
Jul. 22, 2003 |
| 6573743 |
Testing apparatus for test piece, testing method, contactor and method of manufacturing the same |
Jun. 3, 2003 |
| 6525657 |
Apparatus and method for production testing of the RF performance of wireless communications devices |
Feb. 25, 2003 |
| 6521467 |
Characterizing semiconductor wafers with enhanced S parameter contour mapping |
Feb. 18, 2003 |
| 6470480 |
Tracing different states reached by a signal in a functional verification system |
Oct. 22, 2002 |
| 6448525 |
Capacitor characteristics measurement and packing apparatus |
Sep. 10, 2002 |
| 6445199 |
Methods and apparatus for generating spatially resolved voltage contrast maps of semiconductor test structures |
Sep. 3, 2002 |
| 6427092 |
Method for continuous, non lot-based integrated circuit manufacturing |
Jul. 30, 2002 |
| 6424165 |
Electrostatic apparatus for measurement of microfracture strength |
Jul. 23, 2002 |
| 6380755 |
Testing apparatus for test piece testing method contactor and method of manufacturing the same |
Apr. 30, 2002 |
| 6211689 |
Method for testing semiconductor device and semiconductor device with transistor circuit for marking |
Apr. 3, 2001 |
| 6049203 |
Apparatus and method for testing an inker of the semiconductor wafer probe station |
Apr. 11, 2000 |
| 6025733 |
Semiconductor memory device |
Feb. 15, 2000 |
| 5994911 |
Method and apparatus testing IC chips for damage during fabrication |
Nov. 30, 1999 |
| 5936420 |
Semiconductor inspecting apparatus |
Aug. 10, 1999 |
| 5523698 |
System for making tested printed circuit boards in circuit board testing machines |
Jun. 4, 1996 |
| 5496450 |
Multiple on-line sensor systems and methods |
Mar. 5, 1996 |
| 5465850 |
Integrated circuit test system |
Nov. 14, 1995 |
| 5416428 |
Marker probe |
May. 16, 1995 |
| 5132615 |
Detecting presence of N+ diffusion faults in a micropackage containing a plurality of integrated circuits by analyzing V.sub.ref current |
Jul. 21, 1992 |
| 5043657 |
Marking techniques for identifying integrated circuit parts at the time of testing |
Aug. 27, 1991 |
| 5023545 |
Circuit probing system |
Jun. 11, 1991 |
| 5003251 |
Bar code reader for printed circuit board |
Mar. 26, 1991 |
| 4965515 |
Apparatus and method of testing a semiconductor wafer |
Oct. 23, 1990 |
| 4961053 |
Circuit arrangement for testing integrated circuit components |
Oct. 2, 1990 |
| 4568879 |
Marking apparatus |
Feb. 4, 1986 |
| 3931892 |
Component handler with fluid controlled memory |
Jan. 13, 1976 |
|
|
|
