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Class Information
Number: 324/758
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements > Probe alignment or positioning
Description: Subject matter including a feature for checking or providing for proper position of probes with respect to contact points on the DUT.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7609078 |
Contact alignment verification/adjustment fixture |
Oct. 27, 2009 |
| 7602203 |
Probe and probe card |
Oct. 13, 2009 |
| 7602200 |
Probe for electrical test comprising a positioning mark and probe assembly |
Oct. 13, 2009 |
| 7598725 |
Alignment receptacle of a sensor adapted to interact with a pin to generate position data along at least two transverse axes for docking a test head |
Oct. 6, 2009 |
| 7592817 |
Alignment correction system and method of use |
Sep. 22, 2009 |
| 7592796 |
Plate with an indicator for discerning among pre-identified probe holes in the plate |
Sep. 22, 2009 |
| 7589544 |
Probe test apparatus |
Sep. 15, 2009 |
| 7589543 |
Probe card having a conductive thin film on the surface of an insulating film behind each of the alignment marks each marks comprises a plurality of second bumps |
Sep. 15, 2009 |
| 7586319 |
Methods of retaining semiconductor component configurations within sockets |
Sep. 8, 2009 |
| 7583101 |
Probing structure with fine pitch probes |
Sep. 1, 2009 |
| 7583099 |
Method for re-registering an object to be aligned by re-capturing images using previously registered conditions and storage medium storing a program for executing the method |
Sep. 1, 2009 |
| 7583097 |
Contactor nest for an IC device and method |
Sep. 1, 2009 |
| 7583098 |
Automated probe card planarization and alignment methods and tools |
Sep. 1, 2009 |
| 7579853 |
Apparatus for obtaining planarity measurements with respect to a probe card analysis system |
Aug. 25, 2009 |
| 7577517 |
Guided vehicle system and teaching method in the guided vehicle system |
Aug. 18, 2009 |
| 7573276 |
Probe card layout |
Aug. 11, 2009 |
| 7573280 |
Semiconductor device, method and apparatus for testing same, and method for manufacturing semiconductor device |
Aug. 11, 2009 |
| 7573283 |
Method for measurement of a device under test |
Aug. 11, 2009 |
| 7557594 |
Automated contact alignment tool |
Jul. 7, 2009 |
| 7554348 |
Multi-offset die head |
Jun. 30, 2009 |
| 7538567 |
Probe card with balanced lateral force |
May. 26, 2009 |
| 7535240 |
Semiconductor device |
May. 19, 2009 |
| 7521915 |
Wafer bevel particle detection |
Apr. 21, 2009 |
| 7518358 |
Chuck for holding a device under test |
Apr. 14, 2009 |
| 7513036 |
Method of controlling contact load in electronic component mounting apparatus |
Apr. 7, 2009 |
| 7514915 |
Chuck for holding a device under test |
Apr. 7, 2009 |
| 7514943 |
Coordinate transforming apparatus for electrical signal connection |
Apr. 7, 2009 |
| 7514945 |
Systems configured for utilizing semiconductor components |
Apr. 7, 2009 |
| 7511269 |
Method of approaching probe and apparatus for realizing the same |
Mar. 31, 2009 |
| 7511522 |
Electronic device test apparatus |
Mar. 31, 2009 |
| 7504844 |
Inspection apparatus and method |
Mar. 17, 2009 |
| 7501843 |
Movement amount operation correction method for prober, movement amount operation correction processing program, and prober |
Mar. 10, 2009 |
| 7498800 |
Methods and apparatus for rotationally accessed tester interface |
Mar. 3, 2009 |
| 7492172 |
Chuck for holding a device under test |
Feb. 17, 2009 |
| 7492176 |
Prober and probe contact method |
Feb. 17, 2009 |
| 7492174 |
Testing apparatus for surface mounted connectors |
Feb. 17, 2009 |
| 7489148 |
Methods for access to a plurality of unsingulated integrated circuits of a wafer using single-sided edge-extended wafer translator |
Feb. 10, 2009 |
| 7486090 |
Testing device |
Feb. 3, 2009 |
| 7486094 |
Apparatus for testing un-moulded IC devices using air flow system and the method of using the same |
Feb. 3, 2009 |
| 7477064 |
Probing apparatus and positional deviation acquiring method |
Jan. 13, 2009 |
| 7474104 |
Wafer-to-wafer alignments |
Jan. 6, 2009 |
| 7471095 |
Electrical connecting apparatus and method for use thereof |
Dec. 30, 2008 |
| 7471078 |
Stiffener assembly for use with testing devices |
Dec. 30, 2008 |
| 7466122 |
Test head docking system and method |
Dec. 16, 2008 |
| 7463043 |
Methods of probing an electronic device |
Dec. 9, 2008 |
| 7463044 |
Adapter for positioning of contact tips |
Dec. 9, 2008 |
| 7463764 |
Probe area setting method and probe device |
Dec. 9, 2008 |
| 7463015 |
Time shifting signal acquisition probe system |
Dec. 9, 2008 |
| 7459924 |
Apparatus for providing electrical access to one or more pads of the wafer using a wafer translator and a gasket |
Dec. 2, 2008 |
| 7453261 |
Method of and system for monitoring the functionality of a wafer probe site |
Nov. 18, 2008 |
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