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Class Information
Number: 324/757
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements > Probe contact enhancement
Description: Subject matter including a feature for aiding the probe to make proper contact.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 6727719 |
Piercer combined prober for CU interconnect water-level preliminary electrical test |
Apr. 27, 2004 |
| 6727714 |
Probe card |
Apr. 27, 2004 |
| 6724199 |
Pin and cup devices for measuring film thickness |
Apr. 20, 2004 |
| 6717423 |
Substrate impedance measurement |
Apr. 6, 2004 |
| 6714029 |
Contact pin for testing microelectronic components having substantially spherical contacts |
Mar. 30, 2004 |
| 6708399 |
Method for fabricating a test interconnect for bumped semiconductor components |
Mar. 23, 2004 |
| 6690284 |
Method of controlling IC handler and control system using the same |
Feb. 10, 2004 |
| 6683466 |
Piston for module test |
Jan. 27, 2004 |
| 6667626 |
Probe card, and testing apparatus having the same |
Dec. 23, 2003 |
| 6646456 |
Conductive material for integrated circuit fabrication |
Nov. 11, 2003 |
| 6640415 |
Segmented contactor |
Nov. 4, 2003 |
| 6642731 |
Probe structure and manufacturing method thereof |
Nov. 4, 2003 |
| 6636054 |
Low capacitance probe contact |
Oct. 21, 2003 |
| 6628133 |
Methods of testing integrated circuitry |
Sep. 30, 2003 |
| 6621261 |
Work inspection apparatus |
Sep. 16, 2003 |
| 6618842 |
Prototype development system and method |
Sep. 9, 2003 |
| 6603297 |
Probe tip adapter for a measurement probe |
Aug. 5, 2003 |
| 6577145 |
Unit with inspection probe blocks mounted thereon in parallel |
Jun. 10, 2003 |
| 6573702 |
Method and apparatus for cleaning electronic test contacts |
Jun. 3, 2003 |
| 6545363 |
Contactor having conductive particles in a hole as a contact electrode |
Apr. 8, 2003 |
| 6535010 |
Checker head and a method of manufacturing the same |
Mar. 18, 2003 |
| 6529026 |
Method for fabricating an interconnect for making temporary electrical connections to semiconductor components |
Mar. 4, 2003 |
| 6529024 |
Probe stylus |
Mar. 4, 2003 |
| 6529025 |
Electrical continuity enhancement for sockets/contactors |
Mar. 4, 2003 |
| 6518781 |
Probe structure and manufacturing method thereof |
Feb. 11, 2003 |
| 6518784 |
Test method using semiconductor test apparatus |
Feb. 11, 2003 |
| 6515358 |
Integrated passivation process, probe geometry and probing process |
Feb. 4, 2003 |
| 6515498 |
Apparatus and method for pressing prober |
Feb. 4, 2003 |
| 6512386 |
Device testing contactor, method of producing the same, and device testing carrier |
Jan. 28, 2003 |
| 6509754 |
CPU adapter for a motherboard test machine |
Jan. 21, 2003 |
| 6504389 |
Test carrier for packaging semiconductor components having contact balls and calibration carrier for calibrating semiconductor test systems |
Jan. 7, 2003 |
| 6501291 |
Testing base for semiconductor devices |
Dec. 31, 2002 |
| 6501279 |
Electrical connection box, a positioning method and a testing device for the same |
Dec. 31, 2002 |
| 6498503 |
Semiconductor test interconnect with variable flexure contacts |
Dec. 24, 2002 |
| 6489792 |
Charge-up measuring apparatus |
Dec. 3, 2002 |
| 6486688 |
Semiconductor device testing apparatus having a contact sheet and probe for testing high frequency characteristics |
Nov. 26, 2002 |
| 6483330 |
Method for selecting components for a matched set using wafer interposers |
Nov. 19, 2002 |
| 6480015 |
Circuit probing methods |
Nov. 12, 2002 |
| 6476626 |
Probe contact system having planarity adjustment mechanism |
Nov. 5, 2002 |
| 6462528 |
Method and apparatus for probing a conductor of an array of closely-spaced conductors |
Oct. 8, 2002 |
| 6462573 |
System interface assembly and method |
Oct. 8, 2002 |
| 6462571 |
Engagement probes |
Oct. 8, 2002 |
| 6462568 |
Conductive polymer contact system and test method for semiconductor components |
Oct. 8, 2002 |
| 6447328 |
Method and apparatus for retaining a spring probe |
Sep. 10, 2002 |
| 6441629 |
Probe contact system having planarity adjustment mechanism |
Aug. 27, 2002 |
| 6437591 |
Test interconnect for bumped semiconductor components and method of fabrication |
Aug. 20, 2002 |
| 6420891 |
Wafer prober for in-line cleaning probe card |
Jul. 16, 2002 |
| 6420887 |
Modulated space transformer for high density buckling beam probe and method for making the same |
Jul. 16, 2002 |
| 6420886 |
Membrane probe card |
Jul. 16, 2002 |
| 6414506 |
Interconnect for testing semiconductor dice having raised bond pads |
Jul. 2, 2002 |
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