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Browse by Category: Main > Electrical & Energy
Class Information
Number: 324/757
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements > Probe contact enhancement
Description: Subject matter including a feature for aiding the probe to make proper contact.










Patents under this class:
1 2 3 4 5 6 7 8 9

Patent Number Title Of Patent Date Issued
6727719 Piercer combined prober for CU interconnect water-level preliminary electrical test Apr. 27, 2004
6727714 Probe card Apr. 27, 2004
6724199 Pin and cup devices for measuring film thickness Apr. 20, 2004
6717423 Substrate impedance measurement Apr. 6, 2004
6714029 Contact pin for testing microelectronic components having substantially spherical contacts Mar. 30, 2004
6708399 Method for fabricating a test interconnect for bumped semiconductor components Mar. 23, 2004
6690284 Method of controlling IC handler and control system using the same Feb. 10, 2004
6683466 Piston for module test Jan. 27, 2004
6667626 Probe card, and testing apparatus having the same Dec. 23, 2003
6646456 Conductive material for integrated circuit fabrication Nov. 11, 2003
6640415 Segmented contactor Nov. 4, 2003
6642731 Probe structure and manufacturing method thereof Nov. 4, 2003
6636054 Low capacitance probe contact Oct. 21, 2003
6628133 Methods of testing integrated circuitry Sep. 30, 2003
6621261 Work inspection apparatus Sep. 16, 2003
6618842 Prototype development system and method Sep. 9, 2003
6603297 Probe tip adapter for a measurement probe Aug. 5, 2003
6577145 Unit with inspection probe blocks mounted thereon in parallel Jun. 10, 2003
6573702 Method and apparatus for cleaning electronic test contacts Jun. 3, 2003
6545363 Contactor having conductive particles in a hole as a contact electrode Apr. 8, 2003
6535010 Checker head and a method of manufacturing the same Mar. 18, 2003
6529026 Method for fabricating an interconnect for making temporary electrical connections to semiconductor components Mar. 4, 2003
6529024 Probe stylus Mar. 4, 2003
6529025 Electrical continuity enhancement for sockets/contactors Mar. 4, 2003
6518781 Probe structure and manufacturing method thereof Feb. 11, 2003
6518784 Test method using semiconductor test apparatus Feb. 11, 2003
6515358 Integrated passivation process, probe geometry and probing process Feb. 4, 2003
6515498 Apparatus and method for pressing prober Feb. 4, 2003
6512386 Device testing contactor, method of producing the same, and device testing carrier Jan. 28, 2003
6509754 CPU adapter for a motherboard test machine Jan. 21, 2003
6504389 Test carrier for packaging semiconductor components having contact balls and calibration carrier for calibrating semiconductor test systems Jan. 7, 2003
6501291 Testing base for semiconductor devices Dec. 31, 2002
6501279 Electrical connection box, a positioning method and a testing device for the same Dec. 31, 2002
6498503 Semiconductor test interconnect with variable flexure contacts Dec. 24, 2002
6489792 Charge-up measuring apparatus Dec. 3, 2002
6486688 Semiconductor device testing apparatus having a contact sheet and probe for testing high frequency characteristics Nov. 26, 2002
6483330 Method for selecting components for a matched set using wafer interposers Nov. 19, 2002
6480015 Circuit probing methods Nov. 12, 2002
6476626 Probe contact system having planarity adjustment mechanism Nov. 5, 2002
6462528 Method and apparatus for probing a conductor of an array of closely-spaced conductors Oct. 8, 2002
6462573 System interface assembly and method Oct. 8, 2002
6462571 Engagement probes Oct. 8, 2002
6462568 Conductive polymer contact system and test method for semiconductor components Oct. 8, 2002
6447328 Method and apparatus for retaining a spring probe Sep. 10, 2002
6441629 Probe contact system having planarity adjustment mechanism Aug. 27, 2002
6437591 Test interconnect for bumped semiconductor components and method of fabrication Aug. 20, 2002
6420891 Wafer prober for in-line cleaning probe card Jul. 16, 2002
6420887 Modulated space transformer for high density buckling beam probe and method for making the same Jul. 16, 2002
6420886 Membrane probe card Jul. 16, 2002
6414506 Interconnect for testing semiconductor dice having raised bond pads Jul. 2, 2002

1 2 3 4 5 6 7 8 9










 
 
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