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Class Information
Number: 324/757
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements > Probe contact enhancement
Description: Subject matter including a feature for aiding the probe to make proper contact.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7404124 |
On-chip sampling circuit and method |
Jul. 22, 2008 |
| 7398181 |
Method for retrieving reliability data in a system |
Jul. 8, 2008 |
| 7394265 |
Flat portions of a probe card flattened to have same vertical level with one another by compensating the unevenness of a substrate and each identical height needle being mounted on the corresp |
Jul. 1, 2008 |
| 7385412 |
Systems and methods for testing microfeature devices |
Jun. 10, 2008 |
| 7385407 |
Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
Jun. 10, 2008 |
| 7372286 |
Modular probe card |
May. 13, 2008 |
| 7319337 |
Method and apparatus for pad aligned multiprobe wafer testing |
Jan. 15, 2008 |
| 7319339 |
Inspection apparatus to break the oxide of an electrode by fritting phenomenon |
Jan. 15, 2008 |
| 7309996 |
Contactor for electronic components and test method using the same |
Dec. 18, 2007 |
| 7304489 |
Inspection method and inspection apparatus |
Dec. 4, 2007 |
| 7301357 |
Inspection method and inspection equipment |
Nov. 27, 2007 |
| 7292055 |
Interposer for use with test apparatus |
Nov. 6, 2007 |
| 7288950 |
Contacting component, method of producing the same, and test tool having the contacting component |
Oct. 30, 2007 |
| 7282933 |
Probe head arrays |
Oct. 16, 2007 |
| 7279914 |
Circuit board checker and circuit board checking method |
Oct. 9, 2007 |
| 7279915 |
Test method for electronic modules using movable test contactors |
Oct. 9, 2007 |
| 7276924 |
Electrical connecting method |
Oct. 2, 2007 |
| 7268568 |
Probe card |
Sep. 11, 2007 |
| 7268574 |
Systems and methods for sensing obstructions associated with electrical testing of microfeature workpieces |
Sep. 11, 2007 |
| 7265563 |
Test method for semiconductor components using anisotropic conductive polymer contact system |
Sep. 4, 2007 |
| 7259581 |
Method for testing semiconductor components |
Aug. 21, 2007 |
| 7256595 |
Test sockets, test systems, and methods for testing microfeature devices |
Aug. 14, 2007 |
| 7250780 |
Probe card for semiconductor wafers having mounting plate and socket |
Jul. 31, 2007 |
| 7243410 |
Method for manufacturing a probe card |
Jul. 17, 2007 |
| 7245137 |
Test head assembly having paired contact structures |
Jul. 17, 2007 |
| 7239161 |
Gantry-type XY stage |
Jul. 3, 2007 |
| 7230438 |
Thin film probe card contact drive system |
Jun. 12, 2007 |
| 7230439 |
Method for detecting and monitoring wafer probing process instability |
Jun. 12, 2007 |
| 7227370 |
Semiconductor inspection apparatus and manufacturing method of semiconductor device |
Jun. 5, 2007 |
| 7218127 |
Method and apparatus for probing an electronic device in which movement of probes and/or the electronic device includes a lateral component |
May. 15, 2007 |
| 7209849 |
Test system, added apparatus, and test method |
Apr. 24, 2007 |
| 7208971 |
Manual probe carriage system and method of using the same |
Apr. 24, 2007 |
| 7202683 |
Cleaning system, device and method |
Apr. 10, 2007 |
| 7199596 |
Manual testing instrument |
Apr. 3, 2007 |
| 7196530 |
Device testing contactor, method of producing the same, and device testing carrier |
Mar. 27, 2007 |
| 7190182 |
Test probe for finger tester and corresponding finger tester |
Mar. 13, 2007 |
| 7161369 |
Method and apparatus for a wobble fixture probe for probing test access point structures |
Jan. 9, 2007 |
| 7154284 |
Integrated circuit probe card |
Dec. 26, 2006 |
| 7148715 |
Systems and methods for testing microelectronic imagers and microfeature devices |
Dec. 12, 2006 |
| 7129726 |
Testing device and testing method of a semiconductor device |
Oct. 31, 2006 |
| 7119362 |
Method of manufacturing semiconductor apparatus |
Oct. 10, 2006 |
| 7116120 |
Clamping test fixture for a high frequency miniature probe assembly |
Oct. 3, 2006 |
| 7116121 |
Probe assembly with controlled impedance spring pin or resistor tip spring pin contacts |
Oct. 3, 2006 |
| 7112976 |
Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested |
Sep. 26, 2006 |
| 7084657 |
Bump and method of forming bump |
Aug. 1, 2006 |
| 7084650 |
Apparatus and method for limiting over travel in a probe card assembly |
Aug. 1, 2006 |
| 7084654 |
"2-step contact" clamping fixture for the flexible print circuit on a head gimbal assembly |
Aug. 1, 2006 |
| 7081767 |
Electroconductive contact unit |
Jul. 25, 2006 |
| 7061259 |
Inspection method and inspection apparatus |
Jun. 13, 2006 |
| 7057408 |
Method and prober for contacting a contact area with a contact tip |
Jun. 6, 2006 |
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