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Browse by Category: Main > Electrical & Energy
Class Information
Number: 324/757
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements > Probe contact enhancement
Description: Subject matter including a feature for aiding the probe to make proper contact.










Patents under this class:
1 2 3 4 5 6 7 8 9

Patent Number Title Of Patent Date Issued
7404124 On-chip sampling circuit and method Jul. 22, 2008
7398181 Method for retrieving reliability data in a system Jul. 8, 2008
7394265 Flat portions of a probe card flattened to have same vertical level with one another by compensating the unevenness of a substrate and each identical height needle being mounted on the corresp Jul. 1, 2008
7385412 Systems and methods for testing microfeature devices Jun. 10, 2008
7385407 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component Jun. 10, 2008
7372286 Modular probe card May. 13, 2008
7319337 Method and apparatus for pad aligned multiprobe wafer testing Jan. 15, 2008
7319339 Inspection apparatus to break the oxide of an electrode by fritting phenomenon Jan. 15, 2008
7309996 Contactor for electronic components and test method using the same Dec. 18, 2007
7304489 Inspection method and inspection apparatus Dec. 4, 2007
7301357 Inspection method and inspection equipment Nov. 27, 2007
7292055 Interposer for use with test apparatus Nov. 6, 2007
7288950 Contacting component, method of producing the same, and test tool having the contacting component Oct. 30, 2007
7282933 Probe head arrays Oct. 16, 2007
7279914 Circuit board checker and circuit board checking method Oct. 9, 2007
7279915 Test method for electronic modules using movable test contactors Oct. 9, 2007
7276924 Electrical connecting method Oct. 2, 2007
7268568 Probe card Sep. 11, 2007
7268574 Systems and methods for sensing obstructions associated with electrical testing of microfeature workpieces Sep. 11, 2007
7265563 Test method for semiconductor components using anisotropic conductive polymer contact system Sep. 4, 2007
7259581 Method for testing semiconductor components Aug. 21, 2007
7256595 Test sockets, test systems, and methods for testing microfeature devices Aug. 14, 2007
7250780 Probe card for semiconductor wafers having mounting plate and socket Jul. 31, 2007
7243410 Method for manufacturing a probe card Jul. 17, 2007
7245137 Test head assembly having paired contact structures Jul. 17, 2007
7239161 Gantry-type XY stage Jul. 3, 2007
7230438 Thin film probe card contact drive system Jun. 12, 2007
7230439 Method for detecting and monitoring wafer probing process instability Jun. 12, 2007
7227370 Semiconductor inspection apparatus and manufacturing method of semiconductor device Jun. 5, 2007
7218127 Method and apparatus for probing an electronic device in which movement of probes and/or the electronic device includes a lateral component May. 15, 2007
7209849 Test system, added apparatus, and test method Apr. 24, 2007
7208971 Manual probe carriage system and method of using the same Apr. 24, 2007
7202683 Cleaning system, device and method Apr. 10, 2007
7199596 Manual testing instrument Apr. 3, 2007
7196530 Device testing contactor, method of producing the same, and device testing carrier Mar. 27, 2007
7190182 Test probe for finger tester and corresponding finger tester Mar. 13, 2007
7161369 Method and apparatus for a wobble fixture probe for probing test access point structures Jan. 9, 2007
7154284 Integrated circuit probe card Dec. 26, 2006
7148715 Systems and methods for testing microelectronic imagers and microfeature devices Dec. 12, 2006
7129726 Testing device and testing method of a semiconductor device Oct. 31, 2006
7119362 Method of manufacturing semiconductor apparatus Oct. 10, 2006
7116120 Clamping test fixture for a high frequency miniature probe assembly Oct. 3, 2006
7116121 Probe assembly with controlled impedance spring pin or resistor tip spring pin contacts Oct. 3, 2006
7112976 Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested Sep. 26, 2006
7084657 Bump and method of forming bump Aug. 1, 2006
7084650 Apparatus and method for limiting over travel in a probe card assembly Aug. 1, 2006
7084654 "2-step contact" clamping fixture for the flexible print circuit on a head gimbal assembly Aug. 1, 2006
7081767 Electroconductive contact unit Jul. 25, 2006
7061259 Inspection method and inspection apparatus Jun. 13, 2006
7057408 Method and prober for contacting a contact area with a contact tip Jun. 6, 2006

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