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Class Information
Number: 324/757
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements > Probe contact enhancement
Description: Subject matter including a feature for aiding the probe to make proper contact.










Patents under this class:
1 2 3 4 5 6 7 8 9

Patent Number Title Of Patent Date Issued
7804313 Semiconductor device Sep. 28, 2010
7804316 Pusher, pusher unit and semiconductor testing apparatus Sep. 28, 2010
7800385 Apparatus and method for testing electrical interconnects Sep. 21, 2010
7800386 Contact device and method for producing the same Sep. 21, 2010
7776626 Manufacturing method of semiconductor integrated circuit device Aug. 17, 2010
7772863 Mechanical decoupling of a probe card assembly to improve thermal response Aug. 10, 2010
7759954 Semiconductor probe having resistive tip and method of fabricating the same Jul. 20, 2010
7750655 Multilayer substrate and probe card Jul. 6, 2010
7737712 Probe-testing device and method of semiconductor device Jun. 15, 2010
7733107 Charged device model contact plate Jun. 8, 2010
7728608 Method for assembling electrical connecting apparatus Jun. 1, 2010
7692434 Probe and method for fabricating the same Apr. 6, 2010
7688088 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object Mar. 30, 2010
7687174 Optical fuel cell stack cell voltage monitor Mar. 30, 2010
7685709 Process for making a spring Mar. 30, 2010
7675303 Connector for measuring electrical resistance, and apparatus and method for measuring electrical resistance of circuit board Mar. 9, 2010
7675305 Vertical-type electric contactor and manufacture method thereof Mar. 9, 2010
7673205 Semiconductor IC and testing method thereof Mar. 2, 2010
7671616 Semiconductor probe having embossed resistive tip and method of fabricating the same Mar. 2, 2010
7671613 Probing blade conductive connector for use with an electrical test probe Mar. 2, 2010
7667472 Probe assembly, method of producing it and electrical connecting apparatus Feb. 23, 2010
7663386 Probe card Feb. 16, 2010
7656174 Probe cassette, semiconductor inspection apparatus and manufacturing method of semiconductor device Feb. 2, 2010
7639026 Electronic device test set and contact used therein Dec. 29, 2009
7639028 Probe card assembly with ZIF connectors Dec. 29, 2009
7605583 Modular interface Oct. 20, 2009
7602202 Semiconductor probe with high resolution resistive tip having doping control layer and method of fabricating the same Oct. 13, 2009
7602203 Probe and probe card Oct. 13, 2009
7595651 Cantilever-type probe card for high frequency application Sep. 29, 2009
7586317 Inspection apparatus, probe card and inspection method Sep. 8, 2009
7583101 Probing structure with fine pitch probes Sep. 1, 2009
7541823 Circuit board checker and circuit board checking method Jun. 2, 2009
7537943 Method of manufacturing a semiconductor integrated circuit device May. 26, 2009
7535240 Semiconductor device May. 19, 2009
7532020 Probe assembly May. 12, 2009
7521947 Probe needle protection method for high current probe testing of power devices Apr. 21, 2009
7518388 Contactor for electronic components and test method using the same Apr. 14, 2009
7511518 Method of making an interposer Mar. 31, 2009
7511521 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component Mar. 31, 2009
7501839 Interposer and test assembly for testing electronic devices Mar. 10, 2009
7482824 Polycrystalline contacting component and test tool having the contacting component Jan. 27, 2009
7482822 Apparatus and method for limiting over travel in a probe card assembly Jan. 27, 2009
7474089 Contact mechanism cleaning Jan. 6, 2009
7463043 Methods of probing an electronic device Dec. 9, 2008
7453275 Probe card Nov. 18, 2008
7449903 Method and system for the optical inspection of contact faces at semiconductor devices with different appearances Nov. 11, 2008
7446544 Probe apparatus, wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method Nov. 4, 2008
7443179 Zero motion contact actuation Oct. 28, 2008
7436193 Thin film probe card contact drive system Oct. 14, 2008
7405578 Device for monitoring the contact integrity of a joint Jul. 29, 2008

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