| |
 |
|
Class Information
Number: 324/757
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements > Probe contact enhancement
Description: Subject matter including a feature for aiding the probe to make proper contact.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7605583 |
Modular interface |
Oct. 20, 2009 |
| 7602202 |
Semiconductor probe with high resolution resistive tip having doping control layer and method of fabricating the same |
Oct. 13, 2009 |
| 7602203 |
Probe and probe card |
Oct. 13, 2009 |
| 7595651 |
Cantilever-type probe card for high frequency application |
Sep. 29, 2009 |
| 7586317 |
Inspection apparatus, probe card and inspection method |
Sep. 8, 2009 |
| 7583101 |
Probing structure with fine pitch probes |
Sep. 1, 2009 |
| 7541823 |
Circuit board checker and circuit board checking method |
Jun. 2, 2009 |
| 7537943 |
Method of manufacturing a semiconductor integrated circuit device |
May. 26, 2009 |
| 7535240 |
Semiconductor device |
May. 19, 2009 |
| 7532020 |
Probe assembly |
May. 12, 2009 |
| 7521947 |
Probe needle protection method for high current probe testing of power devices |
Apr. 21, 2009 |
| 7518388 |
Contactor for electronic components and test method using the same |
Apr. 14, 2009 |
| 7511521 |
Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
Mar. 31, 2009 |
| 7511518 |
Method of making an interposer |
Mar. 31, 2009 |
| 7501839 |
Interposer and test assembly for testing electronic devices |
Mar. 10, 2009 |
| 7482822 |
Apparatus and method for limiting over travel in a probe card assembly |
Jan. 27, 2009 |
| 7482824 |
Polycrystalline contacting component and test tool having the contacting component |
Jan. 27, 2009 |
| 7474089 |
Contact mechanism cleaning |
Jan. 6, 2009 |
| 7463043 |
Methods of probing an electronic device |
Dec. 9, 2008 |
| 7453275 |
Probe card |
Nov. 18, 2008 |
| 7449903 |
Method and system for the optical inspection of contact faces at semiconductor devices with different appearances |
Nov. 11, 2008 |
| 7446544 |
Probe apparatus, wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method |
Nov. 4, 2008 |
| 7443179 |
Zero motion contact actuation |
Oct. 28, 2008 |
| 7436193 |
Thin film probe card contact drive system |
Oct. 14, 2008 |
| 7405578 |
Device for monitoring the contact integrity of a joint |
Jul. 29, 2008 |
| 7404124 |
On-chip sampling circuit and method |
Jul. 22, 2008 |
| 7398181 |
Method for retrieving reliability data in a system |
Jul. 8, 2008 |
| 7394265 |
Flat portions of a probe card flattened to have same vertical level with one another by compensating the unevenness of a substrate and each identical height needle being mounted on the corresp |
Jul. 1, 2008 |
| 7385412 |
Systems and methods for testing microfeature devices |
Jun. 10, 2008 |
| 7385407 |
Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
Jun. 10, 2008 |
| 7372286 |
Modular probe card |
May. 13, 2008 |
| 7319337 |
Method and apparatus for pad aligned multiprobe wafer testing |
Jan. 15, 2008 |
| 7319339 |
Inspection apparatus to break the oxide of an electrode by fritting phenomenon |
Jan. 15, 2008 |
| 7309996 |
Contactor for electronic components and test method using the same |
Dec. 18, 2007 |
| 7304489 |
Inspection method and inspection apparatus |
Dec. 4, 2007 |
| 7301357 |
Inspection method and inspection equipment |
Nov. 27, 2007 |
| 7292055 |
Interposer for use with test apparatus |
Nov. 6, 2007 |
| 7288950 |
Contacting component, method of producing the same, and test tool having the contacting component |
Oct. 30, 2007 |
| 7282933 |
Probe head arrays |
Oct. 16, 2007 |
| 7279914 |
Circuit board checker and circuit board checking method |
Oct. 9, 2007 |
| 7279915 |
Test method for electronic modules using movable test contactors |
Oct. 9, 2007 |
| 7276924 |
Electrical connecting method |
Oct. 2, 2007 |
| 7268574 |
Systems and methods for sensing obstructions associated with electrical testing of microfeature workpieces |
Sep. 11, 2007 |
| 7268568 |
Probe card |
Sep. 11, 2007 |
| 7265563 |
Test method for semiconductor components using anisotropic conductive polymer contact system |
Sep. 4, 2007 |
| 7259581 |
Method for testing semiconductor components |
Aug. 21, 2007 |
| 7256595 |
Test sockets, test systems, and methods for testing microfeature devices |
Aug. 14, 2007 |
| 7250780 |
Probe card for semiconductor wafers having mounting plate and socket |
Jul. 31, 2007 |
| 7243410 |
Method for manufacturing a probe card |
Jul. 17, 2007 |
| 7245137 |
Test head assembly having paired contact structures |
Jul. 17, 2007 |
|
|
|
