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Class Information
Number: 324/756
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements > Contact confirmation
Description: Subject matter including a feature to enable determination whether proper probe contact has been made.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7583098 |
Automated probe card planarization and alignment methods and tools |
Sep. 1, 2009 |
| 7564252 |
Semiconductor inspection apparatus |
Jul. 21, 2009 |
| 7559139 |
Method for manufacturing a probe unit |
Jul. 14, 2009 |
| 7558185 |
Storage device having flexible architecture and free scalability |
Jul. 7, 2009 |
| 7547884 |
Pattern defect inspection method and apparatus thereof |
Jun. 16, 2009 |
| 7545159 |
Electrical test probes with a contact element, methods of making and using the same |
Jun. 9, 2009 |
| 7537943 |
Method of manufacturing a semiconductor integrated circuit device |
May. 26, 2009 |
| 7518384 |
Method and apparatus for manufacturing and probing test probe access structures on vias |
Apr. 14, 2009 |
| 7514940 |
System and method for determining effective channel dimensions of metal oxide semiconductor devices |
Apr. 7, 2009 |
| 7511269 |
Method of approaching probe and apparatus for realizing the same |
Mar. 31, 2009 |
| 7492172 |
Chuck for holding a device under test |
Feb. 17, 2009 |
| 7479780 |
Tester for in-circuit testing bed of nails fixture and testing circuit thereof |
Jan. 20, 2009 |
| 7449907 |
Test unit to test a board having an area array package mounted thereon |
Nov. 11, 2008 |
| 7449903 |
Method and system for the optical inspection of contact faces at semiconductor devices with different appearances |
Nov. 11, 2008 |
| 7405578 |
Device for monitoring the contact integrity of a joint |
Jul. 29, 2008 |
| 7404124 |
On-chip sampling circuit and method |
Jul. 22, 2008 |
| 7388391 |
Method for evaluating at least one electrical conducting structure of an electronic component |
Jun. 17, 2008 |
| 7362116 |
Method for probing impact sensitive and thin layered substrate |
Apr. 22, 2008 |
| 7330040 |
Test circuitry wafer |
Feb. 12, 2008 |
| 7323894 |
Needle alignment verification circuit and method for semiconductor device |
Jan. 29, 2008 |
| 7319339 |
Inspection apparatus to break the oxide of an electrode by fritting phenomenon |
Jan. 15, 2008 |
| 7307436 |
Electrical feedback detection system for multi-point probes |
Dec. 11, 2007 |
| 7304489 |
Inspection method and inspection apparatus |
Dec. 4, 2007 |
| 7268568 |
Probe card |
Sep. 11, 2007 |
| 7269029 |
Rapid fire test board |
Sep. 11, 2007 |
| 7259579 |
Method and apparatus for semiconductor testing utilizing dies with integrated circuit |
Aug. 21, 2007 |
| 7250782 |
Method for testing non-componented circuit boards |
Jul. 31, 2007 |
| 7245137 |
Test head assembly having paired contact structures |
Jul. 17, 2007 |
| 7230439 |
Method for detecting and monitoring wafer probing process instability |
Jun. 12, 2007 |
| 7227370 |
Semiconductor inspection apparatus and manufacturing method of semiconductor device |
Jun. 5, 2007 |
| 7209849 |
Test system, added apparatus, and test method |
Apr. 24, 2007 |
| 7202682 |
Composite motion probing |
Apr. 10, 2007 |
| 7202680 |
Touch probe |
Apr. 10, 2007 |
| 7190183 |
Selecting die placement on a semiconductor wafer to reduce test time |
Mar. 13, 2007 |
| 7183785 |
Test system and method for reduced index time |
Feb. 27, 2007 |
| 7135876 |
Electrical feedback detection system for multi-point probes |
Nov. 14, 2006 |
| 7105856 |
Test key having a chain circuit and a kelvin structure |
Sep. 12, 2006 |
| 7100814 |
Method for preparing integrated circuit modules for attachment to printed circuit substrates |
Sep. 5, 2006 |
| 7078921 |
Contact probe |
Jul. 18, 2006 |
| 7061259 |
Inspection method and inspection apparatus |
Jun. 13, 2006 |
| 7061260 |
Calibration device for the calibration of a tester channel of a tester device and a test system |
Jun. 13, 2006 |
| 7030636 |
Low pin testing system |
Apr. 18, 2006 |
| 7023226 |
Probe pins zero-point detecting method, and prober |
Apr. 4, 2006 |
| 6980013 |
Probe card |
Dec. 27, 2005 |
| 6962516 |
Voltage applying apparatus, and apparatus and method for manufacturing electron source |
Nov. 8, 2005 |
| 6941529 |
Method and system for using emission microscopy in physical verification of memory device architecture |
Sep. 6, 2005 |
| 6937036 |
Interface device an interface between testing equipment and an integrated circuit |
Aug. 30, 2005 |
| 6927589 |
Apparatus for testing bumped die |
Aug. 9, 2005 |
| 6864697 |
Flip-over alignment station for probe needle adjustment |
Mar. 8, 2005 |
| 6853207 |
Method for evaluating contact pin integrity of electronic components having multiple contact pins |
Feb. 8, 2005 |
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