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Class Information
Number: 324/756.01
Name: Electricity: measuring and testing >
Description:










Sub-classes under this class:

Class Number Class Name Patents
324/158.1 Miscellaneous 3,073
324/160 Electrical speed measuring 273
324/200 Magnetic 110
324/300 Particle precession resonance 658
324/323 Of geophysical surface or subsurface in situ 198
324/376 Of subsurface core sample 60
324/378 Internal-combustion engine ignition system or device 114
324/403 Electric lamp or discharge device 42
324/415 Electromechanical switching device 153
324/425 Electrolyte properties 247
324/451 A material property using thermoelectric phenomenon 31
324/452 A material property using electrostatic phenomenon 159
324/457 Electrostatic field 319
324/459 Using ionization effects 113
324/500 Fault detecting in electric circuits and of electric components 424
324/557 For insulation fault of noncircuit elements 179
324/600 Impedance, admittance or other quantities representative of electrical stimulus/response relationships 181
324/66 Conductor identification or location (e.g., phase identification) 305
324/71.1 Determining nonelectric properties by measuring electric properties 692
324/72 Testing potential in specific environment (e.g., lightning stroke) 456
324/73.1 Plural, automatically sequential tests 1,078
324/74 Testing and calibrating electric meters (e.g., watt-hour meters) 205
324/76.11 Measuring, testing, or sensing electricity, per se 578
324/800 Divining rods 1


Patents under this class:

Patent Number Title Of Patent Date Issued
8710858 Micro positioning test socket and methods for active precision alignment and co-planarity feedback Apr. 29, 2014
8710859 Method for testing multi-chip stacked packages Apr. 29, 2014
8710856 Terminal for flat test probe Apr. 29, 2014
8680880 Method and apparatus for testing integrated circuit Mar. 25, 2014
8680883 Time dependent dielectric breakdown (TDDB) test structure of semiconductor device and method of performing TDDB test using the same Mar. 25, 2014
8659313 Test bracket for circuit board Feb. 25, 2014
8653846 Electronic device mounting apparatus and method of mounting electronic device Feb. 18, 2014
8643361 Needle head Feb. 4, 2014
8624621 Chucks for supporting solar cell in hot spot testing Jan. 7, 2014
8624620 Test system and write wafer Jan. 7, 2014
8536888 Built in self test for transceiver Sep. 17, 2013
8536889 Electrically conductive pins for microcircuit tester Sep. 17, 2013
8523158 Opener and buffer table for test handler Sep. 3, 2013
8525538 Apparatus and method for testing a semiconductor device Sep. 3, 2013
8525539 Electrical connecting apparatus and testing system using the same Sep. 3, 2013
8519728 Compliance control methods and apparatuses Aug. 27, 2013
8513962 Wafer tray and test apparatus Aug. 20, 2013
8513969 Apparatus and method of testing singulated dies Aug. 20, 2013
8513963 Radio frequency testing apparatus Aug. 20, 2013
8502551 Electronic component and inspection system Aug. 6, 2013
8502553 Semiconductor package test apparatus Aug. 6, 2013
8466705 System and method for analyzing electronic devices having a cab for holding electronic devices Jun. 18, 2013
8461855 Device interface board with cavity back for very high frequency applications Jun. 11, 2013
8441273 Testing card and testing system for USB port May. 14, 2013
8441275 Electronic device test fixture May. 14, 2013
8436631 Wafer stage May. 7, 2013
8427187 Probe wafer, probe device, and testing system Apr. 23, 2013
8427183 Probe card assembly having an actuator for bending the probe substrate Apr. 23, 2013
8415964 Probe card having a structure for being prevented from deforming Apr. 9, 2013
8390308 Testbed for testing electronic circuits and components Mar. 5, 2013
8368416 In-process system level test before surface mount Feb. 5, 2013
8339152 Test structure activated by probe needle Dec. 25, 2012
8319511 Probe device having a structure for being prevented from deforming Nov. 27, 2012
8314630 Test section unit, test head and electronic device testing apparatus Nov. 20, 2012
8310252 Testing a nonvolatile circuit element having multiple intermediate states Nov. 13, 2012
8299811 Universal front/back post terminal block and test link Oct. 30, 2012
8294479 Docking drive, locking element, docking system Oct. 23, 2012
8294481 Handler Oct. 23, 2012
8289040 Test wafer unit and test system Oct. 16, 2012
8289042 Test apparatus and pallet for parallel RF testing of printed circuit boards Oct. 16, 2012
8269506 Signal integrity test system and method Sep. 18, 2012
8264248 Micro probe assembly Sep. 11, 2012
8232818 Probe head for a microelectronic contactor assembly, the probe head having SMT electronic components thereon Jul. 31, 2012
8228086 Socket for testing semiconductor chip Jul. 24, 2012
8217674 Systems and methods to test integrated circuits Jul. 10, 2012
8212579 Fixing apparatus for a probe card Jul. 3, 2012
8203354 System for testing electronic components Jun. 19, 2012
8159245 Holding member for inspection, inspection device and inspecting method Apr. 17, 2012
8159251 Probe card for semiconductor wafer Apr. 17, 2012
8138777 TCP-type semiconductor device and method of testing thereof Mar. 20, 2012











 
 
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