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Class Information
Number: 324/755
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements > Internal of or on support for device under test (dut)
Description: Subject matter including a support for the DUT and wherein probe elements are mounted in or on the support.










Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20

Patent Number Title Of Patent Date Issued
7805641 Test apparatus for regulating a test signal supplied to a device under test and method thereof Sep. 28, 2010
7798022 Testing devices for multihole workpiece Sep. 21, 2010
7800382 System for testing an integrated circuit of a device and its method of use Sep. 21, 2010
7792396 Probe card for testing in-wafer photonic integrated circuits (PICs) and method of use Sep. 7, 2010
7782045 Multi-signal input testing apparatus Aug. 24, 2010
7777509 Method and apparatus for electrical testing Aug. 17, 2010
7779375 Design structure for shutting off data capture across asynchronous clock domains during at-speed testing Aug. 17, 2010
7768280 Apparatus for a low-cost semiconductor test interface system Aug. 3, 2010
7768284 Test apparatus for testing a semiconductor device, and method for testing the semiconductor device Aug. 3, 2010
7750655 Multilayer substrate and probe card Jul. 6, 2010
7741837 Probe apparatus Jun. 22, 2010
7741860 Prober for testing magnetically sensitive components Jun. 22, 2010
7737710 Socket, and test apparatus and method using the socket Jun. 15, 2010
7737711 Test apparatus having pogo probes for chip scale package Jun. 15, 2010
7733106 Apparatus and method of testing singulated dies Jun. 8, 2010
7728615 Test apparatus that tests a device under test and connecting apparatus that connects a first apparatus and a second apparatus Jun. 1, 2010
7728611 Compressive conductors for semiconductor testing Jun. 1, 2010
7723981 Method for transferring test trays in a side-docking type test handler May. 25, 2010
7714602 Socket for connecting ball-grid-array integrated circuit device to test circuit May. 11, 2010
7714310 Apparatus, unit and method for testing image sensor packages May. 11, 2010
7696770 Self-centering nest for electronics testing Apr. 13, 2010
7696772 Strip socket for testing and burn-in having recessed portions with material that extends across a bottom surface of the corresponding semiconductor device Apr. 13, 2010
7692437 Systems and methods for testing packaged microelectronic devices Apr. 6, 2010
7688094 Electrical connecting apparatus Mar. 30, 2010
7688093 Sharing conversion board for testing chips Mar. 30, 2010
7688092 Measuring board for electronic device test apparatus Mar. 30, 2010
7686621 Integrated circuit test socket having elastic contact support and methods for use therewith Mar. 30, 2010
7688095 Interposer structures and methods of manufacturing the same Mar. 30, 2010
7683648 Integrated circuit socket and method of use for providing adjustable contact pitch Mar. 23, 2010
7685542 Method and apparatus for shutting off data capture across asynchronous clock domains during at-speed testing Mar. 23, 2010
7668235 Jitter measurement algorithm using locally in-order strobes Feb. 23, 2010
7667473 Flip-chip package having thermal expansion posts Feb. 23, 2010
7663387 Test socket Feb. 16, 2010
7659738 Test sockets having peltier elements, test equipment including the same and methods of testing semiconductor packages using the same Feb. 9, 2010
7656179 Relay connector having a pin block and a floating guide with guide hole Feb. 2, 2010
7656173 Strip socket having a recessed portions in the base to accept bottom surface of packaged semiconductor devices mounted on a leadframe for testing and burn-in Feb. 2, 2010
7656177 Test apparatus Feb. 2, 2010
7656178 Method for calibrating semiconductor device tester Feb. 2, 2010
7652467 Carrier tray for use with prober Jan. 26, 2010
7639031 Testing assembly for electric test of electric package and testing socket thereof Dec. 29, 2009
7633305 Method for evaluating semiconductor wafer and apparatus for evaluating semiconductor wafer Dec. 15, 2009
7629788 Test carrier Dec. 8, 2009
7626405 Suspension system and adjustment mechanism for an integrated chip and method Dec. 1, 2009
7619432 Tandem handler system and method for reduced index time Nov. 17, 2009
7619426 Performance board and cover member Nov. 17, 2009
7615992 Apparatus and method for detecting electronic device testing socket Nov. 10, 2009
7610538 Test apparatus and performance board for diagnosis Oct. 27, 2009
7602201 High temperature ceramic socket configured to test packaged semiconductor devices Oct. 13, 2009
7598760 High temperature ceramic die package and DUT board socket Oct. 6, 2009
7589521 Universal cover for a burn-in socket Sep. 15, 2009

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