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Class Information
Number: 324/755
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements > Internal of or on support for device under test (dut)
Description: Subject matter including a support for the DUT and wherein probe elements are mounted in or on the support.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7619426 |
Performance board and cover member |
Nov. 17, 2009 |
| 7619432 |
Tandem handler system and method for reduced index time |
Nov. 17, 2009 |
| 7615992 |
Apparatus and method for detecting electronic device testing socket |
Nov. 10, 2009 |
| 7610538 |
Test apparatus and performance board for diagnosis |
Oct. 27, 2009 |
| 7602201 |
High temperature ceramic socket configured to test packaged semiconductor devices |
Oct. 13, 2009 |
| 7598760 |
High temperature ceramic die package and DUT board socket |
Oct. 6, 2009 |
| 7589521 |
Universal cover for a burn-in socket |
Sep. 15, 2009 |
| 7583097 |
Contactor nest for an IC device and method |
Sep. 1, 2009 |
| 7575460 |
IC socket |
Aug. 18, 2009 |
| 7576551 |
Test socket and test board for wafer level semiconductor testing |
Aug. 18, 2009 |
| 7576552 |
Surface mount package fault detection apparatus |
Aug. 18, 2009 |
| 7573279 |
Jig for Kelvin test |
Aug. 11, 2009 |
| 7567075 |
Single latch manual actuator for testing microcircuits, and having a mechanical interlock for controlling opening and closing |
Jul. 28, 2009 |
| 7550985 |
Methods of testing memory devices |
Jun. 23, 2009 |
| 7548078 |
Performance board for electronically connecting a device under test with a test apparatus for testing a device under test |
Jun. 16, 2009 |
| 7548079 |
Semiconductor device including analog voltage output driver LSI chip having test circuit |
Jun. 16, 2009 |
| 7541822 |
Wafer burn-in and text employing detachable cartridge |
Jun. 2, 2009 |
| 7541827 |
BGA package holder device and method for testing of BGA packages |
Jun. 2, 2009 |
| 7535713 |
IC socket |
May. 19, 2009 |
| 7535214 |
Apparatus for testing system-in-package devices |
May. 19, 2009 |
| 7534654 |
Socket for making with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component |
May. 19, 2009 |
| 7528616 |
Zero ATE insertion force interposer daughter card |
May. 5, 2009 |
| 7523010 |
Automated circuit board test actuator system |
Apr. 21, 2009 |
| 7518356 |
Apparatus for testing system-in-package devices |
Apr. 14, 2009 |
| 7518357 |
Test circuits of an apparatus for testing micro SD devices |
Apr. 14, 2009 |
| 7514950 |
Semiconductor device testing apparatus and device interface board |
Apr. 7, 2009 |
| 7514914 |
Test circuits of an apparatus for testing system-in-package devices |
Apr. 7, 2009 |
| 7511520 |
Universal wafer carrier for wafer level die burn-in |
Mar. 31, 2009 |
| 7492174 |
Testing apparatus for surface mounted connectors |
Feb. 17, 2009 |
| 7492175 |
Membrane probing system |
Feb. 17, 2009 |
| 7486094 |
Apparatus for testing un-moulded IC devices using air flow system and the method of using the same |
Feb. 3, 2009 |
| 7486092 |
Apparatus for supporting semiconductor devices during testing |
Feb. 3, 2009 |
| 7486091 |
Test unit usable with a board having an electronic component |
Feb. 3, 2009 |
| 7477062 |
LSI test socket for BGA |
Jan. 13, 2009 |
| 7477063 |
Universal insert tool for fixing a BGA package under test |
Jan. 13, 2009 |
| 7474531 |
Circuit board testing jig |
Jan. 6, 2009 |
| 7471096 |
Contactor for electronic parts and a contact method |
Dec. 30, 2008 |
| 7468609 |
Switched suspended conductor and connection |
Dec. 23, 2008 |
| 7456644 |
Functional and stress testing of LGA devices |
Nov. 25, 2008 |
| 7456639 |
Compliant contact structure |
Nov. 25, 2008 |
| 7453259 |
Loading a socket and/or adapter device with a semiconductor component |
Nov. 18, 2008 |
| 7453932 |
Test device and setting method |
Nov. 18, 2008 |
| 7449907 |
Test unit to test a board having an area array package mounted thereon |
Nov. 11, 2008 |
| 7446398 |
Bump pattern design for flip chip semiconductor package |
Nov. 4, 2008 |
| 7443183 |
Motherboard test machine |
Oct. 28, 2008 |
| 7429497 |
Hybrid package with non-insertable and insertable conductive features, complementary receptacle, and methods of fabrication therefor |
Sep. 30, 2008 |
| 7430123 |
Rack for computer system modules |
Sep. 30, 2008 |
| 7427768 |
Apparatus, unit and method for testing image sensor packages |
Sep. 23, 2008 |
| 7425839 |
Systems and methods for testing packaged microelectronic devices |
Sep. 16, 2008 |
| 7408367 |
Micro Kelvin probes and micro Kelvin probe methodology with concentric pad structures |
Aug. 5, 2008 |
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