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Class Information
Number: 324/754
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements
Description: Subject matter including a feature to enable contact between a device under test (DUT) and a test apparatus.










Sub-classes under this class:

Class Number Class Name Patents
324/762 Cantilever 445
324/756 Contact confirmation 152
324/755 Internal of or on support for device under test (dut) 960
324/761 Pin 940
324/758 Probe alignment or positioning 971
324/757 Probe contact enhancement 424
324/759 With recording of test results on dut 53
324/760 With temperature control 797


Patents under this class:

Patent Number Title Of Patent Date Issued
7598758 MP3 micro probe Oct. 6, 2009
7598757 Double ended contact probe Oct. 6, 2009
7598756 Inspection device and inspection method Oct. 6, 2009
7598755 Probe navigation method and device and defect inspection device Oct. 6, 2009
7595651 Cantilever-type probe card for high frequency application Sep. 29, 2009
7595650 Magnetic field probe apparatus and a method for measuring magnetic field Sep. 29, 2009
7595632 Wafer probe station having environment control enclosure Sep. 29, 2009
7595631 Wafer level assemble chip multi-site testing solution Sep. 29, 2009
7595629 Method and apparatus for calibrating and/or deskewing communications channels Sep. 29, 2009
7595628 Probing apparatus for illuminating an electrical device under test Sep. 29, 2009
7592823 Electrical component handler having self-cleaning lower contact Sep. 22, 2009
7592822 Probing adapter for a signal acquisition probe having pivoting, compliant, variable spacing probing tips Sep. 22, 2009
7592821 Apparatus and method for managing thermally induced motion of a probe card assembly Sep. 22, 2009
7589544 Probe test apparatus Sep. 15, 2009
7589543 Probe card having a conductive thin film on the surface of an insulating film behind each of the alignment marks each marks comprises a plurality of second bumps Sep. 15, 2009
7589542 Hybrid probe for testing semiconductor devices Sep. 15, 2009
7589541 Method and apparatus for inspecting solid-state image pick-up device Sep. 15, 2009
7589518 Wafer probe station having a skirting component Sep. 15, 2009
7586321 Electrical test probe and electrical test probe assembly Sep. 8, 2009
7586318 Differential measurement probe having a ground clip system for the probing tips Sep. 8, 2009
7586317 Inspection apparatus, probe card and inspection method Sep. 8, 2009
7586316 Probe board mounting apparatus Sep. 8, 2009
7583101 Probing structure with fine pitch probes Sep. 1, 2009
7583100 Test head for testing electrical components Sep. 1, 2009
7583096 Probing apparatus and probing method Sep. 1, 2009
7583095 High-density probe array Sep. 1, 2009
7579857 Electrical contact device of probe card Aug. 25, 2009
7579856 Probe structures with physically suspended electronic components Aug. 25, 2009
7579855 Method for manufacturing electrical contact element for testing electronic device and electrical contact element manufactured thereby Aug. 25, 2009
7579853 Apparatus for obtaining planarity measurements with respect to a probe card analysis system Aug. 25, 2009
7579852 Wafer translator having metallization pattern providing high density interdigitated contact pads for component Aug. 25, 2009
7579851 Operation voltage supply apparatus and operation voltage supply method for semiconductor device Aug. 25, 2009
7579850 Probe card and method for assembling the same Aug. 25, 2009
7579849 Probe holder for a probe for testing semiconductor components Aug. 25, 2009
7579848 High density interconnect system for IC packages and interconnect assemblies Aug. 25, 2009
7579847 Probe card cooling assembly with direct cooling of active electronic components Aug. 25, 2009
7579269 Microelectronic spring contact elements Aug. 25, 2009
7577517 Guided vehicle system and teaching method in the guided vehicle system Aug. 18, 2009
7576550 Automatic multiplexing system for automated wafer testing Aug. 18, 2009
7573283 Method for measurement of a device under test Aug. 11, 2009
7573281 Probe for inspecting one or more semiconductor chips Aug. 11, 2009
7573278 Semiconductor device Aug. 11, 2009
7573277 Thin film probe card Aug. 11, 2009
7573276 Probe card layout Aug. 11, 2009
7573272 Antenna reconfiguration verification and validation Aug. 11, 2009
7573066 Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus Aug. 11, 2009
7571399 Process for checking the quality of the metallization of a printed circuit Aug. 4, 2009
7570069 Resilient contact probes Aug. 4, 2009
7567089 Two-part microprobes for contacting electronic components and methods for making such probes Jul. 28, 2009
7564252 Semiconductor inspection apparatus Jul. 21, 2009











 
 
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