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Class Information
Number: 324/754
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements
Description: Subject matter including a feature to enable contact between a device under test (DUT) and a test apparatus.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7598758 |
MP3 micro probe |
Oct. 6, 2009 |
| 7598757 |
Double ended contact probe |
Oct. 6, 2009 |
| 7598756 |
Inspection device and inspection method |
Oct. 6, 2009 |
| 7598755 |
Probe navigation method and device and defect inspection device |
Oct. 6, 2009 |
| 7595651 |
Cantilever-type probe card for high frequency application |
Sep. 29, 2009 |
| 7595650 |
Magnetic field probe apparatus and a method for measuring magnetic field |
Sep. 29, 2009 |
| 7595632 |
Wafer probe station having environment control enclosure |
Sep. 29, 2009 |
| 7595631 |
Wafer level assemble chip multi-site testing solution |
Sep. 29, 2009 |
| 7595629 |
Method and apparatus for calibrating and/or deskewing communications channels |
Sep. 29, 2009 |
| 7595628 |
Probing apparatus for illuminating an electrical device under test |
Sep. 29, 2009 |
| 7592823 |
Electrical component handler having self-cleaning lower contact |
Sep. 22, 2009 |
| 7592822 |
Probing adapter for a signal acquisition probe having pivoting, compliant, variable spacing probing tips |
Sep. 22, 2009 |
| 7592821 |
Apparatus and method for managing thermally induced motion of a probe card assembly |
Sep. 22, 2009 |
| 7589544 |
Probe test apparatus |
Sep. 15, 2009 |
| 7589543 |
Probe card having a conductive thin film on the surface of an insulating film behind each of the alignment marks each marks comprises a plurality of second bumps |
Sep. 15, 2009 |
| 7589542 |
Hybrid probe for testing semiconductor devices |
Sep. 15, 2009 |
| 7589541 |
Method and apparatus for inspecting solid-state image pick-up device |
Sep. 15, 2009 |
| 7589518 |
Wafer probe station having a skirting component |
Sep. 15, 2009 |
| 7586321 |
Electrical test probe and electrical test probe assembly |
Sep. 8, 2009 |
| 7586318 |
Differential measurement probe having a ground clip system for the probing tips |
Sep. 8, 2009 |
| 7586317 |
Inspection apparatus, probe card and inspection method |
Sep. 8, 2009 |
| 7586316 |
Probe board mounting apparatus |
Sep. 8, 2009 |
| 7583101 |
Probing structure with fine pitch probes |
Sep. 1, 2009 |
| 7583100 |
Test head for testing electrical components |
Sep. 1, 2009 |
| 7583096 |
Probing apparatus and probing method |
Sep. 1, 2009 |
| 7583095 |
High-density probe array |
Sep. 1, 2009 |
| 7579857 |
Electrical contact device of probe card |
Aug. 25, 2009 |
| 7579856 |
Probe structures with physically suspended electronic components |
Aug. 25, 2009 |
| 7579855 |
Method for manufacturing electrical contact element for testing electronic device and electrical contact element manufactured thereby |
Aug. 25, 2009 |
| 7579853 |
Apparatus for obtaining planarity measurements with respect to a probe card analysis system |
Aug. 25, 2009 |
| 7579852 |
Wafer translator having metallization pattern providing high density interdigitated contact pads for component |
Aug. 25, 2009 |
| 7579851 |
Operation voltage supply apparatus and operation voltage supply method for semiconductor device |
Aug. 25, 2009 |
| 7579850 |
Probe card and method for assembling the same |
Aug. 25, 2009 |
| 7579849 |
Probe holder for a probe for testing semiconductor components |
Aug. 25, 2009 |
| 7579848 |
High density interconnect system for IC packages and interconnect assemblies |
Aug. 25, 2009 |
| 7579847 |
Probe card cooling assembly with direct cooling of active electronic components |
Aug. 25, 2009 |
| 7579269 |
Microelectronic spring contact elements |
Aug. 25, 2009 |
| 7577517 |
Guided vehicle system and teaching method in the guided vehicle system |
Aug. 18, 2009 |
| 7576550 |
Automatic multiplexing system for automated wafer testing |
Aug. 18, 2009 |
| 7573283 |
Method for measurement of a device under test |
Aug. 11, 2009 |
| 7573281 |
Probe for inspecting one or more semiconductor chips |
Aug. 11, 2009 |
| 7573278 |
Semiconductor device |
Aug. 11, 2009 |
| 7573277 |
Thin film probe card |
Aug. 11, 2009 |
| 7573276 |
Probe card layout |
Aug. 11, 2009 |
| 7573272 |
Antenna reconfiguration verification and validation |
Aug. 11, 2009 |
| 7573066 |
Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus |
Aug. 11, 2009 |
| 7571399 |
Process for checking the quality of the metallization of a printed circuit |
Aug. 4, 2009 |
| 7570069 |
Resilient contact probes |
Aug. 4, 2009 |
| 7567089 |
Two-part microprobes for contacting electronic components and methods for making such probes |
Jul. 28, 2009 |
| 7564252 |
Semiconductor inspection apparatus |
Jul. 21, 2009 |
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