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Class Information
Number: 324/754
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements
Description: Subject matter including a feature to enable contact between a device under test (DUT) and a test apparatus.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7620931 |
Method of adding fabrication monitors to integrated circuit chips |
Nov. 17, 2009 |
| 7619430 |
Electrical testing probe assembly having nonparallel facing surfaces and slots formed thereon for receiving probes |
Nov. 17, 2009 |
| 7619425 |
Electrical connecting apparatus |
Nov. 17, 2009 |
| 7619424 |
Probe needle, method for manufacturing the probe needle and method for constructing a three-dimensional structure |
Nov. 17, 2009 |
| 7619419 |
Wideband active-passive differential signal probe |
Nov. 17, 2009 |
| 7618465 |
Near-field antenna |
Nov. 17, 2009 |
| 7616019 |
Low profile electronic assembly test fixtures |
Nov. 10, 2009 |
| 7616016 |
Probe card assembly and kit |
Nov. 10, 2009 |
| 7616015 |
Wafer type probe card, method for fabricating the same, and semiconductor test apparatus having the same |
Nov. 10, 2009 |
| 7609080 |
Voltage fault detection and protection |
Oct. 27, 2009 |
| 7609078 |
Contact alignment verification/adjustment fixture |
Oct. 27, 2009 |
| 7609077 |
Differential signal probe with integral balun |
Oct. 27, 2009 |
| 7609048 |
Probe microscope and measuring method using probe microscope |
Oct. 27, 2009 |
| 7607056 |
Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices |
Oct. 20, 2009 |
| 7605596 |
Probe card, apparatus and method for inspecting an object |
Oct. 20, 2009 |
| 7605582 |
Modular interface |
Oct. 20, 2009 |
| 7602200 |
Probe for electrical test comprising a positioning mark and probe assembly |
Oct. 13, 2009 |
| 7602199 |
Mini-prober for TFT-LCD testing |
Oct. 13, 2009 |
| 7598763 |
Probe contacting electrode and electronic device |
Oct. 6, 2009 |
| 7598759 |
Routing engine, method of routing a test probe and testing system employing the same |
Oct. 6, 2009 |
| 7598758 |
MP3 micro probe |
Oct. 6, 2009 |
| 7598757 |
Double ended contact probe |
Oct. 6, 2009 |
| 7598756 |
Inspection device and inspection method |
Oct. 6, 2009 |
| 7598755 |
Probe navigation method and device and defect inspection device |
Oct. 6, 2009 |
| 7595651 |
Cantilever-type probe card for high frequency application |
Sep. 29, 2009 |
| 7595650 |
Magnetic field probe apparatus and a method for measuring magnetic field |
Sep. 29, 2009 |
| 7595632 |
Wafer probe station having environment control enclosure |
Sep. 29, 2009 |
| 7595631 |
Wafer level assemble chip multi-site testing solution |
Sep. 29, 2009 |
| 7595629 |
Method and apparatus for calibrating and/or deskewing communications channels |
Sep. 29, 2009 |
| 7595628 |
Probing apparatus for illuminating an electrical device under test |
Sep. 29, 2009 |
| 7592823 |
Electrical component handler having self-cleaning lower contact |
Sep. 22, 2009 |
| 7592822 |
Probing adapter for a signal acquisition probe having pivoting, compliant, variable spacing probing tips |
Sep. 22, 2009 |
| 7592821 |
Apparatus and method for managing thermally induced motion of a probe card assembly |
Sep. 22, 2009 |
| 7589544 |
Probe test apparatus |
Sep. 15, 2009 |
| 7589543 |
Probe card having a conductive thin film on the surface of an insulating film behind each of the alignment marks each marks comprises a plurality of second bumps |
Sep. 15, 2009 |
| 7589542 |
Hybrid probe for testing semiconductor devices |
Sep. 15, 2009 |
| 7589541 |
Method and apparatus for inspecting solid-state image pick-up device |
Sep. 15, 2009 |
| 7589518 |
Wafer probe station having a skirting component |
Sep. 15, 2009 |
| 7586321 |
Electrical test probe and electrical test probe assembly |
Sep. 8, 2009 |
| 7586318 |
Differential measurement probe having a ground clip system for the probing tips |
Sep. 8, 2009 |
| 7586317 |
Inspection apparatus, probe card and inspection method |
Sep. 8, 2009 |
| 7586316 |
Probe board mounting apparatus |
Sep. 8, 2009 |
| 7583101 |
Probing structure with fine pitch probes |
Sep. 1, 2009 |
| 7583100 |
Test head for testing electrical components |
Sep. 1, 2009 |
| 7583096 |
Probing apparatus and probing method |
Sep. 1, 2009 |
| 7583095 |
High-density probe array |
Sep. 1, 2009 |
| 7579857 |
Electrical contact device of probe card |
Aug. 25, 2009 |
| 7579856 |
Probe structures with physically suspended electronic components |
Aug. 25, 2009 |
| 7579855 |
Method for manufacturing electrical contact element for testing electronic device and electrical contact element manufactured thereby |
Aug. 25, 2009 |
| 7579853 |
Apparatus for obtaining planarity measurements with respect to a probe card analysis system |
Aug. 25, 2009 |
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