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Class Information
Number: 324/754
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > With probe elements
Description: Subject matter including a feature to enable contact between a device under test (DUT) and a test apparatus.










Sub-classes under this class:

Class Number Class Name Patents
324/762 Cantilever 445
324/756 Contact confirmation 152
324/755 Internal of or on support for device under test (dut) 960
324/761 Pin 940
324/758 Probe alignment or positioning 971
324/757 Probe contact enhancement 424
324/759 With recording of test results on dut 53
324/760 With temperature control 797


Patents under this class:

Patent Number Title Of Patent Date Issued
7804316 Pusher, pusher unit and semiconductor testing apparatus Sep. 28, 2010
7804315 Probe card Sep. 28, 2010
7804314 Adjustable electrical probes for circuit breaker tester Sep. 28, 2010
7804313 Semiconductor device Sep. 28, 2010
7804312 Silicon wafer for probe bonding and probe bonding method using thereof Sep. 28, 2010
7804292 Method for testing integrated circuits mounted on a carrier Sep. 28, 2010
7800386 Contact device and method for producing the same Sep. 21, 2010
7800384 Probe unit substrate Sep. 21, 2010
7800383 Apparatus and method for testing keyboard of mobile phone Sep. 21, 2010
7800382 System for testing an integrated circuit of a device and its method of use Sep. 21, 2010
7800381 Test structures, systems, and methods for semiconductor devices Sep. 21, 2010
7795892 Probe card Sep. 14, 2010
7795891 Tester with low signal attenuation Sep. 14, 2010
7795890 Reduced ground spring probe array and method for controlling signal spring probe impedance Sep. 14, 2010
7795889 Probe device Sep. 14, 2010
7795888 Contact device to contact an electrical test specimen to be tested and a corresponding contact process Sep. 14, 2010
7792396 Probe card for testing in-wafer photonic integrated circuits (PICs) and method of use Sep. 7, 2010
7791360 Connection unit, a board for mounting a device under test, a probe card and a device interfacing part Sep. 7, 2010
7791359 Probe for high frequency signal transmission and probe card using the same Sep. 7, 2010
7791358 Dual tip probe Sep. 7, 2010
7786745 Method and apparatus for single-sided extension of electrical conductors beyond the edges of a substrate Aug. 31, 2010
7786744 Probe card assembly and test probes therein Aug. 31, 2010
7786743 Probe tile for probing semiconductor wafer Aug. 31, 2010
7786742 Prober for electronic device testing on large area substrates Aug. 31, 2010
7786741 Measuring tip for high-frequency measurement Aug. 31, 2010
7786740 Probe cards employing probes having retaining portions for potting in a potting region Aug. 31, 2010
7786723 Test stage for a carrier having printhead integrated circuitry thereon Aug. 31, 2010
7782688 Semiconductor memory device and test method thereof Aug. 24, 2010
7782071 Probe card analysis system and method Aug. 24, 2010
7782070 Probing device Aug. 24, 2010
RE41515 Contactor and production method for contactor Aug. 17, 2010
7777509 Method and apparatus for electrical testing Aug. 17, 2010
7777508 Electrical test lead with a replaceable inline fuse Aug. 17, 2010
7772864 Contact probe with reduced voltage drop and heat generation Aug. 10, 2010
7772861 Probe card Aug. 10, 2010
7772860 Massively parallel interface for electronic circuit Aug. 10, 2010
7772859 Probe for testing semiconductor devices with features that increase stress tolerance Aug. 10, 2010
7772858 Probe card Aug. 10, 2010
7768285 Probe card for semiconductor IC test and method of manufacturing the same Aug. 3, 2010
7768284 Test apparatus for testing a semiconductor device, and method for testing the semiconductor device Aug. 3, 2010
7768283 Universal socketless test fixture Aug. 3, 2010
7768282 Apparatus and method for terminating probe apparatus of semiconductor wafer Aug. 3, 2010
7768281 Probe assembly for lapping a bar using a patterned probe Aug. 3, 2010
7768280 Apparatus for a low-cost semiconductor test interface system Aug. 3, 2010
7768279 Control method and control program for prober Aug. 3, 2010
7768278 High impedance, high parallelism, high temperature memory test system architecture Aug. 3, 2010
7765693 Electrically connecting two substrates using a resilient wire bundle captured in an aperture of an interposer by a retention member Aug. 3, 2010
7764152 Contactor, contact structure provided with contactors, probe card, test apparatus, method of production of contact structure, and production apparatus of contact structure Jul. 27, 2010
7764079 Modular probe system Jul. 27, 2010
7764075 High performance probe system Jul. 27, 2010











 
 
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