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Class Information
Number: 324/754.12
Name: Electricity: measuring and testing >
Description:










Sub-classes under this class:

Class Number Class Name Patents
324/158.1 Miscellaneous 3,073
324/160 Electrical speed measuring 273
324/200 Magnetic 110
324/300 Particle precession resonance 658
324/323 Of geophysical surface or subsurface in situ 198
324/376 Of subsurface core sample 60
324/378 Internal-combustion engine ignition system or device 114
324/403 Electric lamp or discharge device 42
324/415 Electromechanical switching device 153
324/425 Electrolyte properties 247
324/451 A material property using thermoelectric phenomenon 31
324/452 A material property using electrostatic phenomenon 159
324/457 Electrostatic field 319
324/459 Using ionization effects 113
324/500 Fault detecting in electric circuits and of electric components 424
324/557 For insulation fault of noncircuit elements 179
324/600 Impedance, admittance or other quantities representative of electrical stimulus/response relationships 181
324/66 Conductor identification or location (e.g., phase identification) 305
324/71.1 Determining nonelectric properties by measuring electric properties 692
324/72 Testing potential in specific environment (e.g., lightning stroke) 456
324/73.1 Plural, automatically sequential tests 1,078
324/74 Testing and calibrating electric meters (e.g., watt-hour meters) 205
324/76.11 Measuring, testing, or sensing electricity, per se 578
324/800 Divining rods 1


Patents under this class:

Patent Number Title Of Patent Date Issued
8659311 Test apparatus and test method Feb. 25, 2014
8645096 Deflection measuring system and method Feb. 4, 2014
8502550 Operation control structure for a continuity test device Aug. 6, 2013
8421492 Probe card and method for selecting the same Apr. 16, 2013
8373428 Probe card assembly and kit, and methods of making same Feb. 12, 2013
8330480 Interconnection card for inspection, manufacture method for interconnection card, and inspection method using interconnection card Dec. 11, 2012
8008938 Testing system module Aug. 30, 2011
7990166 Testing module for testing key buttons of portable electronic device Aug. 2, 2011
7969170 Microcontactor probe with reduced number of sliding contacts for Conduction, and electric probe unit Jun. 28, 2011
7944224 Low profile probe having improved mechanical scrub and reduced contact inductance May. 17, 2011
7924037 Inspection apparatus comprising means for removing flux Apr. 12, 2011











 
 
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