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Class Information
Number: 324/753
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > System sensing fields adjacent device under test (dut) > Using electro-optic device
Description: Subject matter wherein an electro-optic device such as an electroluminor is used to sense the fields.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7602198 |
Accuracy enhancing mechanism and method for current measuring apparatus |
Oct. 13, 2009 |
| 7598755 |
Probe navigation method and device and defect inspection device |
Oct. 6, 2009 |
| 7592826 |
Method and apparatus for detecting EM energy using surface plasmon polaritons |
Sep. 22, 2009 |
| 7560940 |
Method and installation for analyzing an integrated circuit |
Jul. 14, 2009 |
| 7548077 |
Measuring apparatus and a measuring method for measuring a polarization characteristic of an optical system |
Jun. 16, 2009 |
| 7532019 |
Measuring apparatus and measuring method |
May. 12, 2009 |
| 7521946 |
Electrical measurements on semiconductors using corona and microwave techniques |
Apr. 21, 2009 |
| 7498561 |
Arrangement for the detection of illumination radiation in a laser scanning microscope |
Mar. 3, 2009 |
| 7479779 |
Image sensor test system |
Jan. 20, 2009 |
| 7453273 |
Method and apparatus for analyzing current in an integrated circuit under test |
Nov. 18, 2008 |
| 7446543 |
Non-contact electrical connections test device |
Nov. 4, 2008 |
| 7395518 |
Back end of line clone test vehicle |
Jul. 1, 2008 |
| 7385412 |
Systems and methods for testing microfeature devices |
Jun. 10, 2008 |
| 7372283 |
Probe navigation method and device and defect inspection device |
May. 13, 2008 |
| 7368925 |
Probe station with two platens |
May. 6, 2008 |
| 7348786 |
Probe module for testing chips with electrical and optical input/output interconnects, methods of use, and methods of fabrication |
Mar. 25, 2008 |
| 7339392 |
Apparatus measuring substrate leakage current and surface voltage and related method |
Mar. 4, 2008 |
| 7339153 |
Photon counting methods and devices with electrical pulse duration and intensity measurement |
Mar. 4, 2008 |
| 7253645 |
Detection of defects in patterned substrates |
Aug. 7, 2007 |
| 7235988 |
Method for generating high-contrast images of semiconductor sites via one-photon optical beam-induced current imaging and confocal reflectance microscopy |
Jun. 26, 2007 |
| 7233155 |
Electrooptic device, electronic apparatus, and method for making the electrooptic device |
Jun. 19, 2007 |
| 7215133 |
Contactless circuit testing for adaptive wafer processing |
May. 8, 2007 |
| 7212024 |
Inspection apparatus for liquid crystal drive substrates |
May. 1, 2007 |
| 7187187 |
Signal acquisition probing system using a micro-cavity laser |
Mar. 6, 2007 |
| 7154287 |
Method and apparatus for light-controlled circuit characterization |
Dec. 26, 2006 |
| 7148715 |
Systems and methods for testing microelectronic imagers and microfeature devices |
Dec. 12, 2006 |
| 7129722 |
Methods of improving reliability of an electro-optical module |
Oct. 31, 2006 |
| 7109730 |
Non-contact tester for electronic circuits |
Sep. 19, 2006 |
| 7091715 |
Method and apparatus for micro-machined sensors using enhanced modulated integrative differential optical sensing |
Aug. 15, 2006 |
| 7084649 |
Method and apparatus for measuring three-dimensional distribution of electric field |
Aug. 1, 2006 |
| 7084616 |
Method and device for measuring an electrical voltage |
Aug. 1, 2006 |
| 7071713 |
Probe navigation method and device and defect inspection device |
Jul. 4, 2006 |
| 7071701 |
Online fiber optic sensor for detecting partial discharge and similar events in large utility station transformers and the like |
Jul. 4, 2006 |
| 7064568 |
Optical testing of integrated circuits with temperature control |
Jun. 20, 2006 |
| 7056764 |
Electronic sensor device and method for producing the electronic sensor device |
Jun. 6, 2006 |
| 7049843 |
Signal acquisition probing system using a micro-cavity laser capable of sensing DC voltages |
May. 23, 2006 |
| 7038186 |
Method and system for real time correction of an image |
May. 2, 2006 |
| 7019511 |
Optical analysis of integrated circuits |
Mar. 28, 2006 |
| 6982819 |
Electro-optic array interface |
Jan. 3, 2006 |
| 6972562 |
Near-field magneto-optical microscope |
Dec. 6, 2005 |
| 6956385 |
Integrated circuit defect analysis using liquid crystal |
Oct. 18, 2005 |
| 6952107 |
Optical electric field or voltage sensing system |
Oct. 4, 2005 |
| 6950098 |
Method and system for real time correction of an image |
Sep. 27, 2005 |
| 6946827 |
Optical electric field or voltage sensing system |
Sep. 20, 2005 |
| 6922067 |
Determination of minority carrier diffusion length in solid state materials |
Jul. 26, 2005 |
| 6919716 |
Precision avalanche photodiode current monitor |
Jul. 19, 2005 |
| 6906506 |
Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe |
Jun. 14, 2005 |
| 6885202 |
Non-contact tester for electronic circuits |
Apr. 26, 2005 |
| 6879147 |
Package with environmental control material carrier |
Apr. 12, 2005 |
| 6873165 |
Near-field probe for use in scanning system |
Mar. 29, 2005 |
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