| Patent Number |
Title Of Patent |
Date Issued |
| 7612571 |
System and method for estimation of integrated circuit signal characteristics using optical measurements |
Nov. 3, 2009 |
| 7601941 |
Method and apparatus for evaluating solar cell and use thereof |
Oct. 13, 2009 |
| 7598755 |
Probe navigation method and device and defect inspection device |
Oct. 6, 2009 |
| 7589541 |
Method and apparatus for inspecting solid-state image pick-up device |
Sep. 15, 2009 |
| 7573271 |
Apparatus for measuring electric characteristics of semiconductor |
Aug. 11, 2009 |
| 7560940 |
Method and installation for analyzing an integrated circuit |
Jul. 14, 2009 |
| 7554346 |
Test equipment for automated quality control of thin film solar modules |
Jun. 30, 2009 |
| 7552018 |
Method for quickly quantifying the resistance of a thin film as a function of frequency |
Jun. 23, 2009 |
| 7538564 |
Methods and apparatus for utilizing an optical reference |
May. 26, 2009 |
| 7528614 |
Apparatus and method for voltage contrast analysis of a wafer using a tilted pre-charging beam |
May. 5, 2009 |
| 7528615 |
Measurement method of the current-voltage characteristics of photovoltaic devices, a solar simulator for the measurement, and a module for setting irradiance and a part for adjusting irradianc |
May. 5, 2009 |
| 7521946 |
Electrical measurements on semiconductors using corona and microwave techniques |
Apr. 21, 2009 |
| 7521954 |
Method for determining a minority carrier diffusion length using surface photo voltage measurements |
Apr. 21, 2009 |
| 7501625 |
Electron microscope application apparatus and sample inspection method |
Mar. 10, 2009 |
| 7498561 |
Arrangement for the detection of illumination radiation in a laser scanning microscope |
Mar. 3, 2009 |
| 7476875 |
Contact opening metrology |
Jan. 13, 2009 |
| 7471079 |
Microscope enclosure system |
Dec. 30, 2008 |
| 7466151 |
Electric-field distribution measurement method and apparatus for semiconductor device |
Dec. 16, 2008 |
| 7411408 |
Measurement method using solar simulator |
Aug. 12, 2008 |
| 7408365 |
Image sensor testing method and apparatus |
Aug. 5, 2008 |
| 7405580 |
Self-calibration in non-contact surface photovoltage measurement of depletion capacitance and dopant concentration |
Jul. 29, 2008 |
| 7403023 |
Apparatus and method of measuring defects in an ion implanted wafer by heating the wafer to a treatment temperature and time to substantially stabilize interstitial defect migration while leav |
Jul. 22, 2008 |
| 7400154 |
Apparatus and method for detecting photon emissions from transistors |
Jul. 15, 2008 |
| 7397263 |
Sensor differentiated fault isolation |
Jul. 8, 2008 |
| 7381978 |
Contact opening metrology |
Jun. 3, 2008 |
| 7378859 |
System and method for estimation of integrated circuit signal characteristics using optical measurements |
May. 27, 2008 |
| 7375505 |
Method and apparatus for testing function of active microstructural elements and method for producing microstructural elements using the test method |
May. 20, 2008 |
| 7372283 |
Probe navigation method and device and defect inspection device |
May. 13, 2008 |
| 7355419 |
Enhanced signal observability for circuit analysis |
Apr. 8, 2008 |
| 7348786 |
Probe module for testing chips with electrical and optical input/output interconnects, methods of use, and methods of fabrication |
Mar. 25, 2008 |
| 7323889 |
Voltage testing and measurement |
Jan. 29, 2008 |
| 7323888 |
System and method for use in functional failure analysis by induced stimulus |
Jan. 29, 2008 |
| 7315175 |
Probe apparatus and method for examining a sample |
Jan. 1, 2008 |
| 7282930 |
Device for testing thin elements |
Oct. 16, 2007 |
| 7265571 |
Method and device for determining a characteristic of a semiconductor sample |
Sep. 4, 2007 |
| 7253901 |
Laser-based cleaning device for film analysis tool |
Aug. 7, 2007 |
| 7250778 |
Wafer test apparatus including optical elements and method of using the test apparatus |
Jul. 31, 2007 |
| 7239157 |
Optical trigger for PICA technique |
Jul. 3, 2007 |
| 7230436 |
Laser beam inspection equipment |
Jun. 12, 2007 |
| 7202689 |
Sensor differentiated fault isolation |
Apr. 10, 2007 |
| 7202690 |
Substrate inspection device and substrate inspecting method |
Apr. 10, 2007 |
| 7202951 |
Laser-based cleaning device for film analysis tool |
Apr. 10, 2007 |
| 7190186 |
Method and apparatus for determining concentration of defects and/or impurities in a semiconductor wafer |
Mar. 13, 2007 |
| 7187186 |
Methods and systems for determining one or more properties of a specimen |
Mar. 6, 2007 |
| 7184626 |
Wafer-level testing of optical and optoelectronic chips |
Feb. 27, 2007 |
| 7183759 |
Optical probes with spacing sensors for the wafer level testing of optical and optoelectronic chips |
Feb. 27, 2007 |
| 7158284 |
Apparatus and methods of using second harmonic generation as a non-invasive optical probe for interface properties in layered structures |
Jan. 2, 2007 |
| 7145353 |
Double side probing of semiconductor devices |
Dec. 5, 2006 |
| 7138653 |
Structures for stabilizing semiconductor devices relative to test substrates and methods for fabricating the stabilizers |
Nov. 21, 2006 |
| 7133128 |
System and method for measuring properties of a semiconductor substrate in a non-destructive way |
Nov. 7, 2006 |
