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Browse by Category: Main > Electrical & Energy
Class Information
Number: 324/752
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > System sensing fields adjacent device under test (dut) > Using light probe
Description: Subject matter wherein light such as a laser beam is used to sense the fields.










Patents under this class:
1 2 3 4 5 6 7

Patent Number Title Of Patent Date Issued
7795887 Photoconductive based electrical testing of transistor arrays Sep. 14, 2010
7795886 Surface voltmeter Sep. 14, 2010
7777507 Integrated circuit testing with laser stimulation and emission analysis Aug. 17, 2010
7751035 Method and device to quantify active carrier profiles in ultra-shallow semiconductor structures Jul. 6, 2010
7733111 Segmented optical and electrical testing for photovoltaic devices Jun. 8, 2010
7733100 System and method for modulation mapping Jun. 8, 2010
7732791 Semiconductor testing method and semiconductor tester Jun. 8, 2010
7663393 Mobility measurements of inversion charge carriers Feb. 16, 2010
7663385 Apparatus and method for electrical characterization by selecting and adjusting the light for a target depth of a semiconductor Feb. 16, 2010
7649365 Inline inspection of photovoltaics for electrical defects Jan. 19, 2010
7635843 In-line reliability test using E-beam scan Dec. 22, 2009
7636155 System and method for resolving photoemission from semiconductor devices Dec. 22, 2009
7626403 Photosensor testing device with built-in light source and tester provided with said device Dec. 1, 2009
7612571 System and method for estimation of integrated circuit signal characteristics using optical measurements Nov. 3, 2009
7601941 Method and apparatus for evaluating solar cell and use thereof Oct. 13, 2009
7598755 Probe navigation method and device and defect inspection device Oct. 6, 2009
7589541 Method and apparatus for inspecting solid-state image pick-up device Sep. 15, 2009
7573271 Apparatus for measuring electric characteristics of semiconductor Aug. 11, 2009
7560940 Method and installation for analyzing an integrated circuit Jul. 14, 2009
7554346 Test equipment for automated quality control of thin film solar modules Jun. 30, 2009
7552018 Method for quickly quantifying the resistance of a thin film as a function of frequency Jun. 23, 2009
7538564 Methods and apparatus for utilizing an optical reference May. 26, 2009
7528615 Measurement method of the current-voltage characteristics of photovoltaic devices, a solar simulator for the measurement, and a module for setting irradiance and a part for adjusting irradianc May. 5, 2009
7528614 Apparatus and method for voltage contrast analysis of a wafer using a tilted pre-charging beam May. 5, 2009
7521954 Method for determining a minority carrier diffusion length using surface photo voltage measurements Apr. 21, 2009
7521946 Electrical measurements on semiconductors using corona and microwave techniques Apr. 21, 2009
7501625 Electron microscope application apparatus and sample inspection method Mar. 10, 2009
7498561 Arrangement for the detection of illumination radiation in a laser scanning microscope Mar. 3, 2009
7476875 Contact opening metrology Jan. 13, 2009
7471079 Microscope enclosure system Dec. 30, 2008
7466151 Electric-field distribution measurement method and apparatus for semiconductor device Dec. 16, 2008
7411408 Measurement method using solar simulator Aug. 12, 2008
7408365 Image sensor testing method and apparatus Aug. 5, 2008
7405580 Self-calibration in non-contact surface photovoltage measurement of depletion capacitance and dopant concentration Jul. 29, 2008
7403023 Apparatus and method of measuring defects in an ion implanted wafer by heating the wafer to a treatment temperature and time to substantially stabilize interstitial defect migration while leav Jul. 22, 2008
7400154 Apparatus and method for detecting photon emissions from transistors Jul. 15, 2008
7397263 Sensor differentiated fault isolation Jul. 8, 2008
7381978 Contact opening metrology Jun. 3, 2008
7378859 System and method for estimation of integrated circuit signal characteristics using optical measurements May. 27, 2008
7375505 Method and apparatus for testing function of active microstructural elements and method for producing microstructural elements using the test method May. 20, 2008
7372283 Probe navigation method and device and defect inspection device May. 13, 2008
7355419 Enhanced signal observability for circuit analysis Apr. 8, 2008
7348786 Probe module for testing chips with electrical and optical input/output interconnects, methods of use, and methods of fabrication Mar. 25, 2008
7323888 System and method for use in functional failure analysis by induced stimulus Jan. 29, 2008
7323889 Voltage testing and measurement Jan. 29, 2008
7315175 Probe apparatus and method for examining a sample Jan. 1, 2008
7282930 Device for testing thin elements Oct. 16, 2007
7265571 Method and device for determining a characteristic of a semiconductor sample Sep. 4, 2007
7253901 Laser-based cleaning device for film analysis tool Aug. 7, 2007
7250778 Wafer test apparatus including optical elements and method of using the test apparatus Jul. 31, 2007

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