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Class Information
Number: 324/750
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > System sensing fields adjacent device under test (dut)
Description: Subject matter for detecting faults by sensing an electromagnetic field produced by a device under test.

Sub-classes under this class:

Class Number Class Name Patents
324/753 Using electro-optic device 211
324/751 Using electron beam probe 399
324/752 Using light probe 338

Patents under this class:
1 2 3 4 5 6 7 8

Patent Number Title Of Patent Date Issued
7795885 Optically isolated current monitoring for ionization systems Sep. 14, 2010
7782067 Method and apparatus for inspecting an object using terahertz electromagnetic wave Aug. 24, 2010
7779375 Design structure for shutting off data capture across asynchronous clock domains during at-speed testing Aug. 17, 2010
7755373 Device and method for sensing topographical variations on a surface using a probe Jul. 13, 2010
7755372 Method for automated stress testing of flip-chip packages Jul. 13, 2010
7751035 Method and device to quantify active carrier profiles in ultra-shallow semiconductor structures Jul. 6, 2010
7746183 Measurement apparatus for improving performance of standard cell library Jun. 29, 2010
7746088 In-line electron beam test system Jun. 29, 2010
7733111 Segmented optical and electrical testing for photovoltaic devices Jun. 8, 2010
7719294 Systems configured to perform a non-contact method for determining a property of a specimen May. 18, 2010
7719295 Method and apparatus for implementing IC device testing with improved SPQL, reliability and yield performance May. 18, 2010
7710131 Non-contact circuit analyzer May. 4, 2010
7688084 Testing apparatus and method for detecting a contact deficiency of an electrically conductive connection Mar. 30, 2010
7683319 Charge control apparatus and measurement apparatus equipped with the charge control apparatus Mar. 23, 2010
7685542 Method and apparatus for shutting off data capture across asynchronous clock domains during at-speed testing Mar. 23, 2010
7667854 Hand-held survey probe Feb. 23, 2010
7668235 Jitter measurement algorithm using locally in-order strobes Feb. 23, 2010
7663104 Specimen inspection equipment and how to make electron beam absorbed current images Feb. 16, 2010
7663390 Inspection apparatus and method Feb. 16, 2010
7642973 Electromagnetic wave analysis apparatus and design support apparatus Jan. 5, 2010
7636155 System and method for resolving photoemission from semiconductor devices Dec. 22, 2009
7598746 Surface voltmeter and surface voltage measurement method Oct. 6, 2009
7598748 Inverter system Oct. 6, 2009
7592826 Method and apparatus for detecting EM energy using surface plasmon polaritons Sep. 22, 2009
7589515 Method for reducing temperature-dependent error in photocurrent sensor, and photocurrent sensor device Sep. 15, 2009
7583094 Method for fabricating light-emitting device through inspection Sep. 1, 2009
7557588 Method and apparatus for inspecting an object using terahertz electromagnetic wave Jul. 7, 2009
7554346 Test equipment for automated quality control of thin film solar modules Jun. 30, 2009
7554352 Method for determining information about the internal workings of a chip based on electro-magnetic emissions therefrom Jun. 30, 2009
7552019 Systems and methods of converting RFID labels Jun. 23, 2009
7541818 Method and apparatus of electromagnetic measurement Jun. 2, 2009
7535238 In-line electron beam test system May. 19, 2009
7532018 Inspection method and inspection apparatus May. 12, 2009
7528615 Measurement method of the current-voltage characteristics of photovoltaic devices, a solar simulator for the measurement, and a module for setting irradiance and a part for adjusting irradianc May. 5, 2009
7521946 Electrical measurements on semiconductors using corona and microwave techniques Apr. 21, 2009
7514681 Electrical process monitoring using mirror-mode electron microscopy Apr. 7, 2009
7511485 Magnetic field measurement method and system Mar. 31, 2009
7504838 Methods of determining characteristics of doped regions on device wafers, and system for accomplishing same Mar. 17, 2009
7501837 Test structure and method for detecting charge effects during semiconductor processing using a delayed inversion point technique Mar. 10, 2009
7496466 System for fault determinations for high frequency electronic circuits Feb. 24, 2009
7471079 Microscope enclosure system Dec. 30, 2008
7469057 System and method for inspecting errors on a wafer Dec. 23, 2008
7453273 Method and apparatus for analyzing current in an integrated circuit under test Nov. 18, 2008
7446542 Apparatus and method for automated stress testing of flip-chip packages Nov. 4, 2008
7446543 Non-contact electrical connections test device Nov. 4, 2008
7439730 Apparatus and method for detecting photon emissions from transistors Oct. 21, 2008
7436190 Transparent conductive film roll and production method thereof, touch panel using it, and non-contact surface resistance measuring device Oct. 14, 2008
7425704 Inspection method and apparatus using an electron beam Sep. 16, 2008
7425820 High current measurement with temperature compensation Sep. 16, 2008
7417424 Magnetic-field-measuring device Aug. 26, 2008

1 2 3 4 5 6 7 8

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