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Class Information
Number: 324/750
Name: Electricity: measuring and testing > Fault detecting in electric circuits and of electric components > Of individual circuit component or element > System sensing fields adjacent device under test (dut)
Description: Subject matter for detecting faults by sensing an electromagnetic field produced by a device under test.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7598748 |
Inverter system |
Oct. 6, 2009 |
| 7598746 |
Surface voltmeter and surface voltage measurement method |
Oct. 6, 2009 |
| 7592826 |
Method and apparatus for detecting EM energy using surface plasmon polaritons |
Sep. 22, 2009 |
| 7589515 |
Method for reducing temperature-dependent error in photocurrent sensor, and photocurrent sensor device |
Sep. 15, 2009 |
| 7583094 |
Method for fabricating light-emitting device through inspection |
Sep. 1, 2009 |
| 7557588 |
Method and apparatus for inspecting an object using terahertz electromagnetic wave |
Jul. 7, 2009 |
| 7554346 |
Test equipment for automated quality control of thin film solar modules |
Jun. 30, 2009 |
| 7554352 |
Method for determining information about the internal workings of a chip based on electro-magnetic emissions therefrom |
Jun. 30, 2009 |
| 7552019 |
Systems and methods of converting RFID labels |
Jun. 23, 2009 |
| 7541818 |
Method and apparatus of electromagnetic measurement |
Jun. 2, 2009 |
| 7535238 |
In-line electron beam test system |
May. 19, 2009 |
| 7532018 |
Inspection method and inspection apparatus |
May. 12, 2009 |
| 7528615 |
Measurement method of the current-voltage characteristics of photovoltaic devices, a solar simulator for the measurement, and a module for setting irradiance and a part for adjusting irradianc |
May. 5, 2009 |
| 7521946 |
Electrical measurements on semiconductors using corona and microwave techniques |
Apr. 21, 2009 |
| 7514681 |
Electrical process monitoring using mirror-mode electron microscopy |
Apr. 7, 2009 |
| 7511485 |
Magnetic field measurement method and system |
Mar. 31, 2009 |
| 7504838 |
Methods of determining characteristics of doped regions on device wafers, and system for accomplishing same |
Mar. 17, 2009 |
| 7501837 |
Test structure and method for detecting charge effects during semiconductor processing using a delayed inversion point technique |
Mar. 10, 2009 |
| 7496466 |
System for fault determinations for high frequency electronic circuits |
Feb. 24, 2009 |
| 7471079 |
Microscope enclosure system |
Dec. 30, 2008 |
| 7469057 |
System and method for inspecting errors on a wafer |
Dec. 23, 2008 |
| 7453273 |
Method and apparatus for analyzing current in an integrated circuit under test |
Nov. 18, 2008 |
| 7446542 |
Apparatus and method for automated stress testing of flip-chip packages |
Nov. 4, 2008 |
| 7446543 |
Non-contact electrical connections test device |
Nov. 4, 2008 |
| 7439730 |
Apparatus and method for detecting photon emissions from transistors |
Oct. 21, 2008 |
| 7436190 |
Transparent conductive film roll and production method thereof, touch panel using it, and non-contact surface resistance measuring device |
Oct. 14, 2008 |
| 7425820 |
High current measurement with temperature compensation |
Sep. 16, 2008 |
| 7425704 |
Inspection method and apparatus using an electron beam |
Sep. 16, 2008 |
| 7417424 |
Magnetic-field-measuring device |
Aug. 26, 2008 |
| 7408342 |
Device for measuring a component of current based on magnetic fields |
Aug. 5, 2008 |
| 7405580 |
Self-calibration in non-contact surface photovoltage measurement of depletion capacitance and dopant concentration |
Jul. 29, 2008 |
| 7397254 |
Methods for imperfect insulating film electrical thickness/capacitance measurement |
Jul. 8, 2008 |
| 7372283 |
Probe navigation method and device and defect inspection device |
May. 13, 2008 |
| 7362106 |
Methods and apparatus for non-contact testing and diagnosing of open connections on non-probed nodes |
Apr. 22, 2008 |
| 7358748 |
Methods and systems for determining a property of an insulating film |
Apr. 15, 2008 |
| 7358749 |
Method, apparatus, and program for measuring an electromagnetic field and medium storing the program |
Apr. 15, 2008 |
| 7355417 |
Techniques for obtaining electromagnetic data from a circuit board |
Apr. 8, 2008 |
| 7355385 |
Voltage injector and detector using pixel array for printed circuit board testing |
Apr. 8, 2008 |
| 7339392 |
Apparatus measuring substrate leakage current and surface voltage and related method |
Mar. 4, 2008 |
| 7332914 |
Conductor inspection apparatus and conductor inspection method |
Feb. 19, 2008 |
| 7327155 |
Elastic metal gate MOS transistor for surface mobility measurement in semiconductor materials |
Feb. 5, 2008 |
| 7323862 |
Apparatus and method for detecting photon emissions from transistors |
Jan. 29, 2008 |
| 7321232 |
Charge amount measurement method, shift value measurement method of charged beam, charge amount measuring device and shift value measuring device of charged beam |
Jan. 22, 2008 |
| 7317319 |
Measuring method for electromagnetic field intensity and apparatus therefor, measuring method for electromagnetic field intensity distribution and apparatus therefor, measuring method for curr |
Jan. 8, 2008 |
| 7315175 |
Probe apparatus and method for examining a sample |
Jan. 1, 2008 |
| 7315173 |
Method of measuring electric field distribution and electric field distribution measuring instrument |
Jan. 1, 2008 |
| 7312619 |
Multiple local probe measuring device and method |
Dec. 25, 2007 |
| 7309997 |
Monitor system and method for semiconductor processes |
Dec. 18, 2007 |
| 7307426 |
Methods and apparatus for unpowered testing of open connections on power and ground nodes of circuit devices |
Dec. 11, 2007 |
| 7282930 |
Device for testing thin elements |
Oct. 16, 2007 |
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