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Class Information
Number: 324/750.01
Name: Electricity: measuring and testing >
Description:










Sub-classes under this class:

Class Number Class Name Patents
324/158.1 Miscellaneous 3,073
324/160 Electrical speed measuring 273
324/200 Magnetic 110
324/300 Particle precession resonance 658
324/323 Of geophysical surface or subsurface in situ 198
324/376 Of subsurface core sample 60
324/378 Internal-combustion engine ignition system or device 114
324/403 Electric lamp or discharge device 42
324/415 Electromechanical switching device 153
324/425 Electrolyte properties 247
324/451 A material property using thermoelectric phenomenon 31
324/452 A material property using electrostatic phenomenon 159
324/457 Electrostatic field 319
324/459 Using ionization effects 113
324/500 Fault detecting in electric circuits and of electric components 424
324/557 For insulation fault of noncircuit elements 179
324/600 Impedance, admittance or other quantities representative of electrical stimulus/response relationships 181
324/66 Conductor identification or location (e.g., phase identification) 305
324/71.1 Determining nonelectric properties by measuring electric properties 692
324/72 Testing potential in specific environment (e.g., lightning stroke) 456
324/73.1 Plural, automatically sequential tests 1,078
324/74 Testing and calibrating electric meters (e.g., watt-hour meters) 205
324/76.11 Measuring, testing, or sensing electricity, per se 578
324/800 Divining rods 1


Patents under this class:

Patent Number Title Of Patent Date Issued
8709833 Measuring current and resistance using combined diodes/resistor structure to monitor integrated circuit manufacturing process variations Apr. 29, 2014
8709834 Methods of fabricating semiconductor device Apr. 29, 2014
8704540 Test apparatus Apr. 22, 2014
8704541 Test method of driving apparatus and circuit testing interface thereof Apr. 22, 2014
8706439 Test apparatus and test method Apr. 22, 2014
8692566 Test apparatus and test method Apr. 8, 2014
8674712 Apparatus for driving placing table Mar. 18, 2014
8674713 Zero ampere level current data correction for a power device under test Mar. 18, 2014
8676530 System and method for variation testing for performance test Mar. 18, 2014
8664921 Means of providing variable reactive load capability on an electronic load Mar. 4, 2014
8659308 Selective overtravel during electrical test of probe cards Feb. 25, 2014
8653840 Fast current saturation recovery for a digital source measure unit (SMU) Feb. 18, 2014
8653841 Method and apparatus for monitoring a high-voltage electrical circuit including a discharge circuit Feb. 18, 2014
8643392 Pneumatically actuated IC socket with integrated heat sink Feb. 4, 2014
8633708 Current calibration method and associated circuit Jan. 21, 2014
8624613 Integrated systems testing Jan. 7, 2014
8618812 Electrical interconnection integrated device with fault detecting module and electronic apparatus comprising the device Dec. 31, 2013
8610438 Branch circuit monitor Dec. 17, 2013
8610446 Testing device and testing method Dec. 17, 2013
8604812 Voltage limiting test system and assistant test device Dec. 10, 2013
8598496 Method for testing the operation of a heating element used for an activated carbon filter Dec. 3, 2013
8598899 Built-in test for an overvoltage protection circuit Dec. 3, 2013
8564317 Test socket, and test apparatus with test socket to control a temperature of an object to be tested Oct. 22, 2013
8543878 Apparatus and a method to test a parametric structure utilizing logical sensing Sep. 24, 2013
8527231 High throughput semiconductor device testing Sep. 3, 2013
8509036 Method of burn-in testing for thermally assisted head Aug. 13, 2013
8508236 Electronic device and method for testing a circuit board Aug. 13, 2013
8508235 Electronic device and method for testing a circuit board Aug. 13, 2013
8502549 Test apparatus and driver circuit Aug. 6, 2013
8493733 Mobile measurement device Jul. 23, 2013
8482309 Failure detecting method for a solar power generation system Jul. 9, 2013
8476909 Current calibration method and associated circuit Jul. 2, 2013
8456170 Test apparatus for digital modulated signal Jun. 4, 2013
8446160 Probe card maintenance method which adjusts position/posture of probes May. 21, 2013
8446153 Adaptor failure tolerance test device May. 21, 2013
8436630 Corrected optical spectral responses for photoelectric devices May. 7, 2013
8427182 Test apparatus and power supply apparatus Apr. 23, 2013
8421474 Circuit test apparatus Apr. 16, 2013
8423314 Deterministic reconfiguration of measurement modules using double buffered DMA Apr. 16, 2013
8416216 Method and system for touch sensor interface fault detection Apr. 9, 2013
8410802 System including thermal control unit having conduit for dispense and removal of liquid thermal interface material Apr. 2, 2013
8405405 Wideband I-V probe and method Mar. 26, 2013
8384406 Semiconductor test apparatus and test method Feb. 26, 2013
8378696 Method for characterizing the sensitivity of an electronic component to energetic interactions Feb. 19, 2013
8344743 Testing system for power supply unit Jan. 1, 2013
8326553 Fault detection in a system under control Dec. 4, 2012
8319509 Testing circuit for an analog to digital converter Nov. 27, 2012
8311666 System and method for separating defective dies from wafer Nov. 13, 2012
8289038 Method and device for characterising sensitivity to energy interactions in an electronic component Oct. 16, 2012
8290725 Synchronized reconfiguration of measurement modules Oct. 16, 2012











 
 
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