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Class Information
Number: 324/73.1
Name: Electricity: measuring and testing > Plural, automatically sequential tests
Description: Subject matter for measuring or determining two or more electrical characteristics of an electrical circuit or circuit element, or for measuring or determining a single electrical characteristic of two or more electrical circuits or circuit elements, wherein the measurements or determinations are made one after another without human intervention.










Patents under this class:

Patent Number Title Of Patent Date Issued
8676530 System and method for variation testing for performance test Mar. 18, 2014
8664921 Means of providing variable reactive load capability on an electronic load Mar. 4, 2014
8633683 Apparatus with abnormality determination function and method for determining abnormality Jan. 21, 2014
8624581 Input power measuring device Jan. 7, 2014
8587289 Method for determining the offset of a periodic signal Nov. 19, 2013
8564305 Discontinuous type layer-ID detector for 3D-IC and method of the same Oct. 22, 2013
8564300 Method and apparatus for testing aircraft electrical systems Oct. 22, 2013
8527231 High throughput semiconductor device testing Sep. 3, 2013
8427195 Digital signal generator and automatic test equipment having the same Apr. 23, 2013
8410810 System for testing power supply performance Apr. 2, 2013
8405415 Test apparatus synchronous module and synchronous method Mar. 26, 2013
8384393 Method and apparatus for evaluating electromagnetic hazard protection devices Feb. 26, 2013
8368422 System and method for testing off-chip driver impedance Feb. 5, 2013
8368418 Testing apparatus for multiple identical circuit components Feb. 5, 2013
8299802 Method to digitize analog signals in a system utilizing dynamic analog test multiplexer for diagnostics Oct. 30, 2012
8296612 Polymorphic automatic test systems and methods Oct. 23, 2012
8258803 Test apparatus and test method Sep. 4, 2012
8258802 Test apparatus and test method Sep. 4, 2012
8156396 Method and system for correcting timing errors in high data rate automated test equipment Apr. 10, 2012
8134383 LSI test apparatus, LSI test method, and computer product Mar. 13, 2012
8111389 Method of inspecting defects in circuit pattern of substrate Feb. 7, 2012
8093901 Switching unit adapted for communicating with a processing unit Jan. 10, 2012
8072232 Test apparatus that tests a device under test having a test function for sequentially outputting signals Dec. 6, 2011
8063626 Method for the precise measurement of dependency on amplitude and phase of plurality of high frequency signals and device for carrying out said method Nov. 22, 2011
8014968 Self-test circuit for high-definition multimedia interface integrated circuits Sep. 6, 2011
8005637 Method and apparatus for measuring characteristics of an electrical device Aug. 23, 2011
7969168 Integrated circuit with built-in self test circuit Jun. 28, 2011
7962271 Vehicle diagnostic tool providing information on the operating condition of a power plant utilizing voltage data Jun. 14, 2011
7962110 Driver circuit and test apparatus Jun. 14, 2011
7953530 Vehicle diagnostic tool May. 31, 2011
7944226 Test apparatus and transmission apparatus May. 17, 2011
7936172 Automatic test equipment self test May. 3, 2011
7929303 Storage device testing system cooling Apr. 19, 2011
7915884 Importation of virtual signals into electronic test equipment to facilitate testing of an electronic component Mar. 29, 2011
7908108 Circuit testing apparatus Mar. 15, 2011
7908100 Power consumption analyzing apparatus and power consumption analyzing method Mar. 15, 2011
7903746 Calibrating parameters in a storage subsystem with wide ports Mar. 8, 2011
7888960 Method of testing a power supply controller and structure therefor Feb. 15, 2011
7884626 Cathodic protection monitor Feb. 8, 2011
7853425 Parallel testing in a per-pin hardware architecture platform Dec. 14, 2010
7839157 Surface mount testing system Nov. 23, 2010
7839135 System for and method of analyzing printed board carrying chassis, printed board carrying chassis structure, program, and recording medium Nov. 23, 2010
7822567 Method and apparatus for implementing scaled device tests Oct. 26, 2010
7810005 Method and system for correcting timing errors in high data rate automated test equipment Oct. 5, 2010
7786475 In-line test circuit and method for determining interconnect electrical properties and integrated circuit incorporating the same Aug. 31, 2010
RE41496 Boundary-scan input circuit for a reset pin Aug. 10, 2010
7768279 Control method and control program for prober Aug. 3, 2010
7755375 Test apparatus, probe card, and test method Jul. 13, 2010
7746183 Measurement apparatus for improving performance of standard cell library Jun. 29, 2010
7733116 Method of testing a power supply controller and structure therefor Jun. 8, 2010











 
 
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